National Instruments Computer Hardware 320174B 01 User Manual |
Lab-NB
User Manual
Low-Cost Multifunction I/O Board for Macintosh NuBus
September 1995 Edition
Part Number 320174B-01
© Copyright 1989, 1995 National Instruments Corporation.
All Rights Reserved.
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Limited Warranty
The Lab-NB is warranted against defects in materials and workmanship for a period of one year from the date of
shipment, as evidenced by receipts or other documentation. National Instruments will, at its option, repair or replace
equipment that proves to be defective during the warranty period. This warranty includes parts and labor.
The media on which you receive National Instruments software are warranted not to fail to execute programming
instructions, due to defects in materials and workmanship, for a period of 90 days from date of shipment, as
evidenced by receipts or other documentation. National Instruments will, at its option, repair or replace software
media that do not execute programming instructions if National Instruments receives notice of such defects during
the warranty period. National Instruments does not warrant that the operation of the software shall be uninterrupted
or error free.
A Return Material Authorization (RMA) number must be obtained from the factory and clearly marked on the
outside of the package before any equipment will be accepted for warranty work. National Instruments will pay the
shipping costs of returning to the owner parts which are covered by warranty.
National Instruments believes that the information in this manual is accurate. The document has been carefully
reviewed for technical accuracy. In the event that technical or typographical errors exist, National Instruments
reserves the right to make changes to subsequent editions of this document without prior notice to holders of this
edition. The reader should consult National Instruments if errors are suspected. In no event shall National
Instruments be liable for any damages arising out of or related to this document or the information contained in it.
EXCEPT AS SPECIFIED HEREIN, NATIONAL INSTRUMENTS MAKES NO WARRANTIES, EXPRESS OR IMPLIED,
AND SPECIFICALLY DISCLAIMS ANY WARRANTY OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR
PURPOSE. CUSTOMER'S RIGHT TO RECOVER DAMAGES CAUSED BY FAULT OR NEGLIGENCE ON THE PART
OF NATIONAL INSTRUMENTS SHALL BE LIMITED TO THE AMOUNT THERETOFORE PAID BY THE CUSTOMER.
NATIONAL INSTRUMENTS WILL NOT BE LIABLE FOR DAMAGES RESULTING FROM LOSS OF DATA, PROFITS,
USE OF PRODUCTS, OR INCIDENTAL OR CONSEQUENTIAL DAMAGES, EVEN IF ADVISED OF THE POSSIBILITY
THEREOF. This limitation of the liability of National Instruments will apply regardless of the form of action,
whether in contract or tort, including negligence. Any action against National Instruments must be brought within
one year after the cause of action accrues. National Instruments shall not be liable for any delay in performance due
to causes beyond its reasonable control. The warranty provided herein does not cover damages, defects,
malfunctions, or service failures caused by owner's failure to follow the National Instruments installation, operation,
or maintenance instructions; owner's modification of the product; owner's abuse, misuse, or negligent acts; and
power failure or surges, fire, flood, accident, actions of third parties, or other events outside reasonable control.
Copyright
Under the copyright laws, this publication may not be reproduced or transmitted in any form, electronic or
mechanical, including photocopying, recording, storing in an information retrieval system, or translating, in whole
or in part, without the prior written consent of National Instruments Corporation.
Trademarks
®
®
®
LabVIEW , NI-DAQ , and RTSI are trademarks of National Instruments Corporation.
Product names and company names listed are trademarks or trade names of their respective companies.
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WARNING REGARDING MEDICAL AND CLINICAL USE
OF NATIONAL INSTRUMENTS PRODUCTS
National Instruments products are not designed with components and testing intended to ensure a level of reliability
suitable for use in treatment and diagnosis of humans. Applications of National Instruments products involving
medical or clinical treatment can create a potential for accidental injury caused by product failure, or by errors on
the part of the user or application designer. Any use or application of National Instruments products for or involving
medical or clinical treatment must be performed by properly trained and qualified medical personnel, and all
traditional medical safeguards, equipment, and procedures that are appropriate in the particular situation to prevent
serious injury or death should always continue to be used when National Instruments products are being used.
National Instruments products are NOT intended to be a substitute for any form of established process, procedure, or
equipment used to monitor or safeguard human health and safety in medical or clinical treatment.
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Contents
About This Manual ............................................................................................................ xi
Organization of This Manual.........................................................................................xi
Conventions Used in This Manual.................................................................................xii
National Instruments Documentation ............................................................................xii
Related Documentation..................................................................................................xiii
Customer Communication .............................................................................................xiii
Chapter 1
Introduction.......................................................................................................................... 1-1
About the Lab-NB.......................................................................................................... 1-1
What You Need to Get Started ...................................................................................... 1-2
Software Programming Choices .................................................................................... 1-2
LabVIEW and LabWindows/CVI Application Software .................................. 1-2
NI-DAQ Driver Software................................................................................... 1-3
Register-Level Programming............................................................................. 1-4
Optional Equipment....................................................................................................... 1-4
Cabling............................................................................................................... 1-4
Unpacking...................................................................................................................... 1-5
Chapter 2
Configuration and Installation....................................................................................... 2-1
Board Configuration ...................................................................................................... 2-1
Factory Default Jumper Settings........................................................................ 2-3
Analog Output Configuration ............................................................................ 2-3
Bipolar Output Selection........................................................................ 2-3
Unipolar Output Selection ..................................................................... 2-4
Analog Input Configuration............................................................................... 2-4
Bipolar Input Selection .......................................................................... 2-4
Unipolar Input Selection........................................................................ 2-5
Installation...................................................................................................................... 2-5
Signal Connections ........................................................................................................ 2-5
I/O Connector Pin Description........................................................................... 2-5
Signal Connection Descriptions......................................................................... 2-7
Analog Input Signal Connections.......................................................... 2-7
Connections for Signal Sources................................................. 2-8
Analog Output Signal Connections........................................................ 2-9
Digital I/O Signal Connections.............................................................. 2-10
Port C Pin Connections.............................................................. 2-11
Timing Specifications................................................................ 2-12
Mode 1 Input Timing................................................................. 2-14
Mode 1 Output Timing............................................................... 2-15
Mode 2 Bidirectional Timing..................................................... 2-16
Timing Connections............................................................................... 2-17
DAQ Timing Connections......................................................... 2-17
General-Purpose Timing Signal Connections............................ 2-21
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Contents
Chapter 3
Theory of Operation........................................................................................................... 3-1
Functional Overview...................................................................................................... 3-1
NuBus Interface Circuitry.............................................................................................. 3-2
Analog Input and DAQ Circuitry................................................................................... 3-3
Analog Input Circuitry....................................................................................... 3-4
DAQ Timing Circuitry....................................................................................... 3-4
Single-Channel Data Acquisition........................................................... 3-5
Multichannel (Scanned) Data Acquisition............................................. 3-5
DAQ Rates............................................................................................. 3-6
Analog Output Circuitry ................................................................................................ 3-7
Digital I/O Circuitry....................................................................................................... 3-9
Timing I/O Circuitry...................................................................................................... 3-10
Chapter 4
Register-Level Programming ......................................................................................... 4-1
Register Access.............................................................................................................. 4-1
Slot Address Space............................................................................................. 4-1
Register Map...................................................................................................... 4-2
Register Sizes..................................................................................................... 4-4
Register Descriptions..................................................................................................... 4-4
Register Description Format.............................................................................. 4-4
Analog Input Register Group............................................................................. 4-5
A/D Configuration Register................................................................... 4-6
Status Register........................................................................................ 4-9
A/D FIFO Register................................................................................. 4-10
A/D Clear Register................................................................................. 4-12
Analog Output Register Group.......................................................................... 4-13
DAC Configuration Register ................................................................. 4-14
DAC0 and DAC1 Data Registers........................................................... 4-15
8253 Counter/Timer Register Groups................................................................ 4-16
Counter A0 Data Register...................................................................... 4-17
Counter A1 Data Register...................................................................... 4-18
Counter A2 Data Register...................................................................... 4-19
Counter A Mode Register...................................................................... 4-20
Counter B0 Data Register...................................................................... 4-21
Counter B1 Data Register...................................................................... 4-22
Counter B2 Data Register...................................................................... 4-23
Counter B Mode Register ...................................................................... 4-24
82C55A Digital I/O Register Group.................................................................. 4-25
Port A Register....................................................................................... 4-26
Port B Register....................................................................................... 4-27
Port C Register....................................................................................... 4-28
Digital Control Register......................................................................... 4-29
Interrupt Control Register Group....................................................................... 4-30
Interrupt Control Register...................................................................... 4-31
Interrupt Status Register......................................................................... 4-33
Timer Interrupt Clear Register............................................................... 4-34
Configuration EPROM .................................................................................................. 4-35
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Contents
Programming Considerations......................................................................................... 4-35
Register Programming Considerations .............................................................. 4-35
Initializing the Lab-NB Board ........................................................................... 4-35
Programming the Analog Input Circuitry.......................................................... 4-36
Analog Input Circuitry Programming Sequence.................................... 4-36
A/D FIFO Output Binary Modes........................................................... 4-38
Clearing the Analog Input Circuitry ...................................................... 4-39
Programming Multiple A/D Conversions on a Single Input Channel............... 4-39
Programming in Controlled Acquisition Mode ..................................... 4-40
Programming in Freerun Acquisition Mode .......................................... 4-43
External Timing Considerations for Multiple A/D Conversions....................... 4-45
Using the EXTTRIG Signal to Initiate a Multiple A/D Conversion
DAQ Operation (Posttrigger Mode) ...................................................... 4-45
Using the EXTTRIG Signal to Terminate a Multiple A/D
Conversion DAQ Operation (Pretrigger Mode)..................................... 4-46
Using the EXTCONV* Signal to Initiate A/D Conversions.................. 4-46
Programming Multiple A/D Conversions Using External Timing.................... 4-46
Programming in Controlled Acquisition Mode ..................................... 4-46
Posttrigger Mode........................................................................ 4-46
Pretrigger Mode ......................................................................... 4-49
Programming in Freerun Acquisition Mode .......................................... 4-51
Posttrigger Mode........................................................................ 4-51
Pretrigger Mode ......................................................................... 4-51
Programming Multiple A/D Conversions with Channel Scanning.................... 4-51
Interrupt Programming for the Analog Input Circuitry ..................................... 4-52
Programming the Analog Output Circuitry ....................................................... 4-52
Interrupt Programming for the Analog Output Circuitry................................... 4-54
Programming the Digital I/O Circuitry.............................................................. 4-55
82C55A Modes of Operation................................................................. 4-55
Mode 0–Basic I/O...................................................................... 4-56
Mode 1–Strobed I/O................................................................... 4-56
Mode 2–Bidirectional Bus......................................................... 4-56
Single Bit Set/Reset Feature ...................................................... 4-56
Register Descriptions and Programming Examples............................... 4-57
Mode 0 Control Words .............................................................. 4-58
Mode 0 Programming Examples................................................ 4-58
Mode 1 Strobed Input Control Words........................................ 4-59
Mode 1 Input Programming Example........................................ 4-61
Mode 1 Strobed Output Control Words..................................... 4-61
Mode 1 Output Programming Example..................................... 4-63
Mode 2 Control Words .............................................................. 4-63
Mode 2 Programming Example................................................. 4-65
Single Bit Set/Reset Control Words........................................... 4-65
Interrupt Programming for the Digital I/O Circuitry......................................... 4-65
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Contents
Chapter 5
Calibration............................................................................................................................. 5-1
Calibration Equipment Requirements............................................................................ 5-1
Calibration Trimpots...................................................................................................... 5-2
Analog Input Calibration ............................................................................................... 5-3
Board Configuration .......................................................................................... 5-4
Bipolar Input Calibration Procedure.................................................................. 5-4
Unipolar Input Calibration Procedure................................................................ 5-5
Analog Output Calibration............................................................................................. 5-5
Board Configuration .......................................................................................... 5-6
Bipolar Output Calibration Procedure ............................................................... 5-6
Unipolar Output Calibration Procedure............................................................. 5-7
Appendix A
Specifications........................................................................................................................ A-1
Appendix B
I/O Connector....................................................................................................................... B-1
Appendix C
AMD 8253 Data Sheet....................................................................................................... C-1
Appendix D
OKI 82C55A Data Sheet.................................................................................................. D-1
Appendix E
Customer Communication............................................................................................... E-1
Glossary........................................................................................................................Glossary-1
Index.................................................................................................................................. Index-1
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Contents
Figures
Figure 1-1.
The Relationship between the Programming Environment, NI-DAQ, and Your
Hardware............................................................................................................ 1-3
Figure 2-1.
Figure 2-2.
Figure 2-3.
Figure 2-4.
Figure 2-5.
Figure 2-6.
Figure 2-7.
Figure 2-8.
Figure 2-9.
Parts Locator Diagram....................................................................................... 2-2
Bipolar Output Jumper Configuration ............................................................... 2-4
Unipolar Output Jumper Configuration............................................................. 2-4
Bipolar Input Jumper Configuration.................................................................. 2-5
Unipolar Input Jumper Configuration................................................................ 2-5
Lab-NB I/O Connector Pin Assignments........................................................... 2-6
Analog Input Signal Connections ...................................................................... 2-8
Analog Output Signal Connections.................................................................... 2-9
Digital I/O Connections..................................................................................... 2-11
Figure 2-10. EXTCONV* Signal Timing............................................................................... 2-17
Figure 2-11. Posttrigger DAQ Timing (EXTCONV* High When Trigger Sensed).............. 2-18
Figure 2-12. Posttrigger DAQ Timing (EXTCONV* Low When Trigger Sensed)............... 2-18
Figure 2-13. Pretrigger DAQ Timing..................................................................................... 2-19
Figure 2-14. Waveform Generation Timing with the EXTUPDATE* Signal....................... 2-20
Figure 2-15. NuBus Interrupt Generation with the EXTUPDATE* Signal........................... 2-20
Figure 2-16. Event-Counting Application with External Switch Gating................................ 2-22
Figure 2-17. Frequency Measurement Application................................................................ 2-23
Figure 2-18. General-Purpose Timing Signals....................................................................... 2-24
Figure 3-1.
Figure 3-2.
Figure 3-3.
Figure 3-4.
Figure 3-5.
Figure 3-6.
Figure 3-7.
Lab-NB Block Diagram..................................................................................... 3-1
NuBus Interface Circuitry Block Diagram ........................................................ 3-2
Analog Input and DAQ Circuitry Block Diagram............................................. 3-3
Analog Output Circuitry Block Diagram........................................................... 3-8
Digital I/O Circuitry Block Diagram ................................................................. 3-9
Timing I/O Circuitry Block Diagram................................................................. 3-10
Counter Block Diagram..................................................................................... 3-11
Figure 4-1.
Figure 4-2.
Control-Word Format with Control-Word Flag Set to 1 ................................... 4-57
Control-Word Format with Control-Word Flag Set to 0 ................................... 4-57
Figure 5-1.
Calibration Trimpot Location Diagram ............................................................. 5-2
Figure B-1. Lab-NB I/O Connector....................................................................................... B-1
Tables
Table 2-1.
Table 2-2.
Lab-NB Jumper Settings.................................................................................... 2-3
Port C Signal Assignments ................................................................................ 2-12
Table 3-1.
Table 3-2.
Table 3-3.
Table 3-4.
Analog Input Settling Time Versus Gain........................................................... 3-6
Lab-NB Maximum Recommended DAQ Rates ................................................ 3-6
Bipolar Analog Input Signal Range Versus Gain.............................................. 3-7
Unipolar Analog Input Signal Range Versus Gain............................................ 3-7
Table 4-1.
Table 4-2.
Table 4-3.
Macintosh Slot Addresses.................................................................................. 4-2
Lab-NB Register Map........................................................................................ 4-3
Unipolar Input Mode A/D Conversion Values (Straight Binary Coding)......... 4-38
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Contents
Table 4-4.
Table 4-5.
Table 4-6.
Bipolar Input Mode A/D Conversion Values (Two’s Complement Coding).... 4-38
Analog Output Voltage Versus Digital Code .................................................... 4-53
Analog Output Voltage Versus Digital Code
(Bipolar Mode, Two's Complement Coding)..................................................... 4-54
Mode 0 I/O Configurations................................................................................ 4-58
Port C Set/Reset Control Words ........................................................................ 4-65
Table 4-7.
Table 4-8.
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About This Manual
This manual describes the mechanical and electrical aspects of the Lab-NB and contains
information concerning its installation and operation. The Lab-NB is a low-cost multifunction
analog, digital, and timing I/O board for Macintosh NuBus computers. It contains a 12-bit
successive-approximation A/D converter (ADC) with eight analog inputs, two 12-bit D/A
converters (DACs) with voltage outputs, 24 lines of transistor-transistor logic (TTL) compatible
digital I/O, and three 16-bit counter/timer channels for timing I/O.
Organization of This Manual
The Lab-NB User Manual is organized as follows.
•
Chapter 1, Introduction, describes the Lab-NB, lists what you need to get started, software
programming choices, optional equipment, and explains how to unpack the Lab-NB.
•
Chapter 2, Configuration and Installation, describes how to configure and install the Lab-NB
into your Macintosh computer, and also includes signal connections to the Lab-NB and cable
wiring.
•
•
Chapter 3, Theory of Operation, contains a functional overview of the Lab-NB and explains
the operation of each functional unit making up the Lab-NB.
Chapter 4, Register-Level Programming, describes in detail the address and function of each
of the Lab-NB control and status registers. This chapter also includes important information
about register-level programming the Lab-NB.
•
Chapter 5, Calibration, discusses the calibration procedures for the Lab-NB analog input and
analog output circuitry.
•
•
Appendix A, Specifications, lists the specifications of the Lab-NB.
Appendix B, I/O Connector, contains the pinout and signal names for the I/O connector on
the Lab-NB.
•
•
•
Appendix C, AMD 8253 Data Sheet, contains the manufacturer data sheet for the AMD 8253
System Timing Controller integrated circuit (Advanced Micro Devices, Inc.). This circuit is
used on the Lab-NB.
Appendix D, OKI 82C55A Data Sheet, contains the manufacturer data sheet for the
OKI 82C55A (OKI Semiconductor) CMOS programmable peripheral interface. This
interface is used on the Lab-NB.
Appendix E, Customer Communication, contains forms you can use to request help from
National Instruments or to comment on our products and manuals.
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About This Manual
•
•
The Glossary contains an alphabetical list and description of terms used in this manual,
including abbreviations, acronyms, metric prefixes, mnemonics, symbols, and terms.
The Index alphabetically lists topics covered in this manual, including the page where you
can find each one.
Conventions Used in This Manual
The following conventions are used in this manual.
bold
Bold text denotes menus, menu items, or dialog box buttons or options.
bold italic
italic
Bold italic text denotes a note, caution, or warning.
Italic text denotes emphasis, a cross reference, or an introduction to a key
concept.
Macintosh
NI-DAQ
Macintosh refers to all Macintosh II, Macintosh Quadra, and Macintosh
Centris computers, except the Centris 610, unless otherwise noted.
NI-DAQ is used throughout this manual to refer to the NI-DAQ software
for Macintosh unless otherwise noted.
SCXI
< >
SCXI stands for Signal Conditioning eXtensions for Instrumentation and
is a National Instruments product line designed to perform front-end signal
conditioning for National Instruments plug-in DAQ boards.
Angle brackets containing numbers separated by an ellipsis represent a
range of values associated with a bit or signal name (for example,
ACH <0..7> stands for ACH0 through ACH7).
Abbreviations, acronyms, metric prefixes, mnemonics, symbols, and terms are listed in the
Glossary.
National Instruments Documentation
The Lab-NB User Manual is one piece of the documentation set for your data acquisition (DAQ)
system. You could have any of several types of manuals, depending on the hardware and
software in your system. Use the different types of manuals you have as follows:
•
Getting Started with SCXI—If you are using SCXI, this is the first manual you should read.
It gives an overview of the SCXI system and contains the most commonly needed
information for the modules, chassis, and software.
•
Your SCXI hardware user manuals—If you are using SCXI, read these manuals next for
detailed information about signal connections and module configuration. They also explain
in greater detail how the module works and contain application hints.
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About This Manual
•
•
Your DAQ hardware user manuals—These manuals have detailed information about the
DAQ hardware that plugs into or is connected to your computer. Use these manuals for
hardware installation and configuration instructions, specification information about your
DAQ hardware, and application hints.
Software manuals—Examples of software manuals you may have are the LabVIEW and
LabWindows®/CVI manual sets and the NI-DAQ manuals (a 4.6.1 or earlier version of
NI-DAQ supports LabWindows for DOS). After you set up your hardware system, use either
the application software (LabVIEW or LabWindows/CVI) manuals or the NI-DAQ manuals
to help you write your application. If you have a large and complicated system, it is
worthwhile to look through the software manuals before you configure your hardware.
•
•
Accessory installation guides or manuals—If you are using accessory products, read the
terminal block and cable assembly installation guides or accessory board user manuals. They
explain how to physically connect the relevant pieces of the system. Consult these guides
when you are making your connections.
SCXI chassis manuals—If you are using SCXI, read these manuals for maintenance
information on the chassis and installation instructions.
Related Documentation
The following documents contain information that you may find helpful as you read this manual.
•
•
Macintosh II or Quadra Owner’s Manual, Getting Started manual, or Setting Up manual
Inside Macintosh–Volume 5
Customer Communication
National Instruments wants to receive your comments on our products and manuals. We are
interested in the applications you develop with our products, and we want to help if you have
problems with them. To make it easy for you to contact us, this manual contains comment and
configuration forms for you to complete. These forms are in Appendix E, Customer
Communication, at the end of this manual.
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Chapter 1
Introduction
This chapter describes the Lab-NB, lists what you need to get started, software programming
choices, optional equipment, and explains how to unpack the Lab-NB.
About the Lab-NB
Thank you for buying the National Instruments Lab-NB. The Lab-NB is a low-cost multi-
function analog, digital, and timing I/O board for Macintosh NuBus computers. It contains a
12-bit successive-approximation ADC with eight analog inputs, two 12-bit DACs with voltage
outputs, 24 lines of TTL-compatible digital I/O, and six 16-bit counter/timer channels for timing
I/O.
The low cost of a Lab-NB-based system makes it ideal for laboratory work in industrial and
academic environments. The multichannel analog input is useful in signal analysis and data
logging. The 12-bit ADC is useful in high-resolution applications such as chromatography,
temperature measurement, and DC voltage measurement. The analog output channels can be
used to generate experiment stimuli and are also useful for machine and process control and
analog function generation. The 24 TTL-compatible digital I/O lines can be used for switching
external devices such as transistors and solid-state relays, for reading the status of external digital
logic, and for generating interrupts. The counter/timers can be used to synchronize events,
generate pulses, and measure frequency and time. The Lab-NB, used in conjunction with the
Macintosh, is a versatile, cost-effective platform for laboratory test, measurement, and control.
Note: The Lab-NB cannot sink sufficient current to drive the SSR-OAC-5 and
SSR-OAC-5A output modules. However, it can drive the SSR-ODC-5 output module
and all SSR input modules available from National Instruments.
If you need to drive a SSR-OAC-5 or SSR-OAC-5A, you can use a non-inverting digital
buffer chip between the Lab-NB and the SSR backplane.
Detailed Lab-NB specifications are in Appendix A, Specifications.
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Introduction
Chapter 1
What You Need to Get Started
To set up and use your Lab-NB board, you will need the following:
Lab-NB board
Lab-NB User Manual
One of the following software packages and documentation:
NI-DAQ software for Macintosh
LabVIEW for Macintosh
Your computer
Software Programming Choices
There are several options to choose from when programming your National Instruments DAQ
and SCXI hardware. You can use LabVIEW, LabWindows/CVI, or NI-DAQ. A 4.6.1 or earlier
version of NI-DAQ supports LabWindows for DOS.
LabVIEW and LabWindows/CVI Application Software
LabVIEW and LabWindows/CVI are innovative program development software packages for
data acquisition and control applications. LabVIEW uses graphical programming, whereas
LabWindows/CVI enhances traditional programming languages. Both packages include
extensive libraries for data acquisition, instrument control, data analysis, and graphical data
presentation.
LabVIEW features interactive graphics, a state-of-the-art user interface, and a powerful graphical
programming language. The LabVIEW Data Acquisition VI Library, a series of VIs for using
LabVIEW with National Instruments DAQ hardware, is included with LabVIEW. The
LabVIEW Data Acquisition VI Libraries are functionally equivalent to the NI-DAQ software.
LabWindows/CVI features interactive graphics, a state-of-the-art user interface, and uses the
ANSI standard C programming language. The LabWindows/CVI Data Acquisition Library, a
series of functions for using LabWindows/CVI with National Instruments DAQ hardware, is
included with the NI-DAQ software kit. The LabWindows/CVI Data Acquisition libraries are
functionally equivalent to the NI-DAQ software.
Using LabVIEW or LabWindows/CVI software will greatly reduce the development time for
your data acquisition and control application.
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Chapter 1
Introduction
NI-DAQ Driver Software
The NI-DAQ driver software is included at no charge with all National Instruments DAQ
hardware. NI-DAQ is not packaged with SCXI or accessory products, except for the SCXI-1200.
NI-DAQ has an extensive library of functions that you can call from your application
programming environment. These functions include routines for analog input (A/D conversion),
buffered data acquisition (high-speed A/D conversion), analog output (D/A conversion),
waveform generation, digital I/O, counter/timer operations, SCXI, RTSI, self-calibration,
messaging, and acquiring data to extended memory.
NI-DAQ has both high-level DAQ I/O functions for maximum ease of use and low-level DAQ
I/O functions for maximum flexibility and performance. Examples of high-level functions are
streaming data to disk or acquiring a certain number of data points. An example of a low-level
function is writing directly to registers on the DAQ device. NI-DAQ does not sacrifice the
performance of National Instruments DAQ devices because it lets multiple devices operate at
their peak performance.
NI-DAQ also internally addresses many of the complex issues between the computer and the
DAQ hardware such as programming interrupts and DMA controllers. NI-DAQ maintains a
consistent software interface among its different versions so that you can change platforms with
minimal modifications to your code. Figure 1-1 illustrates the relationship between NI-DAQ and
LabVIEW and LabWindows/CVI.
Conventional
LabVIEW
(PC, Macintosh, or
Sun SPARCstation)
LabWindows/CVI
(PC or Sun
SPARCstation)
Programming
Environment
(PC, Macintosh, or
Sun SPARCstation)
NI-DAQ
Driver Software
Personal
Computer or
Workstation
DAQ or
SCXI Hardware
Figure 1-1. The Relationship between the Programming Environment,
NI-DAQ, and Your Hardware
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Introduction
Chapter 1
Register-Level Programming
The final option for programming any National Instruments DAQ hardware is to write register-
level software. Writing register-level programming software can be very time-consuming and
inefficient, and is not recommended for most users.
Even if you are an experienced register-level programmer, consider using NI-DAQ, LabVIEW,
or LabWindows/CVI to program your National Instruments DAQ hardware. Using the NI-DAQ,
LabVIEW, or LabWindows/CVI software is easier than, and as flexible as, register-level
programming, and can save weeks of development time.
Optional Equipment
National Instruments offers a variety of products to use with your Lab-NB board, including
cables, connector blocks, and other accessories, as follows:
•
•
•
•
Cables and cable assemblies, shielded and ribbon
Connector blocks, shielded and unshielded 50-pin screw terminals
Real Time System Integration (RTSI) bus cables
Signal conditioning eXtensions for Instrumentation (SCXI) modules and accessories for
isolating, amplifying, exciting, and multiplexing signals for relays and analog output. With
SCXI you can condition and acquire up to 3,072 channels.
•
Low channel count signal conditioning modules, boards, and accessories, including
conditioning for strain gauges and RTDs, simultaneous sample and hold, and relays.
For more specific information about these products, refer to your National Instruments catalog or
call the office nearest you.
Cabling
National Instruments offers cables and accessories for you to prototype your application or to use
if you frequently change board interconnections.
If you want to develop your own cable, however, the following guidelines may be useful:
National Instruments currently offers a cable termination accessory, the CB-50, for use with the
Lab-NB board. This kit includes a terminated, 50-conductor, flat ribbon cable and a connector
block. Signal input and output wires can be attached to screw terminals on the connector block
and thereby connected to the Lab-NB I/O connector.
The CB-50 is useful for initially prototyping an application or in situations where Lab-NB
interconnections are frequently changed. When you develop a final field wiring scheme,
however, you may wish to develop your own cable.
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Introduction
The Lab-NB I/O connector is a 50-pin male ribbon cable header. The manufacturer part
numbers used by National Instruments for this header are as follows:
•
•
Electronic Products Division/3M (part number 3596-5002)
T&B/Ansley Corporation (part number 609-500)
The mating connector for the Lab-NB is a 50-position, polarized, ribbon socket connector with
strain relief. National Instruments uses a polarized (keyed) connector to prevent inadvertent
upside-down connection to the Lab-NB. Recommended manufacturer part numbers for this
mating connector are as follows:
•
•
Electronic Products Division/3M (part number 3425-7650)
T&B/Ansley Corporation (part number 609-5041CE)
The following are the standard ribbon cables (50-conductor, 28 AWG, stranded) that can be used
with these connectors:
•
•
Electronic Products Division/3M (part number 3365/50)
T&B/Ansley Corporation (part number 171-50)
Unpacking
Your Lab-NB board is shipped in an antistatic package to prevent electrostatic damage to the
board. Electrostatic discharge can damage several components of the board. To avoid such
damage in handling the board, take the following precautions:
•
•
Ground yourself via a grounding strap or by holding a grounded object.
Touch the antistatic package to a metal part of your computer chassis before removing the
board from the package.
•
•
Remove the board from the package and inspect the board for loose components or any other
sign of damage. Notify National Instruments if the board appears damaged in any way. Do
not install a damaged board into your computer.
Never touch the exposed pins of connectors.
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Chapter 2
Configuration and Installation
This chapter describes how to configure and install the Lab-NB into your Macintosh computer,
and also includes signal connections to the Lab-NB and cable wiring.
Board Configuration
The Lab-NB contains three jumpers for changing the analog input and output configuration of
the board. The jumpers are shown in the parts locator diagram in Figure 2-1. Jumpers W1 and
W2 configure the two analog outputs. Jumper W3 (not labeled on the board) is used to select the
analog input range. Because of space constraints on the board, the jumper post labels are
missing. To distinguish between the A, B, and C posts of the jumpers, hold the board so that the
component side is facing you, the NuBus connector is down, and the 50-pin I/O connector is on
your right. The posts are then in the order A-B-C from left to right on all three of the horizontal
jumpers, as shown in Figure 2-1.
Note: This same orientation of the board is also assumed in the figures illustrating the
jumper connections (Figures 2-2 and 2-3).
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3
2
1
1
2
3
W1
W2
W3
Figure 2-1. Parts Locator Diagram
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Factory Default Jumper Settings
The Lab-NB is shipped from the factory with the following configuration:
•
•
Jumpers W1 and W2–bipolar analog output
Jumper W3–bipolar analog input
Table 2-1 lists all the available jumper configurations for the Lab-NB with the factory defaults
noted.
Table 2-1. Lab-NB Jumper Settings
Configuration
Jumper Setting
Output CH0
Polarity
Bipolar: ±5 V (factory setting)
Unipolar: 0 to 10 V
W1: A-B
W1: B-C
Output CH1
Polarity
Bipolar: ±5 V (factory setting)
Unipolar: 0 to 10 V
W2: A-B
W2: B-C
Input Range
Bipolar: ±5 V (factory setting)
Unipolar: 0 to 10 V
W3: A-B
W3: B-C
Analog Output Configuration
Two ranges are available for the analog outputs: bipolar (±5 V) and unipolar (0 to 10 V).
Jumper W1 controls output channel 0, and W2 controls output channel 1.
Bipolar Output Selection
You can select the bipolar (±5 V) output configuration for either analog output channel by
setting the following jumpers:
Analog Output Channel 0
Analog Output Channel 1
W1
W2
A-B
A-B
This configuration is shown in Figure 2-2.
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W1
W2
Channel 0
Channel 1
A
A
B
B
C
C
Figure 2-2. Bipolar Output Jumper Configuration
Unipolar Output Selection
You can select the unipolar (0 to 10 V) output configuration for either analog output channel by
setting the following jumpers:
Analog Output Channel 0
Analog Output Channel 1
W1
W2
B-C
B-C
This configuration is shown in Figure 2-3.
W1
W2
Channel 0
Channel 1
A
A
B
B
C
C
Figure 2-3. Unipolar Output Jumper Configuration
Analog Input Configuration
Two ranges are available for the analog inputs: bipolar (±5 V) and unipolar (0 to 10 V). Jumper
W3 controls the input range for all eight analog input channels.
Bipolar Input Selection
You can select the bipolar (±5 V) input configuration by setting the following jumper:
Analog Input
W3
A-B
This configuration is shown in Figure 2-4.
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W3
B
A
C
Figure 2-4. Bipolar Input Jumper Configuration
Unipolar Input Selection
You can select the unipolar (0 to 10 V) input configuration by setting the following jumper:
Analog Input W3 B-C
This configuration is shown in Figure 2-5.
W3
B
A
C
Figure 2-5. Unipolar Input Jumper Configuration
Note: If you are using a software package such as NI-DAQ or LabVIEW, you may need to
reconfigure your software to reflect any changes in jumper or switch settings.
Installation
Find the section in your Macintosh documentation that explains how to install an expansion
board in your computer. You can use this procedure as a universal board installation guide.
First, read the entire procedure. Then, install your Lab-NB board in the Macintosh by following
the outlined procedure.
Signal Connections
I/O Connector Pin Description
Figure 2-6 shows the pin assignments for the Lab-NB I/O connector. This connector is located
on the back panel of the Lab-NB board and is accessible at the rear of the Macintosh computer
after the board has been properly installed.
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Warning: Connections that exceed any of the maximum ratings of input or output signals on
the Lab-NB may result in damage to the Lab-NB board and to the Macintosh
computer. This includes connecting any power signals to ground and vice versa.
National Instruments is NOT liable for any damages resulting from any such
signal connections.
ACH0
ACH2
ACH4
ACH6
AIGND
AOGND
DGND
PA1
ACH1
ACH3
ACH5
ACH7
DAC0 OUT
DAC1 OUT
PA0
1
3
5
7
9
2
4
6
8
10
11 12
13 14
15 16
17 18
19 20
21 22
23 24
PA2
PA3
PA4
PA5
PA6
PA7
PB0
PB1
PB2
PB3
PB4
25 26
27 28
29 30
31 32
33 34
35 36
37 38
39 40
41 42
43 44
45 46
47 48
49 50
PB5
PB6
PB7
PC0
PC1
PC2
PC3
PC4
PC5
PC6
PC7
EXTTRIG
EXTCONV*
GATB0
GATB1
OUTB2
CLKB2
DGND
EXTUPDATE*
OUTB0
OUTB1
CLKB1
GATB2
+5V
Figure 2-6. Lab-NB I/O Connector Pin Assignments
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Signal Connection Descriptions
Pin
1-8
9
Signal Name
ACH<0..7>
AIGND
Description
Analog input channels 0 through 7 (single-ended).
Analog input ground.
10
DAC0 OUT
AOGND
DAC1 OUT
DGND
Voltage output signal for analog output channel 0.
Analog output ground.
11
12
Voltage output signal for analog output channel 1.
Digital ground.
13
14–21
22–29
30–37
38
PA<0..7>
PB<0..7>
PC<0..7>
EXTTRIG
EXTUPDATE*
EXTCONV*
OUTB0
Bidirectional data lines for port A. PA7 is the MSB, PA0 the LSB.
Bidirectional data lines for port B. PB7 is the MSB, PB0 the LSB.
Bidirectional data lines for port C. PC7 is the MSB, PC0 the LSB.
External control signal to start a timed conversion sequence.
External control signal to update DAC outputs.
External control signal to trigger A/D conversions.
Counter B0 output.
39
40
41
42
GATB0
Counter B0 gate.
43
OUTB1
Counter B1 output.
44
GATB1
Counter B1 gate.
45
CLKB1
Counter B1 clock.
46
OUTB2
Counter B2 output.
47
GATB2
Counter B2 gate.
48
CLKB2
Counter B2 clock.
49
+5 V
+5 V out, 1 A maximum.
50
DGND
Digital ground.
Note: Pin 49 is connected to the NuBus +5 V supply via a 1 A fuse. A replacement fuse is available
from Allied Electronics, part number 845-2007, and Littelfuse, part number 251001.
* Indicates that the signal is active low.
The connector pins can be grouped into analog input signal pins, analog output signal pins,
digital I/O signal pins, and timing I/O signal pins. Signal connection guidelines for each of these
groups are included later in this chapter.
Analog Input Signal Connections
Pins 1 through 8 are analog input signal pins for the 12-bit ADC. Pin 9, AIGND, is an analog
common signal. This pin can be used for a general analog power ground tie to the Lab-NB. Pins
1 through 8 are tied to the eight single-ended analog input channels of the input multiplexer
through 4.7-kΩ series resistances. Pin 40 is EXTCONV* and can be used to trigger conversions.
A conversion occurs when this signal makes a high-to-low transition. It can only be used to
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cause conversions to occur; it cannot be used as a monitor to detect conversions caused by the
onboard sample-interval timer.
The following input ranges and maximum ratings apply to inputs ACH<0..7>:
Input impedance
Input signal range
0.1 GΩ in parallel with 45 pF
Bipolar input: ±(5 / gain) V
Unipolar input: 0 to (10 / gain) V
Maximum input voltage rating
±45 V powered on or off
Exceeding the input signal range for gain settings greater than 1 will not damage the input
circuitry as long as the maximum input voltage rating of ±45 V is not exceeded. For example,
with a gain of 10, the input signal range is ±0.5 V for bipolar input and 0 to 1 V for unipolar
input, but the Lab-NB is guaranteed to withstand inputs up to the maximum input voltage rating.
Warning: Exceeding the input signal range will result in distorted input signals. Exceeding
the maximum input voltage rating may result in damage to the Lab-NB board and
to the Macintosh computer. National Instruments is NOT liable for any damages
resulting from any such signal connections.
Connections for Signal Sources
Figure 2-7 shows how to connect a signal source to a Lab-NB board. When you connect
grounded signal sources, observe the polarity carefully to avoid shorting the signal source output.
ACH<0..7>
1
2
3
+
+
+
Programmable Gain
Amplifier
•
•
•
Signal
Source
+
-
V
V
V
S1
-
S2
-
S3
-
8
9
+
Input Multiplexer
AIGND
Measured
Voltage
V
M
R
f
I/O Connector
R
a
-
Lab-NB Board
Figure 2-7. Analog Input Signal Connections
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Analog Output Signal Connections
Pins 10 through 12 of the I/O connector are analog output signal pins.
Pins 10 and 12 are the DAC0 OUT and DAC1 OUT signal pins. DAC0 OUT is the voltage
output signal for Analog Output Channel 0. DAC1 OUT is the voltage output signal for Analog
Output Channel 1.
Pin 11, AOGND, is the ground reference point for both analog output channels as well as analog
input.
The following output ranges are available:
*
Output signal range
Bipolar input: ±5 V
*
Unipolar input: 0 to 10 V
*
Maximum load current = ±1 mA for 12-bit linearity
Figure 2-8 shows how to make analog output connections.
10
DAC0 OUT
Channel 0
+
-
Load
Load
VOUT 0
AOGND
11
12
-
VOUT 1
DAC1 OUT
+
Channel 1
Analog Output Channels
Lab-NB Board
Figure 2-8. Analog Output Signal Connections
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Digital I/O Signal Connections
Pins 13 through 37 of the I/O connector are digital I/O signal pins. Digital I/O on the Lab-NB is
designed around the 82C55A integrated circuit. The 82C55A is a general-purpose PPI
containing 24 programmable I/O pins. These pins represent the three 8-bit ports (PA, PB, and
PC) of the 82C55A.
Pins 14 through 21 are connected to the digital lines PA<0..7> for digital I/O port A. Pins 22
through 29 are connected to the digital lines PB<0..7> for digital I/O port B. Pins 30 through 37
are connected to the digital lines PC<0..7> for digital I/O port C. Pin 13, DGND, is the digital
ground pin for all three digital I/O ports.
The following specifications and ratings apply to the digital I/O lines.
Absolute maximum voltage input rating +5.5 V with respect to DGND
-0.5 V with respect to DGND
Digital input specifications (referenced to DGND):
VIH input logic high voltage
VIL input logic low voltage
2.2 V min
0.8 V max
IIH input current load,
logic high input voltage
1.0 µA max
-1.0 µA max
IIL input current load,
logic low input voltage
Digital output specifications (referenced to DGND):
VOH output logic high voltage
VOL output logic low voltage
3.7 V min
0.4 V max
I
OH output source current,
logic high
-2.5 mA max
2.5 mA max
IOL output sink current,
logic low
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Figure 2-9 illustrates signal connections for three typical digital I/O applications.
+5 V
LED
Port A
14 PA0
PA<7..0>
Port B
22 PB0
PB<7..0>
TTL Signal
30 PC0
+5 V
Port C
PC<7..0>
Switch
13
DGND
I/O Connector
Lab-NB Board
Figure 2-9. Digital I/O Connections
In Figure 2-9, port A is configured for digital output, and ports B and C are configured for digital
input. Digital input applications include receiving TTL signals and sensing external device states
such as the switch in Figure 2-9. Digital output applications include sending TTL signals and
driving external devices such as the LED shown in Figure 2-9.
Port C Pin Connections
The signals assigned to port C depend on the mode in which the 82C55A is programmed. In
mode 0, port C is considered as two 4-bit I/O ports. In modes 1 and 2, port C is used for status
and handshaking signals with two or three I/O bits mixed in. The following table summarizes
the signal assignments of port C for each programmable mode. See Chapter 4, Register-Level
Programming, for programming information.
Warning: During programming, note that each time a port is configured, output ports A
and C are reset to 0, and output port B is undefined.
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Table 2-2. Port C Signal Assignments
Programming
Mode
Group A
Group B
PC7
PC6
I/O
PC5
I/O
PC4
PC3
PC2
PC1
PC0
I/O
I/O
I/O
I/O
I/O
I/O
I/O
Mode 0
I/O
IBF
STB *
INTR
INTR
INTR
STB *
IBFB
INTR
Mode 1 Input
Mode 1 Output
Mode 2
A
A
A
A
A
B
B
B
OBF *
ACK * I/O
I/O
ACK * OBF *
INTR
A
A
B
B
B
OBF *
ACK * IBF
STB *
I/O
I/O
I/O
A
A
A
A
* Indicates that the signal is active low.
Timing Specifications
The handshaking lines STB* and IBF are used to synchronize input transfers. The handshaking
lines OBF* and ACK* are used to synchronize output transfers.
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The following signals are used in the timing diagrams shown later in this chapter:
Pin
Direction
Description
STB*
Input
Strobe Input—A low signal on this handshaking line loads data into the
input latch.
IBF
Output
Input
Input Buffer Full—A high signal on this handshaking line indicates that
data has been loaded into the input latch. This is basically an input
acknowledge signal.
ACK*
Acknowledge Input—A low signal on this handshaking line indicates
that the data written from the specified port has been accepted. This
signal is basically a response from the external device that it has received
the data from the Lab-NB.
OBF*
INTR
Output
Output
Output Buffer Full—A low signal on this handshaking line indicates that
data has been written from the specified port.
Interrupt Request—This signal becomes high when the 82C55A is
requesting service during a data transfer. The appropriate interrupt
enable signals must be set to generate this signal.
RD*
Internal
Read Signal—This signal is the read signal generated from the control
lines of the NuBus.
WR*
DATA
Internal
Write Signal—This signal is the write signal generated from the control
lines of the NuBus.
Bidirectional
Data Lines at the Specified Port—This signal indicates when the data on
the data lines at a specified port is or should be available.
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Mode 1 Input Timing
The following figure illustrates the timing specifications for an input transfer in mode 1.
T1
T2
T4
STB *
IBF
T7
T6
INTR
RD *
T5
T3
DATA
Name Description
Minimum
Maximum
T1
T2
T3
T4
T5
T6
T7
STB* pulse width
100
–
20
–
50
–
–
–
150
–
150
–
200
150
STB* = 0 to IBF = 1
Data before STB* = 1
STB* = 1 to INTR = 1
Data after STB* = 1
RD* = 0 to INTR = 0
RD* = 1 to IBF = 0
All timing values are in nanoseconds.
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Mode 1 Output Timing
The following figure illustrates the timing specifications for an output transfer in mode 1.
T3
WR*
T4
OBF*
T1
T6
INTR
T5
ACK*
DATA
T2
Name Description
Minimum
Maximum
T1
T2
T3
T4
T5
T6
WR* = 0 to INTR = 0
WR* = 1 to output
WR* = 1 to OBF* = 0
ACK* = 0 to OBF* = 1
ACK* pulse width
–
–
–
250
200
150
150
–
–
100
–
ACK* = 1 to INTR = 1
150
All timing values are in nanoseconds.
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Mode 2 Bidirectional Timing
The following figure illustrates the timing specifications for bidirectional transfers in mode 2.
T1
WR *
T6
OBF *
INTR
T7
ACK *
T3
STB *
T10
T4
IBF
RD *
T5
T2
T8
T9
DATA
Name Description
Minimum
Maximum
T1
T2
T3
T4
T5
T6
T7
T8
T9
T10
WR* = 1 to OBF* = 0
Data before STB* = 1
STB* pulse width
STB* = 0 to IBF = 1
Data after STB* = 1
ACK* = 0 to OBF = 1
ACK* pulse width
ACK* = 0 to output
ACK* = 1 to output float
RD* = 1 to IBF = 0
–
20
100
–
50
–
100
–
20
–
150
–
–
150
–
150
–
150
250
150
All timing values are in nanoseconds.
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Timing Connections
Pins 38 through 48 of the I/O connector are connections for timing I/O signals. The timing I/O of
the Lab-NB is designed around the 8253 Counter/Timer integrated circuit. Two of these integrated
circuits are employed in the Lab-NB. One, designated 8253(A), is used exclusively for DAQ
timing, and the other, 8253(B), is available for general use. Pins 38 through 40 carry external
signals that can be used for DAQ timing in place of the dedicated 8253(A). These signals are
explained under DAQ Timing Connections later in this chapter. Pins 41 through 48 carry general-
purpose timing signals from 8253(B). These signals are explained under General-Purpose
Timing Connections later in this chapter.
DAQ Timing Connections
Counter 0 on the 8253(A) Counter/Timer (referred to as A0) is used as a sample-interval counter
in timed A/D conversions. Counter 1 on the 8253(B) Counter/Timer (referred to as A1) is used as
a sample counter in conjunction with counter 0 for data acquisition. These counters are not
available for general use. In addition to counter A0, EXTCONV* can be used to externally time
conversions. See Chapter 4, Register-Level Programming, for the programming sequence needed
to enable this input. Figure 2-10 shows the timing requirements for the EXTCONV* input. An
A/D conversion is initiated by a falling edge on the EXTCONV*. If EXTCONV* stays low
more than 12 µsec, the data from this conversion is not latched into the FIFO memory until the
following rising edge on EXTCONV*. If EXTCONV* stays low less than 12 µsec, the data from
this conversion is latched into the FIFO memory after 12 µsec.
t
w
EXTCONV*
V
IH
t
w
V
t
250 nsec minimum
(worst-case)
IL
w
(100 nsec typical)
A/D Conversion starts within
125 nsec from this point
Figure 2-10. EXTCONV* Signal Timing
Another external control, EXTTRIG, is used for either starting a DAQ sequence or terminating an
ongoing DAQ sequence, depending on the settings of the EXTTRIGEN and PRETRIG bits in the
ADC Configuration Register.
If EXTTRIGEN is set, EXTTRIG serves as an external trigger to start a DAQ sequence. In this
mode, posttrigger mode, the sample-interval counter is gated off until a rising edge is sensed on
the EXTTRIG line. EXTCONV*, however, is enabled on the first rising edge of EXTCONV*,
following the rising edge on the EXTTRIG line. Further transitions on the EXTTRIG line have no
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effect until a new DAQ sequence is established. Figures 2-11 and 2-12 illustrate two possible
posttrigger DAQ timing cases. In Figure 2-11, the rising edge on EXTTRIG is sensed when the
EXTCONV* input is high. Thus, the first A/D conversion occurs on the second falling edge of
EXTCONV*, after the rising edge on EXTTRIG. In Figure 2-12, the rising edge on EXTTRIG is
sensed when the EXTCONV* input is low. In this case, the first A/D conversion occurs on the
first falling edge of EXTCONV*, after the rising edge on EXTTRIG. Notice that Figures 2-11
and 2-12 show a controlled acquisition mode DAQ sequence; that is, Sample Counter A1 disables
further A/D conversions after the programmed count (3 in the examples shown in Figures 2-11
and 2-12) expires. The counter is not loaded with the programmed count until the first falling edge
following a rising edge on the clock input; therefore two extra conversion pulses are generated as
shown in Figures 2-11 and 2-12. EXTTRIG can also be used as an external trigger in freerun
acquisition mode.
t
w
V
IH
EXTTRIG
t
w
V
IL
t
50 nsec minimum
w
EXTCONV*
CONVERT
Sample
Counter
X
X
3
2
1
0
Figure 2-11. Posttrigger DAQ Timing
(EXTCONV* High When Trigger Sensed)
t
w
V
IH
t
EXTTRIG
w
V
IL
t
t
50 nsec minimum
50 nsec minimum
w
d
EXTCONV*
CONVERT
Sample
Counter
X
3
2
1
0
Figure 2-12. Posttrigger DAQ Timing
(EXTCONV* Low When Trigger Sensed)
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Configuration and Installation
If PRETRIG is set, EXTTRIG serves as a pretrigger signal. In pretrigger mode, A/D conversions
are enabled via software before a rising edge is sensed on the EXTTRIG input. However, the
sample counter, counter A1, is not gated on until a rising edge is sensed on the EXTTRIG input.
Additional transitions on this line have no effect until a new DAQ sequence is set up.
Conversions remain enabled for the programmed count after the trigger; therefore, data can be
acquired before and after the trigger. Pretrigger mode works only in controlled acquisition
mode, that is, counter A1 is required to disable A/D conversions after the programmed count
expires. Thus, the maximum number of samples acquired after the trigger is limited to 65,535.
The number of samples acquired before the trigger is limited only by the size of the memory
buffer available for data acquisition. Figure 2-13 shows a pretrigger DAQ timing sequence.
t
w
V
IH
EXTTRIG
t
w
V
IL
t
50 nsec minimum
w
EXTCONV*
CONVERT
Sample
Counter
4
3
2
1
0
Figure 2-13. Pretrigger DAQ Timing
Because both pretrigger and posttrigger modes use EXTTRIG input, only one mode can be used
at a time. If neither PRETRIG nor EXTTRIGEN is set high, this signal has no effect.
The final external control signal, EXTUPDATE*, is used to externally control the updating of
the output voltage of the 12-bit DACs or to generate an externally timed interrupt on the NuBus.
If the TMRWGEN bit in the DAC Configuration Register is set, the DAC voltage is updated by a
low level on the EXTUPDATE* signal. If the TMRINTEN bit in the Interrupt Control Register
is set, an interrupt is generated whenever a rising edge is detected on the EXTUPDATE* bit .
Therefore, externally timed, interrupt-driven waveform generation is possible on the Lab-NB.
Figure 2-14 illustrates a waveform generation timing sequence using the EXTUPDATE* signal.
Notice that the DACs are updated by a low level on the EXTUPDATE* line. Any writes to the
DAC Data Registers while EXTUPDATE* is low therefore result in immediate update of the
DAC output voltages.
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EXTUPDATE*
t
ext
DAC OUTPUT
UPDATE
TMRINTUP
DACWRT
t
Minimum 50 nsec
ext
Figure 2-14. Waveform Generation Timing with the EXTUPDATE* Signal
Since a rising edge on the EXTUPDATE* signal always sets the TMRINTUP bit in the Interrupt
Status Register, the EXTUPDATE* signal can also be used for periodic interrupt generation
timed by an external source. The TMRINTUP bit is cleared by writing to either of the two
DACs or to the TMRINTCL bit location. Figure 2-15 illustrates a timing sequence where
EXTUPDATE* is being used to generate a NuBus interrupt.
EXTUPDATE*
TMRINTUP
and
NuBusNMR
TMRINTCLR
Figure 2-15. NuBus Interrupt Generation with the EXTUPDATE* Signal
The following specifications and ratings apply to the EXTCONV*, EXTTRIG and
EXTUPDATE* signals.
Absolute maximum voltage input rating -0.5 to 7.0 V with respect to DGND
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8253 digital input specifications (referenced to DGND):
VIH input logic high voltage
VIL input logic low voltage
Input load current
2.2 V min
0.8 V max
±10 µA max
8253 digital output specifications (referenced to DGND):
VOH output logic high voltage
OL output logic low voltage
2.4 V min
V
0.45 V max
400 µA max
2.2 mA max
I
I
OH output source current, at VOH
OL output sink current, at VOL
General-Purpose Timing Signal Connections
The general-purpose timing signals include the GATE, CLK, and OUT signals for the three
8253(B) counters. The 8253 Counter/Timers can be used for general-purpose applications such
as pulse and square wave generation; event counting; and pulse-width, time-lapse, and frequency
measurement. For these applications, CLK and GATE signals are sent to the counters, and the
counters are programmed for various operations. The single exception is counter B0, which has
an internal 2-MHz clock.
The 8253 Counter/Timer is described briefly in Chapter 3, Theory of Operation. For detailed
programming information, consult Appendix C, AMD 8253 Data Sheet.
Pulse and square wave generation are performed by programming a counter to generate a timing
signal at its OUT output pin.
Event counting is performed by programming a counter to count rising or falling edges applied
to any of the 8253 CLK inputs. The counter value can then be read to determine the number of
edges that have occurred. Counter operation can be gated on and off during event counting.
Figure 2-16 shows connections for a typical event-counting operation where a switch is used to
gate the counter on and off.
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+5 V
4.7 kΩ
CLK
OUT
GATE
Switch
Signal
Source
Counter (from Group B)
13
DGND
I/O Connector
Lab-NB Board
Figure 2-16. Event-Counting Application with External Switch Gating
Pulse-width measurement is performed by level gating. The pulse to be measured is applied to
the counter GATE input. The counter is loaded with the known count and is programmed to
count down while the signal at the GATE input is high. The pulse width equals the counter
difference (loaded value minus read value) multiplied by the CLK period.
Time-lapse measurement is performed by programming a counter to be edge gated. An edge is
applied to the counter GATE input to start the counter. The counter can be programmed to start
counting after receiving a low-to-high edge. The time lapse since receiving the edge equals the
counter value difference (loaded value minus read value) multiplied by the CLK period.
Frequency measurement is performed by programming a counter to be level gated and by
counting the number of falling edges in a signal applied to a CLK input. The gate signal applied
to the counter GATE input is of known duration. In this case, the counter is programmed to
count falling edges at the CLK input while the gate is applied. The frequency of the input signal
then equals the count value divided by the gate period. Figure 2-17 shows the connections for a
frequency measurement application. A second counter could also be used to generate the gate
signal in this application.
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+5 V
4.7 kΩ
CLK
OUT
GATE
Signal
Source
Gate
Source
Counter
13
DGND
I/O Connector
Lab-NB Board
Figure 2-17. Frequency Measurement Application
The GATE, CLK, and OUT signals for counters B1 and B2 are available at the I/O connector. In
addition, the GATE and CLK pins are pulled up to +5 V through a 4.7 kΩ resistor. The input
and output ratings and timing specifications for the 8253 signals are given next.
The following specifications and ratings apply to the 8253 I/O signals:
Absolute maximum voltage input rating -0.5 to 7.0 V with respect to DGND
8253 digital input specifications (referenced to DGND):
VIH input logic high voltage
VIL input logic low voltage
Input load current
2.2 V min
0.8 V max
±10 µA max
8253 digital output specifications (referenced to DGND):
VOH output logic high voltage
OL output logic low voltage
2.4 V min
V
0.45 V max
400 µA max
2.2 mA max
I
I
OH output source current, at VOH
OL output sink current, at VOL
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Chapter 2
Figure 2-18 shows the timing requirements for the GATE and CLK input signals and the timing
specifications for the OUT output signals of the 8253.
t
t
t
pwl
sc
pwh
V
V
IH
IL
CLK
t
t
gh
gsu
V
V
IH
IL
GATE
t
t
gwl
gwh
t
t
outc
outg
V
V
OH
OL
OUT
t
t
t
t
t
t
t
t
t
clock period
380 nsec min
230 nsec min
150 nsec min
100 nsec min
50 nsec min
150 nsec min
100 nsec min
300 nsec min
400 nsec min
sc
clock high level
clock low level
gate setup time
gate hold time
gate high level
gate low level
pwh
pwl
gsu
gh
gwh
gwl
outg
outc
output delay from clock
output delay from gate
Figure 2-18. General-Purpose Timing Signals
The GATE and OUT signals in Figure 2-18 are referenced to the rising edge of the CLK signal.
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Chapter 3
Theory of Operation
This chapter contains a functional overview of the Lab-NB and explains the operation of each
functional unit making up the Lab-NB.
Functional Overview
The block diagram in Figure 3-1 shows a functional overview of the Lab-NB board.
Data/
Address
16
8
12-Bit
A/D
Pgm
Gain
Input
Max
FIFO
NuBus
Interface
12
12
12
1
1
12-Bit
D/A
Control
Signals
8253
Ctr/Timer
Group A
82C55A
Digital
Interface
12-Bit
D/A
8253
Ctr/Timer
Group B
8
1-MHz
Timebase
2-MHz
Timebase
10-MHz
Clock
÷ 10
÷ 5
Figure 3-1. Lab-NB Block Diagram
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Chapter 3
The following are the major components making up the Lab-NB board:
•
•
•
•
•
NuBus interface circuitry
Analog input and DAQ circuitry
Analog output circuitry
Digital I/O circuitry
Timing I/O circuitry
DAQ functions can be executed by using the analog input circuitry and some of the timing I/O
circuitry. The internal data and control buses interconnect the components. The theory of
operation for each of these components is explained in the remainder of this chapter. The theory
of operation for the DAQ circuitry is included with the discussion of the analog input circuitry.
NuBus Interface Circuitry
The Macintosh NuBus is a 32-bit multiplexed address and data bus with a 10-MHz bus clock. In
addition, the NuBus provides interface signals for interrupt and read/write operations. The
NuBus interface circuitry consists of a starting address detector, interface timing signals, and
address-decoder circuitry. This interface circuitry generates the signals necessary to control and
monitor the operation of the Lab-NB multifunction circuitry.
AD<0..31>
Data
Transceivers
Internal Data Bus
16
16
Address
Decoder
Register Selects
NuBus
Interface
Timing
10-MHz Clock
Read & Write Signals
1-MHz
Timebase
1-MHz Clock
(to 8253s)
÷ 10
2-MHz
Timebase
2-MHz Clock
(to 8253s)
÷ 5
Figure 3-2. NuBus Interface Circuitry Block Diagram
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The starting-address-detecting circuitry on the Lab-NB matches address lines 23 through 21 to
the starting address specified by the slot in which the Lab-NB board is installed. The remaining
address lines (19 through 0) are decoded by the Lab-NB address-decoding circuitry to generate
select signals for the registers on the board. The NuBus interface timing signals are decoded by
the Lab-NB interface timing circuitry, which generates the proper read and write signals for the
remaining Lab-NB circuitry. The Lab-NB board can cause interrupts in the Macintosh by
driving the NuBus NMRQ* interrupt line.
Analog Input and DAQ Circuitry
The Lab-NB provides eight channels of analog input with software-programmable gain and
12-bit A/D conversion. Using the timing circuitry, the Lab-NB can also automatically time
multiple A/D conversions. Figure 3-3 shows a block diagram of the analog input and DAQ
circuitry.
Data
12
A/D
Data
MUX
OUT
Pro-
grammable
Gain Amp
ACH0
ACH1
ACH2
ACH3
ACH4
ACH5
ACH6
ACH7
Sample-
and-Hold
Amp
A/D
FIFO
ADC
12
A/D
RD
Mux
CONV
AVAIL
GAIN0
GAIN1
GAIN2
Data
16
ADC
Configuration
Register
4
Mux
Counter
ADC WR
3
Data
Acquisition
Timing
MUX CTR CLK
Counter/Timer
Signals
EXT
TRIG
External Trigger
EXT
CONV*
Figure 3-3. Analog Input and DAQ Circuitry Block Diagram
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Chapter 3
Analog Input Circuitry
The analog input circuitry consists of an input multiplexer, a software-programmable gain
amplifier, a 12-bit ADC, and a 12-bit FIFO memory that is sign-extended to 16 bits.
The input multiplexer is made up of a CMOS analog input multiplexer and has eight analog input
channels (channels 0 through 7). The input multiplexers provide input overvoltage protection of
±45 V, powered on or off.
The programmable gain amplifier applies gain to the input signal, allowing an input analog
signal to be amplified before being sampled and converted, thus increasing measurement
resolution and accuracy. The gain of the instrumentation amplifier is selected under software
control. The Lab-NB board provides gains of 1, 2, 5, 10, 20, 50, and 100.
The Lab-NB uses a 12-bit successive-approximation ADC. The 12-bit resolution of the
converter allows the converter to resolve its input range into 4,096 different steps. This
resolution also provides a 12-bit digital word that represents the value of the input voltage level
with respect to the converter input range. The ADC itself has a single input range of 0 to +5 V.
Additional circuitry allows inputs of ±5 V or 0 to 10 V.
When an A/D conversion is complete, the ADC clocks the result into the A/D FIFO. The A/D
FIFO is 16 bits wide and 16 words deep. This FIFO serves as a buffer to the ADC and provides
two benefits. First, any time an A/D conversion is complete, the value is saved in the A/D FIFO
for later reading, and the ADC is free to start a new conversion. Secondly, the A/D FIFO can
collect up to 16 A/D conversion values before any information is lost, thus allowing software
some extra time (16 times the sample interval) to catch up with the hardware. If more than 16
values are stored in the A/D FIFO without the A/D FIFO being read from, an error condition
called A/D FIFO Overflow occurs and A/D conversion information is lost.
The A/D FIFO generates a signal that indicates when it contains A/D conversion data. The state
of this signal can be read from the Lab-NB Status Register.
The output from the ADC can be interpreted as either straight binary or two's complement,
depending on which input mode you select (unipolar or bipolar). In unipolar mode, the data
from the ADC is interpreted as a 12-bit straight binary number with a range of 0 to +4,095. In
bipolar mode, the data from the ADC is interpreted as a 12-bit two's complement number with a
range of -2,048 to +2,047. In this mode, the MSB of the ADC result is inverted to make it two's
complement. The output from the ADC is then sign-extended to 16 bits, causing either a leading
0 or a leading F (hex) to be added, depending on the coding and the sign. Thus, data values read
from the FIFO are 16 bits wide.
DAQ Timing Circuitry
A DAQ operation refers to the process of taking a sequence of A/D conversions with the sample
interval (the time between successive A/D conversions) carefully timed. The DAQ timing
circuitry consists of various clocks and timing signals that perform this timing. Two types of
data acquisition can be performed by the Lab-NB board: single-channel data acquisition and
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multichannel (scanned) data acquisition. Scanned data acquisition uses a counter to
automatically switch between analog input channels during data acquisition.
DAQ timing consists of signals that initiate a DAQ operation, initiate individual A/D
conversions, gate the DAQ operation, and generate scanning clocks. Sources for these signals
are supplied mainly by timers on the Lab-NB board. One of the two 8253 integrated circuits is
reserved for this purpose.
An A/D conversion can be initiated by a high-to-low transition on the counter A0 output
(OUT A0) of the 8253(A) Counter/Timer chip on the Lab-NB or by a high-to-low transition on
EXTCONV* input. During data acquisition, the onboard sample-interval counter–counter 0 of
8253(A)–is used to generate pulses that initiate A/D conversions.
The sample-interval timer is a 16-bit down counter that uses the 1-MHz clock onboard to
generate sample intervals from 2 µsec to 65,535 µsec (see Timing I/O Circuitry later in this
chapter). Alternatively, it can use the output from counter B0 (OUTB0) of the 8253(B)
Counter/Timer chip on the Lab-NB. Each time the sample-interval timer reaches 0, it generates
a pulse and reloads with the programmed sample-interval count. This operation continues until
the counter is reprogrammed.
As stated in Chapter 4, Register-Level Programming, only counter A0 is required for DAQ
operations in freerun acquisition mode. The software must keep track of the number of
conversions that has occurred and turn off counter A0 after the required number of conversions
has been obtained. In controlled acquisition mode, two counters (counters A0 and A1) are
required for a DAQ operation. Counter A0 generates the conversion pulses, and counter A1
gates off counter A0 after the programmed count has expired.
Single-Channel Data Acquisition
During single-channel data acquisition, the channel select and gain bits in the A/D Configuration
Register select the gain and analog input channel before data acquisition is initiated. These gain
and multiplexer settings remain constant during the entire DAQ process; therefore, all A/D
conversion data is read from a single channel.
Multichannel (Scanned) Data Acquisition
Multichannel data acquisition is performed by enabling scanning during data acquisition.
Multichannel scanning is controlled by a scan counter.
For scanning operations, the scan counter decrements from the highest numbered channel
(specified by the user) through channel 0 and then repeats the sequence. Thus, any number of
channels from 2 to 8 can be scanned. Notice that the same gain setting is used for all channels in
the scan sequence.
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Chapter 3
DAQ Rates
Maximum DAQ rates (number of samples per second) are determined by the conversion period
of the ADC plus the sample-and-hold acquisition time. During multichannel scanning, the DAQ
rates are further limited by the settling time of the input multiplexers and programmable gain
amplifier. After the input multiplexers are switched, the amplifier must be allowed to settle to
the new input signal value to within 12-bit accuracy before an A/D conversion is performed, or
else 12-bit accuracy will not be achieved. The settling time is a function of the gain selected.
The Lab-NB DAQ timing circuitry detects when DAQ rates are high enough to cause A/D
conversions to be lost. If this is the case, this circuitry sets an Overrun error flag in the Lab-NB
Status Register. If the recommended DAQ rates in Table 3-2 are exceeded (an error flag is not
automatically set), the analog input circuitry may not perform at 12-bit accuracy. If these rates
are exceeded by more than a few microseconds, A/D conversions may be lost. Table 3-1 shows
the recommended multiplexer and gain settling times for different gain settings.
Table 3-2 shows the maximum recommended DAQ rates for both single-channel and
multichannel data acquisition. Notice that for a single-channel data acquisition, the data can be
acquired at the maximum rate at any gain setting. The analog input bandwidth, however, is
lower for higher gains. For multichannel data acquisition, observing the DAQ rates given in
Table 3-2 ensures 12-bit accuracy.
Table 3-1. Analog Input Settling Time Versus Gain
Gain Setting
1
Settling Time Recommended
16 µsec
20 µsec
30 µsec
100 µsec
2, 5
10, 20
50, 100
Table 3-2. Lab-NB Maximum Recommended DAQ Rates
Single-Channel Data Acquisition:
Any Gain Setting
Multichannel Data Acquisition:
Gain = 1
62.5 ksamples/sec
62.5 ksamples/sec
50.0 ksamples/sec
33.3 ksamples/sec
10.0 ksamples/sec
Gain = 2, 5
Gain = 10, 20
Gain = 50, 100
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The recommended DAQ rates given in Table 3-2 assume that voltage levels on all the channels
included in the scan sequence are within range for the given gain and are driven by low-
impedance sources. The signal ranges for the possible gains are shown in Table 3-3 and
Table 3-4. Signal levels outside the ranges shown in Table 3-3 on the channels included in the
scan sequence adversely affect the input settling time. Similarly, greater settling time may be
required for channels driven by high-impedance signal sources.
Table 3-3. Bipolar Analog Input Signal Range Versus Gain
Gain Setting
Input Signal Range
-5 V to 4.99756 V
1
2
-2.5 V to 2.49878 V
-1.0 V to 0.99951 V
-500 mV to 499.756 mV
-250 mV to 249.877 mV
-100 mV to 99.951 mV
-50 mV to 49.975 mV
5
10
20
50
100
Table 3-4. Unipolar Analog Input Signal Range Versus Gain
Gain Setting
Input Signal Range
0 V to 9.99756 V
1
2
0 V to 4.99878 V
5
0 V to 1.99951 V
10
20
50
100
0 mV to 999.756 mV
0 mV to 499.877 mV
0 mV to 199.951 mV
0 mV to 99.975 mV
Analog Output Circuitry
The Lab-NB provides two channels of 12-bit D/A output. Each analog output channel can
provide unipolar or bipolar output. Figure 3-4 shows a block diagram of the analog output
circuitry.
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Theory of Operation
Chapter 3
TWOSDA0
DAC0WR
Coding
Ref
DAC0
DAC0 OUT
Data
12
AGND
5 V Internal
Reference
Ref
DAC1WR
DAC1
DAC1 OUT
Coding
Counter
A2
TWOSDA1
EXTUPDATE*
DAC Configuration
Register
CNFGWR
TWOSDA1
TWOSDA0
TMRWGN1
TMRWGN0
Figure 3-4. Analog Output Circuitry Block Diagram
Each analog output channel contains a 12-bit DAC. The DAC in each analog output channel
generates a voltage proportional to the input voltage reference (V ) multiplied by the digital
ref
code loaded into the DAC. Each DAC can be loaded with a 12-bit digital code by writing to the
DAC0 and DAC1 Registers on the Lab-NB board. The voltage output from the two DACs is
available at the Lab-NB I/O connector DAC0 OUT and DAC1 OUT pins.
The DAC voltages can be updated in any of three ways, depending on the setting of the
TMRWGN bit. If this bit is cleared, the DAC output voltage is updated as soon as the
corresponding DAC Data Register is written to. If the TMRWGN bit is set, the DAC output
voltage does not change until a falling edge is detected either from counter A2 or from
EXTUPDATE*.
Each DAC channel can be jumper-programmed for either a unipolar voltage output or a bipolar
voltage output range. A unipolar output gives an output voltage range of 0.0000 V to +9.9976 V.
A bipolar output gives an output voltage range of -5.0000 V to +4.9976 V. For unipolar output,
0.0000 V output corresponds to a digital code word of 0. For bipolar output, -5.0000 V output
corresponds to a digital code word of F800 (hex). One LSB is the voltage increment
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Chapter 3
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corresponding to an LSB change in the digital code word. For both unipolar and bipolar output,
one LSB corresponds to the following formula:
10 V
4,096
Digital I/O Circuitry
The digital I/O circuitry is designed around an 82C55A integrated circuit. The 82C55A is a
general-purpose PPI containing 24 programmable I/O pins. These pins represent the three 8-bit
I/O ports (A, B, and C) of the 82C55A as well as PA<0..7>, PB<0..7>, and PC<0..7> on the
Lab-NB I/O connector. The 82C55A also has a control register to configure each of the three
I/O ports on the chip. These ports can be programmed as two groups of 12 signals or as three
individual 8-bit ports. In addition, the board can be programmed in one of the three modes of
operation: basic I/O, strobed I/O, or bidirectional bus. The programming of the digital I/O
circuitry is covered in Chapter 4, Register-Level Programming.
PA<0..7>
8
PB<0..7>
8
DATA<0..7>
82C55A
Programmable
Peripheral
PC<0..7>
8
DIO RD/WR
2
Interface
To
Interrupt
Control
PC0
PC3
Figure 3-5. Digital I/O Circuitry Block Diagram
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Chapter 3
All three ports on the 82C55A are TTL-compatible. When enabled, the digital output ports are
capable of sinking 2.5 mA of current and sourcing 2.5 mA of current on each digital I/O line.
When the ports are not enabled, the digital I/O lines act as high-impedance inputs.
Timing I/O Circuitry
The Lab-NB uses two 8253 Counter/Timer integrated circuits for DAQ timing and for general-
purpose timing I/O functions. One of these is used internally for DAQ timing, and the other is
available for general use. Figure 3-6 shows a block diagram of both groups of timing I/O
circuitry (counter groups A and B).
OUTB0
1-MHz Source
GATEB2
CLKB2
OUTB2
GATEB1
MUX
TBSEL
CLKB1
OUTB1
CLKA0
CTR RD
CTR WR
OUTB0
GATEA0
GATEB0
CLKB0
Sample
Interval
Counter
8253
Counter/Timer
Group B
2-MHz
Source
Data
8
OUTA0
CLKA1
EXTCONV*
A/D Conversion Logic
Sample
Counter
GATEA1
OUTA1
EXTTRIG
CLKA2
+5 V
GATEA2
DAC
Timing
EXTUPDATE*
OUTA2
D/A Conversion Timing
8253
Counter/Timer
Group A
Figure 3-6. Timing I/O Circuitry Block Diagram
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Each 8253 contains three independent 16-bit counter/timers and one 8-bit Mode Register. As
shown in Figure 3-6, counter group A is reserved for DAQ timing, and counter group B is free
for general use. The output of counter B0 can be used in place of the 1-MHz clock source on
counter A0 to allow clock periods greater than 65,536 µsec. All six counter/timers can be
programmed to operate in several useful timing modes. The programming and operation of the
8253 is presented in detail both in Chapter 4, Register-Level Programming, and in Appendix C,
AMD 8253 Data Sheet.
The 8253 for counter group A uses either a 1-MHz clock generated from the NuBus clock or the
output from counter B0, which has a 2-MHz clock source, for its timebase. The timebases for
counters B1 and B2 must be supplied externally through the 50-pin I/O connector. The 16-bit
counters in the 8253 can be diagrammed as shown in Figure 3-7.
CLK
Counter
OUT
GATE
Figure 3-7. Counter Block Diagram
Each counter has a CLK input pin, a GATE input pin, and an output pin labeled OUT. The 8253
counters are numbered 0 through 2, and their GATE, CLK, and OUT pins are labeled GATE N,
CLK N, and OUT N, where N is the counter number.
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Chapter 4
Register-Level Programming
This chapter describes in detail the address and function of each of the Lab-NB control and status
registers. This chapter also includes important information about register-level programming the
Lab-NB.
Note: If you plan to use a programming software package such as NI-DAQ or LabVIEW
with your Lab-NB board, you need not read this chapter.
Register Access
The Macintosh uses memory mapping to access boards in the system. The following sections
discuss how to access the various registers on the Lab-NB.
Slot Address Space
Each slot in the Macintosh computer is allocated a block of Macintosh memory addresses known
as the slot address space. All I/O boards plugged into Macintosh slots are therefore memory
mapped, and when a board is plugged into a given slot, its registers can be accessed within that
slot address space. The block of memory addresses allocated to each slot depends on the slot
number. The slots are labeled 1 through 6 next to the slot connectors inside the Macintosh II,
IIx, and IIfx. Table 4-1 shows the slot address space for each slot.
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Chapter 4
Table 4-1. Macintosh Slot Addresses
Slot Number
Starting Address (Hex)
Ending Address (Hex)
24-Bit Mode
9
0090 0000
00A0 0000
00B0 0000
00C0 0000
00D0 0000
00E0 0000
009F FFFF
00AF FFFF
00BF FFFF
00CF FFFF
00DF FFFF
00EF FFFF
A
B
C
D
E
32-Bit Mode
0
1
2
3
4
5
6
7
8
F000 0000
F100 0000
F200 0000
F300 0000
F400 0000
F500 0000
F600 0000
F700 0000
F800 0000
F900 0000
FA00 0000
FB00 0000
FC00 0000
FD00 0000
FE00 0000
F0FF FFFF
F1FF FFFF
F2FF FFFF
F3FF FFFF
F4FF FFFF
F5FF FFFF
F6FF FFFF
F7FF FFFF
F8FF FFFF
F9FF FFFF
FAFF FFFF
FBFF FFFF
FCFF FFFF
FDFF FFFF
FEFF FFFF
9
A
B
C
D
E
Register Map
The register map for the Lab-NB is given in Table 4-2. This table gives the register name, the
register address offset from the board’s base address, the type of the register (read only, write
only, or read and write), and the size of the register in bits.
The register addresses in Table 4-2 are the offset addresses from the slot starting address. To
calculate the absolute address of the register, add the slot starting address given in Table 4-1 to
the register offset given in Table 4-2. For example, if the Lab-NB is plugged into the third slot
(corresponding to slot starting address B0 0000), the ADC FIFO memory is at address B0 0000 +
0 8010, that is, address B0 8010.
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Chapter 4
Register-Level Programming
Table 4-2. Lab-NB Register Map
Offset
Address (Hex)
Register Name
Type
Size
Analog Input Register Group
A/D Configuration Register
Status Register
A/D FIFO Register
A/D Clear Register
0 8000
0 8000
0 8010
0 8010
Write-only
Read-only
Read-only
Write-only
16-bit
8-bit
16-bit
8-bit
Analog Output Register Group
DAC Configuration Register
DAC0 Data Register
5 8000
5 8010
5 8020
5 8030
Write-only
Write-only
Write-only
Write-only
8-bit
16-bit
16-bit
16-bit
DAC1 Data Register
DAC0 and DAC1 Data Registers
8253 Counter/Timer Register Group A
Counter A0 Data Register
Counter A1 Data Register
Counter A2 Data Register
Counter A Mode Register
4 0000
4 0010
4 0020
4 0030
Read-and-write
Read-and-write
Read-and-write
Write-only
8-bit
8-bit
8-bit
8-bit
8253 Counter/Timer Register Group B
Counter B0 Data Register
Counter B1 Data Register
Counter B2 Data Register
Counter B Mode Register
4 8000
4 8010
4 8020
4 8030
Read-and-write
Read-and-write
Read- and-write
Write-only
8-bit
8-bit
8-bit
8-bit
82C55A Digital I/O Register Group
Port A Register
5 0000
5 0010
5 0020
5 0030
Read-and-write
Read-and-write
Read-and-write
Write-only
8-bit
8-bit
8-bit
8-bit
Port B Register
Port C Register
Digital Control Register
Interrupt Control Register Group
Interrupt Control Register
Interrupt Status Register
1 0000
1 0000
1 8000
Write-only
Read-only
Write-only
8-bit
8-bit
8-bit
Timer Interrupt Clear Register
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Chapter 4
Register Sizes
The Macintosh permits three different memory word sizes for memory read and write
operations–byte (8-bit), half-word (16-bit), and word (32-bit). Table 4-2 shows the word sizes of
the Lab-NB registers. For example, reading the A/D FIFO Register requires a 16-bit read
operation at the specified address.
Register Descriptions
Table 4-2 divides the Lab-NB registers into six different register groups. A bit description of
each of the registers making up these groups is included later in this chapter.
The Analog Input Register Group is used to read output from the 12-bit successive-
approximation ADC. The Analog Output Group accesses the two 12-bit DACs. The two
Counter/Timer Groups (A and B) are each made up of four registers—one group for each of the
two onboard 8253 Counter/Timer integrated circuits. The Digital I/O Register Group consists of
the four registers of the onboard 82C55A PPI integrated circuit used for digital I/O. The
Interrupt Control Register Group can be used to enable the interrupt facility on the Lab-NB
board.
Warning: During programming, note that each time a port is configured, output ports A
and C are reset to 0, and output port B is undefined.
Register Description Format
The remainder of this register description chapter discusses each of the Lab-NB registers in the
order shown in Table 4-2. Each register group is introduced, followed by a detailed bit
description of each register. The individual register description gives the address, type, word
size, and bit map of the register, followed by a description of each bit.
The register bit map shows a diagram of the register with the MSB (bit 15 for a 16-bit register,
bit 7 for an 8-bit register) shown on the left, and the LSB (bit 0) shown on the right. A square is
used to represent each bit. Each bit is labeled with a name inside its square. An asterisk (*) after
the bit name indicates that the bit is inverted (negative logic).
In many of the registers, several bits are labeled with an X, indicating don't care bits. When a
register is read, these bits may appear set or cleared but should be ignored because they have no
significance. When a register is written to, setting or clearing these bit locations has no effect on
the Lab-NB hardware.
The bit map field for some write-only registers states not applicable, no bits used. Writing to
these registers causes some event to occur on the Lab-NB, such as clearing the analog input
circuitry. The data is ignored when writing to these registers; therefore, any bit pattern will
suffice.
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Register-Level Programming
Analog Input Register Group
The four registers making up the Analog Input Register Group control the analog input circuitry
and are used for reading from the A/D FIFO. The A/D Configuration Register selects the input
channel to be read, the gain for that channel, and some information about the input data. The
Status Register reports the status of the current A/D conversion and returns any errors found.
Reading the A/D FIFO Register returns stored A/D conversion results. Writing to this register
resets the error bits in the Status Register and empties the A/D FIFO. One garbage data byte is
stored in the FIFO as a result of the clear operation, so the FIFO must be read after an A/D clear
to remove this data byte before starting a new conversion.
Bit descriptions for the registers in the Analog Input Register Group are given on the following
pages.
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Register-Level Programming
Chapter 4
A/D Configuration Register
The A/D Configuration Register indicates the input channel to be read and the gain for the
analog input circuitry.
Address:
Type:
Base address + 0 8000 (hex)
Write-only
Word Size: 16-bit
Bit Map:
15
14
13
12
11
10
9
8
X
X
X
X
X
TBSEL
EXTTRIGEN
PRETRIG
7
6
5
4
3
2
1
0
SCANEN
MA2
MA1
MA0
GAIN2
GAIN1
GAIN0
TWOSCMP
Bit
Name
Description
Don’t care bits.
15–11
10
X
TBSEL
Clock Select Bit—This bit is used to select the clock source for
A/D conversions. If this bit is cleared, an internal 1-MHz clock
drives the counter (counter A0), and the interval between samples
is the value loaded into counter A0 multiplied by 1 µsec. If this bit
is set, then the output of user-programmable counter B0 is used as
a clock source. The timebase for counter B0 is fixed at 2 MHz and
cannot be changed. The interval between acquired samples is the
value loaded into counter A0 multiplied by the period of the output
signal from counter B0.
9
EXTTRIGEN
External Trigger Enable Bit—This bit is one of two bits that
determines the effect of the EXTTRIG signal on the 50-pin I/O
connector. The function of this bit depends on the setting of the
PRETRIG bit. If PRETRIG is set, then this bit has no effect in
either setting. If PRETRIG is cleared and EXTRIGEN is set, then
a rising edge on the EXTTRIG signal starts a sequence of A/D
conversions. Unlike the EXTCONV* line, which controls
individual conversions, EXTTRIG in this case can only start a
multiple A/D conversion DAQ operation with the sample period
determined by the value in counter A0. If both EXTTRIGEN and
PRETRIG are cleared, then the EXTTRIG line on the I/O
connector has no effect.
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Bit
Name
Description (continued)
8
PRETRIG
Pretrigger Bit—This bit is used to set the pretriggering feature on
the Lab-NB. It also supersedes any setting in the EXTTRIGEN bit
described earlier. If PRETRIG is cleared, then the function of the
EXTTRIG line on the I/O connector is determined by
EXTTRIGEN. If PRETRIG is set, then the EXTTRIG line
becomes a pretrigger. In pretrigger operation, the sample counter
(counter A1) does not begin decrementing until a rising edge is
detected on EXTTRIG. When the conversion sequence terminates,
some of the acquired data has been received before the trigger
signal and some has arrived after the signal. The number of
samples after the trigger is the value loaded into the sample
counter (counter A1), but the number of samples before the trigger
depends on the arrival time of the trigger signal.
7
SCANEN
Scan Enable Bit—This bit enables or disables multichannel
scanning during data acquisition. If this bit is set, analog channels
MA<2..0> through 0 are sampled alternately. If this bit is cleared,
a single analog channel specified by MA<2..0> is sampled during
the entire DAQ operation. See Programming Multiple A/D
Conversions with Channel Scanning later in this chapter for the
correct sequence involved in setting this bit. For example, if
MA<2..0> is 011 and SCANEN is set, analog input channels 3
through 0 are sampled alternately during subsequent data
conversions. If SCANEN is then cleared (with MA<2..0> still set
to 011), only analog input channel 3 is sampled during the
subsequent data conversions.
6–4
MA<2..0>
Multiplexer Address Bit—These three bits select which of the
eight input channels are read. The analog input multiplexer
depends on these three bits to select the input channel. The input
channel is selected as follows:
MA<2..0>
Selected Channel
000
001
010
011
100
101
110
111
0
1
2
3
4
5
6
7
If SCANEN is set, analog channels MA<2..0> through 0 are
sampled alternately. If SCANEN is cleared, a single analog
channel specified by MA<2..0> is sampled during the entire DAQ
operation. See Programming Multiple A/D Conversions with
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Register-Level Programming
Chapter 4
Bit
Name
Description (continued)
Channel Scanning later in this chapter for the correct sequence
involved in setting the SCANEN bit.
3–1
GAIN<2..0>
Gain Bit—These three bits select the gain setting as follows:
GAIN<2..0>
Selected Gain
000
001
010
011
100
101
110
111
1
1.25
2
5
10
20
50
100
0
TWOSCMP
Two’s Complement Bit—This bit selects the format of the coding
of the output of the ADC. If this bit is set, the 12-bit data from the
ADC is sign-extended to 16 bits. If this bit is cleared, bits
<15..12> return 0.
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Register-Level Programming
Status Register
The Status Register indicates the status of the current A/D conversion. The bits in this register
determine if a conversion is being performed or if data is available and any errors have been
found.
Address:
Type:
Base address + 0 8000 (hex)
Read-only
Word Size: 8-bit
Bit Map:
7
X
6
X
5
X
4
3
2
1
0
GATA1
OVERRUN OVERFLOW GATA0
DAVAIL
Bit
7–5
4
Name
Description
Don’t care bits.
X
GATA1
Gate 1 Input Status Bit—This bit indicates the status of the GATE
1 input on the counter/timer chip (counter group A).
3
2
1
OVERRUN
Overrun Error Status Bit—This bit indicates if an overrun error has
occurred. If this bit is cleared, no error occurred. This bit is set if
a convert command is issued to the ADC while the last conversion
is still in progress.
OVERFLOW
GATA0
Overflow Error Status Bit—This bit indicates if an overflow error
has occurred. If this bit is cleared, no error was encountered. If
this bit is set, the A/D FIFO has overflowed because the DAQ
servicing operation could not keep up with the sampling rate.
Gate 0 Input Status Bit—This bit indicates the status of the GATE
0 input on the counter/timer chip (counter group A). This bit can
be used as a busy indicator for DAQ operations because
conversions are enabled as long as GATE 0 is high and counter A0
is programmed appropriately.
0
DAVAIL
Data Available Bit—This bit indicates whether conversion output
is available. If this bit is set, the ADC is finished with the last
conversion and the result can be read from the FIFO. This bit is
cleared if the FIFO is empty.
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Chapter 4
A/D FIFO Register
Reading the A/D FIFO Register returns the next A/D conversion value stored in the A/D FIFO.
Whenever the A/D FIFO Register is read, the value read is removed from the A/D FIFO, thereby
freeing space for another A/D conversion value to be stored. Values are stored into the A/D
FIFO Register by the ADC whenever an A/D conversion is complete. Although A/D conversion
values are in 12-bit format, they are automatically sign-extended to 16 bits in the FIFO.
The A/D FIFO is emptied when all values it contains are read. The Status Register should be
read before the A/D FIFO Register is read. If the A/D FIFO contains one or more A/D
conversion values, the DAVAIL bit is set in the Status Register, and the A/D FIFO Register can
be read to retrieve a value. If the DAVAIL bit is cleared, the A/D FIFO is empty, in which case
reading the A/D FIFO Register returns meaningless information.
The values returned by reading the A/D FIFO Register are available in two different binary
formats: straight binary or two's complement binary. The binary format used is selected by the
TWOSCMP bit in the A/D Configuration Register. The bit pattern returned for either format is
given below.
Address:
Type:
Base address + 0 8010 (hex)
Read-only
Word Size: 16-bit
Bit Map:
Straight binary mode
15
0
14
0
13
0
12
0
11
D11
10
D10
9
D9
8
D8
7
D7
6
D6
5
D5
4
D4
3
D3
2
D2
1
D1
0
D0
Bit
Name
D<15..0>
Description
15–0
Data Bit—These bits contain the straight binary result of a 12-bit
A/D conversion. Bits D<15..12> are always 0 in straight binary
mode. Values read, therefore, range from 0 to +4,095 decimal
(0000 to 0FFF hex). Straight binary mode is useful for unipolar
analog input readings because all values read reflect a positive
polarity input signal.
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Register-Level Programming
A/D FIFO Register (continued)
Bit Map:
Two’s complement binary mode
15
14
13
12
11
D11
10
D10
9
D9
8
D8
Sign Extension Bits
7
D7
6
D6
5
D5
4
D4
3
D3
2
D2
1
D1
0
D0
Bit
Name
D<15..0>
Description
15– 0
Data Bit—These bits contain the 16-bit, sign-extended two's
complement result of a 12-bit A/D conversion. Values read,
therefore, range from -2,048 to +2,047 decimal (F800 to 07FF
hex). Two’s complement mode is useful for bipolar analog input
readings because the values read reflect the polarity of the input
signal.
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Chapter 4
A/D Clear Register
The ADC can be reset by writing to this register. This operation clears the FIFO and loads the
last conversion value into the FIFO. All error bits in the Status Register are cleared as well.
Notice that the FIFO contains one data word after reset, so a FIFO read is necessary after reset to
empty the FIFO. The data that is read should be ignored.
Address:
Type:
Base address + 0 8010 (hex)
Write-only
Word Size: 8-bit
Bit Map:
Not applicable, no bits used
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Register-Level Programming
Analog Output Register Group
The four registers making up the Analog Output Register Group are used for loading the two
12-bit DACs in the two analog output channels. DAC0 controls analog output channel 0. DAC1
controls analog output channel 1. These DACs can be written to individually or simultaneously.
Bit descriptions of the registers making up the Analog Output Register Group are given on the
following pages.
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Chapter 4
DAC Configuration Register
This register determines if data written to the DACs is in straight binary or two’s complement
form. It also configures the DACs to output data automatically at a rate controlled by counter A2
OR EXTUPDATE*. This feature is particularly useful for automatic waveform generation.
Address:
Type:
Base address + 5 8000 (hex)
Write-only
Word Size: 8-bit
Bit Map:
7
X
6
X
5
X
4
X
3
2
1
0
TMRWGN1 TMRWGN TWOSDA1 TWOSDA0
0
Bit
7–4
3
Name
Description
X
Don’t care bits.
TMRWGN1
TMRWGN0
TWOSDA1
Timer Waveform Generation Enable Bit for DAC1—This bit is
used to enable timer waveform generation from DAC1. If this bit
is set, DAC1 updates its output at regular intervals as determined
by counter A2 or the EXTUPDATE* signal at the I/O connector.
If this bit is cleared, then the voltage output of DAC1 is updated as
soon as the data is loaded into its data register.
2
1
Timer Waveform Generation Enable Bit for DAC0—This bit is
used to enable timer waveform generation from DAC0. If this bit
is set, DAC0 updates its output at regular intervals as determined
by counter A2 or the EXTUPDATE* signal at the I/O connector.
If this bit is cleared, then the voltage output of DAC0 is updated as
soon as the data is loaded into its data register.
Binary Coding Scheme Select Bit for DAC1—This bit selects the
binary coding scheme used for the DAC1 data. If this bit is set, a
two's complement binary coding scheme is used for interpreting
the 12-bit data. Two’s complement is useful if a bipolar output
range is selected. If this bit is cleared, a straight binary coding
scheme is used. Straight binary is useful if a unipolar output range
is selected.
0
TWOSDA0
Binary Coding Scheme Select Bit for DAC0—This bit selects the
binary coding scheme used for the DAC0 data. If this bit is set, a
two’s complement binary coding scheme is used for interpreting
the 12-bit data. Two’s complement is useful if a bipolar output
range is selected. If this bit is cleared, a straight binary coding
scheme is used. Straight binary is useful if a unipolar output range
is selected.
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Register-Level Programming
DAC0 and DAC1 Data Registers
Writing to these registers loads the corresponding analog output channel DAC, thereby updating
the voltages generated by the analog output channels. The voltage is updated immediately,
unless the TMRWGN bit for that DAC is set. If this bit is set, then the voltages are not updated
until the next pulse from counter A2 or the next low-to-high transition on the EXTUPDATE*
line on the I/O connector. If the timer interrupt enable bit (TMRINTEN) in the Interrupt Status
Register is set, then a write to any one of these registers will service that interrupt and clear
TMRINTEN.
Address:
Base address + 5 8010 (hex) Load DAC0.
Base address + 5 8020 (hex) Load DAC1.
Base address + 5 8030 (hex) Load DAC0 and DAC1 simultaneously.
Type:
Write-only
Word Size: 16-bit
Bit Map:
15
X
14
X
13
X
12
X
11
D11
10
D10
9
D9
8
D8
7
D7
6
D6
5
D5
4
D4
3
D3
2
D2
1
D1
0
D0
Bit
Name
Description
Don’t care bits.
15–12
11–0
X
D<11..0>
Data Bit—These 12 bits are loaded into the specified DAC,
thereby updating the voltage generated by the analog output
channel (see Programming the Analog Output Circuitry later in
this chapter for a table mapping digital values to output voltage).
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Chapter 4
8253 Counter/Timer Register Groups
The eight registers making up the two Counter/Timer Register Groups access the two onboard
8253 Counter/Timers. Each 8253 has three counters. For convenience, the two Counter/Timer
Groups and their respective 8253 integrated circuits have been designated A and B. The three
counters of group A control onboard DAQ timing and waveform generation. The three counters
of group B are available for general-purpose timing functions.
Each 8253 has three independent 16-bit counters and one 8-bit Mode Register. The Mode
Register is used to set the mode of operation for each of the three counters.
Bit descriptions for the registers in the Counter/Timer Register Groups are given in the following
pages.
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Register-Level Programming
Counter A0 Data Register
The Counter A0 Data Register is used for loading and reading back contents of 8253(A)
counter 0.
Address:
Type:
Base address + 4 0000 (hex)
Read-and-write
Word Size: 8-bit
Bit Map:
7
D7
6
D6
5
D5
4
D4
3
D3
2
D2
1
D1
0
D0
Bit
Name
D<7..0>
Description
7–0
Data Bit—8-bit counter A0 contents.
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Chapter 4
Counter A1 Data Register
The Counter A1 Data Register is used for loading and reading back contents of 8253(A)
counter 1.
Address:
Type:
Base address + 4 0010 (hex)
Read-and-write
Word Size: 8-bit
Bit Map:
7
D7
6
D6
5
D5
4
D4
3
D3
2
D2
1
D1
0
D0
Bit
Name
D<7..0>
Description
7–0
Data Bit—8-bit counter A1 contents.
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Register-Level Programming
Counter A2 Data Register
The Counter A2 Data Register is used for loading and reading back contents of 8253(A)
counter A2.
Address:
Type:
Base address + 4 0020 (hex)
Read-and-write
Word Size: 8-bit
Bit Map:
7
D7
6
D6
5
D5
4
D4
3
D3
2
D2
1
D1
0
D0
Bit
Name
D<7..0>
Description
7–0
Data Bit—8-bit counter A2 contents.
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Chapter 4
Counter A Mode Register
The Counter A Mode Register determines the operation mode for each of the three counters on
the 8253(A) chip. The Counter A Mode Register selects the counter involved, its read/load
mode, its operation mode (that is, any of the 8253’s six operation modes), and the counting mode
(binary or BCD counting).
The Counter A Mode Register is an 8-bit register. Bit descriptions for each of these bits are
given in Appendix C, AMD 8253 Data Sheet.
Address:
Type:
Base address + 4 0030 (hex)
Write-only
Word Size: 8-bit
Bit Map:
7
SC1
6
SC0
5
RL1
4
RL0
3
M2
2
M1
1
M0
0
BCD
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Register-Level Programming
Counter B0 Data Register
The Counter B0 Data Register is used for loading and reading back the contents of 8253(B)
counter 0.
Address:
Type:
Base address + 4 8000 (hex)
Read-and-write
Word Size: 8-bit
Bit Map:
7
D7
6
D6
5
D5
4
D4
3
D3
2
D2
1
D1
0
D0
Bit
Name
D<7..0>
Description
7–0
Data Bit—8-bit counter B0 contents.
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Counter B1 Data Register
The Counter B1 Data Register is used for loading and reading back the contents of 8253(B)
counter 1.
Address:
Type:
Base address + 4 8010 (hex)
Read-and-write
Word Size: 8-bit
Bit Map:
7
D7
6
D6
5
D5
4
D4
3
D3
2
D2
1
D1
0
D0
Bit
Name
D<7..0>
Description
7–0
Data Bit—8-bit counter B1 contents.
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Register-Level Programming
Counter B2 Data Register
The Counter B2 Data Register is used for loading and reading back the contents of 8253(B)
counter 2.
Address:
Type:
Base address + 4 8020 (hex)
Read-and-write
Word Size: 8-bit
Bit Map:
7
D7
6
D6
5
D5
4
D4
3
D3
2
D2
1
D1
0
D0
Bit
Name
D<7..0>
Description
7–0
Data Bit—8-bit counter B2 contents.
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Counter B Mode Register
The Counter B Mode Register determines the operation mode for each of the three counters on
the 8253(B) chip. The Counter B Mode Register selects the counter involved, its read/load
mode, its operation mode (that is, any of the 8253’s six operation modes), and the counting mode
(binary or BCD counting).
The Counter Mode Register is an 8-bit register. Bit descriptions for each of these bits are given
in Appendix C, AMD 8253 Data Sheet.
Address:
Type:
Base address + 4 8030 (hex)
Write-only
Word Size: 8-bit
Bit Map:
7
SC1
6
SC0
5
RL1
4
RL0
3
M2
2
M1
1
M0
0
BCD
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Register-Level Programming
82C55A Digital I/O Register Group
Digital I/O on the Lab-NB uses an 82C55A integrated circuit. The 82C55A is a general-purpose
PPI containing 24 programmable I/O pins. These pins represent the three 8-bit I/O ports (A, B,
and C) of the 82C55A. These ports can be programmed as two groups of 12 signals or as three
individual 8-bit ports.
The Digital I/O Register Group contains the following four registers: Port A Register, Port B
Register, Port C Register, and Digital Control Register. Bit descriptions for the registers in the
Digital I/O Register Group are given on the following pages.
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Port A Register
Reading the Port A Register returns the logic state of the eight digital I/O lines constituting
port A, that is, PA<0..7>. If port A is configured for output, the Port A Register can be written
to in order to control the eight digital I/O lines constituting port A. See Programming the Digital
I/O Circuitry later in this chapter for information on how to configure port A for input or output.
Address:
Type:
Slot starting address + 5 0000 (hex)
Read-and-write
Word Size: 8-bit
Bit Map:
7
D7
6
D6
5
D5
4
D4
3
D3
2
D2
1
D1
0
D0
Bit
Name
D<7..0>
Description
7–0
Data Bit—8-bit port A data.
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Register-Level Programming
Port B Register
Reading the Port B Register returns the logic state of the eight digital I/O lines constituting port
B, that is, PB<0..7>. If port B is configured for output, the Port B Register can be written to in
order to control the eight digital I/O lines constituting port B. See Programming the Digital I/O
Circuitry later in this chapter for information on how to configure port B for input or output.
Address:
Type:
Slot starting address + 5 0010 (hex)
Read-and-write
Word Size: 8-bit
Bit Map:
7
D7
6
D6
5
D5
4
D4
3
D3
2
D2
1
D1
0
D0
Bit
Name
D<7..0>
Description
7–0
Data Bit—8-bit port B data.
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Port C Register
Port C is special in the sense that it can be used as an 8-bit I/O port like port A and port B if
neither port A nor port B is used in handshaking (latched) mode. If either port A or port B is
configured for latched I/O, some of the bits in port C are used for handshaking signals. See
Programming the Digital I/O Circuitry later in this chapter for a description of the individual bits
in the Port C Register.
Address:
Type:
Slot starting address + 5 0020 (hex)
Read-and-write
Word Size: 8-bit
Bit Map:
7
D7
6
D6
5
D5
4
D4
3
D3
2
D2
1
D1
0
D0
Bit
Name
D<7..0>
Description
7–0
Data Bit—8-bit port C data.
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Register-Level Programming
Digital Control Register
The Digital Control Register can be used to configure port A, port B, and port C as inputs or
outputs as well as selecting simple mode (basic I/O) or handshaking mode (strobed I/O) for
transfers. See Programming the Digital I/O Circuitry later in this chapter for a description of the
individual bits in the Digital Control Register.
Address:
Type:
Slot starting address + 5 0030 (hex)
Read-and-write
Word Size: 8-bit
Bit Map:
7
CW7
6
CW6
5
CW5
4
CW4
3
CW3
2
CW2
1
CW1
0
CW0
Bit
7–0
Name
CW<7..0>
Description
Control Word Bit—8-bit control word.
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Chapter 4
Interrupt Control Register Group
This group is made up of two registers. Writing to the Interrupt Control Register enables the
interrupt facility on the Lab-NB. The Interrupt Status Register contains information about the
Interrupt Control Register and the interrupt line.
Bit descriptions of the registers making up the Interrupt Control Group are given on the
following pages.
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Interrupt Control Register
Setting bits of this register causes an interrupt to occur when the current process is complete.
Address:
Type:
Base address + 1 0000 (hex)
Write-only
Word Size: 8-bit
Bit Map:
7
X
6
X
5
X
4
X
3
2
1
0
PAINTEN
PBINTEN TMRINTEN ADCINTEN
Bit
7–4
3
Name
Description
Don’t care bits.
X
PAINTEN
PBINTEN
TMRINTEN
Port A Interrupt Enable Bit—This bit enables or disables
generation of an interrupt via PC3. If port A on the Lab-NB is
operated in latched mode, PC3 becomes INTRA, that is, Interrupt
Request for port A. If this bit is set and port A is configured as an
input port in latched mode, an interrupt is generated whenever new
data has been strobed in and is ready to be read from port A. If
this bit is set and port A is configured as an output port in latched
mode, an interrupt is generated whenever new data can be written
to port A; that is, the receiving device has acknowledged the
previous data by driving ACKA* (acknowledge input for port A)
low. If this bit is cleared, interrupts from PC3 are disabled. See
Appendix D, OKI 82C55A Data Sheet, for timing details.
2
Port B Interrupt Enable Bit—This bit enables or disables
generation of an interrupt via PC0. If port B on the Lab-NB is
operated in latched mode, PC0 becomes INTRB, that is, Interrupt
Request for port B. If this bit is set and port B is configured as an
input port in latched mode, an interrupt is generated whenever new
data has been strobed in and is ready to be read from port B. If this
bit is set and port B is configured as an output port in latched
mode, an interrupt is generated whenever new data can be written
to port B; that is, the receiving device has acknowledged the
previous data by driving ACKB* (acknowledge input for port B)
low. If this bit is cleared, interrupts from PC0 are disabled. See
Appendix D, OKI 82C55A Data Sheet, for timing details.
1
Timer Interrupt Enable Bit—This bit enables interrupts to be
caused by the counter A2 output and the EXTUPDATE* signal. If
this bit is set, an interrupt occurs when either EXTUPDATE* or
counter A2 output makes a low-to-high transition. The interrupt is
cleared by writing either to any of the DAC output registers or to
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Bit
Name
Description (continued)
the Timer Interrupt Clear Register. This interrupt allows waveform
generation on the analog output because the same signal that sets
the interrupt also updates the DAC output if the corresponding
TMRWG bit in the DAC Configuration Register is set. If this bit
is cleared, interrupts from EXTUPDATE* and counter A2 output
are ignored.
0
ADCINTEN
A/D Conversion Interrupt Enable Bit—This bit enables or disables
generation of an interrupt at the end of an A/D conversion using
the 12-bit ADC. A DAQ operation is a multiple A/D conversion
sequence that is timed and controlled by the Lab-NB onboard
counter/timers. Whether the operation is a single or multiple
conversion, if this bit is set, an interrupt is generated whenever the
A/D FIFO contains conversion data, that is, when the A/D FIFO is
not empty. If this bit is cleared, interrupts from the A/D FIFO are
disabled.
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Register-Level Programming
Interrupt Status Register
The Interrupt Status Register indicates the status of the Interrupt Control Register bits and the
interrupt lines.
Address:
Type:
Base address + 1 0000 (hex)
Read-only
Word Size: 8-bit
Bit Map:
7
X
6
X
5
INT
4
3
2
1
0
TIMERUP *PAINTEN *PBINTEN *TMRINTEN *ADCINTEN
Bit
7, 6
5
Name
X
Description
Don’t care bits.
INT
Interrupt Bit—This bit shows the overall state of interrupts
generated by the Lab-NB board. If this bit is set, the Lab-NB is
asserting an interrupt that has not yet been serviced. If this bit is
cleared, no interrupt is pending. This bit is normally cleared. As
explained in the description of the Interrupt Control Register
earlier in this chapter, there are four possible sources for an
interrupt.
4
TIMERUP
TMRINTEN Interrupt Status Bit—This bit indicates the status of
the TMRINTEN interrupt. If this bit is set and TMRINTEN has
been set, the current interrupt is due to a rising edge on
EXTUPDATE* or counter A2's output. TIMERUP is cleared by
writing to the Timer Interrupt Clear Register or writing to either
DAC0 or DAC1. TIMERUP is set whenever a rising edge on
counter A2’s output or EXTUPDATE* is detected. TIMERUP
generates an interrupt request if it is set and the TMRINTEN bit is
set in the Interrupt Control Register.
3
2
1
0
*PAINTEN
*PBINTEN
*TMRINTEN
*ADCINTEN
Port A Interrupt Enable—This bit indicates the status of the
PAINTEN bit in the Interrupt Control Register. Notice that the
polarity is reversed in the Interrupt Status Register.
Port B Interrupt Enable—This bit indicates the status of the
PBINTEN bit in the Interrupt Control Register. Notice that the
polarity is reversed in the Interrupt Status Register.
Active Low TMRINTEN Interrupt Status Bit—This bit indicates
the status of the TMRINTEN bit in the Interrupt Control Register.
Notice that the polarity is reversed in the Interrupt Status Register.
ADCINTEN Status Bit—This bit indicates the status of the
ADCINTEN bit in the Interrupt Control Register. Notice that the
polarity is reversed in the Interrupt Status Register.
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Timer Interrupt Clear Register
Writing to the Timer Interrupt Clear Register clears the TIMERUP bit in the Interrupt Status
Register. The Timer Interrupt Clear Register can be used to service any timer-related or
EXTUPDATE*-caused interrupts generated by the Lab-NB. This register provides an alternate
means of clearing timer-generated interrupts besides writing to one or both of the DACs.
Address:
Type:
Base address + 1 8000 (hex)
Read-only
Word Size: 8-bit
Bit Map:
Not applicable, no bits used
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Register-Level Programming
Configuration EPROM
The Configuration EPROM is an onboard read-only memory that contains information required
by the Macintosh operating system. The Macintosh system Slot Manager reads the
Configuration EPROM upon system startup.
The Configuration EPROM is mapped to address offset locations F 8000 through F FFFC. The
EPROM is 8 bits (1 byte) wide and 8 kilobytes in length. Each byte of the EPROM is mapped to
every fourth address location on the Lab-NB board as follows: the first byte is read from slot
address + F 8000; the second byte is read from slot address + F 8004; the third byte is read from
slot address + F 8008, and so on.
Programming Considerations
The following paragraphs contain programming instructions for operating the circuitry on the
Lab-NB board. Programming the Lab-NB involves writing to and reading from the various
registers on the board. The programming instructions included here list the sequence of steps to
take. The instructions are language independent; that is, they tell you to write a value to a given
register, to set or clear a bit in a given register, or to detect whether a given bit is set or cleared
without presenting the actual code.
Register Programming Considerations
Registers in the Macintosh are memory mapped; that is, writing to a register involves storing a
value in a memory location. A register is read by reading this memory location. Only memory
location reads and writes can be performed on the Lab-NB registers. Mathematical or logical
operations cannot be directly applied to the Lab-NB registers. Attempting to do so results in
unpredictable program behavior.
Several write-only registers on the Lab-NB contain bits that control several independent pieces
of the onboard circuitry. In the set or clear instructions provided, specific register bits should be
set or cleared without changing the current state of the remaining bits in the register. However,
writing to these registers affects all register bits simultaneously. You cannot read these registers
to determine which bits have been set or cleared in the past; therefore, you should maintain a
software copy of the write-only registers. This software copy can then be read to determine the
status of the write-only registers. To change the state of a single bit without disturbing the
remaining bits, set or clear the bit in the software copy and then write the software copy to the
register.
Initializing the Lab-NB Board
The Lab-NB hardware must be initialized for the Lab-NB circuitry to operate properly. To
initialize the Lab-NB hardware, complete these steps:
1. Write 38 (hex) to the Counter A Mode Register (8-bit write).
2. Write 78 (hex) to Counter A Mode Register (8-bit write).
3. Write 00 (hex) to the Interrupt Control Register (8-bit write).
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4. Write 0000 (hex) to the A/D Configuration Register (16-bit write).
5. Write 00 (hex) to the A/D Clear Register (8-bit write).
6. Read the data from the A/D FIFO Register (16-bit read). Ignore the data.
7. Write 0000 (hex) to the DAC0 Data Register if DAC0 is configured for unipolar output.
Write 0800 (hex) to the DAC0 Data Register if DAC0 is configured for bipolar output.
8. Write 0000 (hex) to the DAC1 Data Register if DAC1 is configured for unipolar output.
Write 0800 (hex) to the DAC1 Data Register if DAC1 is configured for bipolar output.
This sequence leaves the Lab-NB circuitry in the following state:
•
•
•
•
•
•
•
•
Counter A0 output is high. Low-going pulses on counter 0 initiate conversions.
Counter A1 output is high. This disables EXTCONV*.
All interrupts are disabled.
EXTTRIG is disabled.
The timebase for counter A0 is the onboard 1-MHz source.
Analog input circuitry is initialized to a gain of 1 and channel 0 selected.
The A/D FIFO is cleared.
The D/A Configuration Register is initialized to 00 (hex) on power up. Thus, straight binary
coding is selected for both DACs.
•
The analog output circuitry is initialized to 0.0 V on both channels.
For additional details concerning the 8253 Counter/Timer, see Appendix C, AMD 8253 Data
Sheet. For information about the 82C55A PPI, see Appendix D, OKI 82C55A Data Sheet.
Programming the Analog Input Circuitry
This section describes the analog input circuitry programming sequence, how to program the
binary mode of the A/D conversion result, and how to clear the analog input circuitry.
Analog Input Circuitry Programming Sequence
Programming the analog input circuitry for a single A/D conversion involves the following
sequence of steps:
1. Select analog input channel and gain.
2. Initiate an A/D conversion.
3. Read the A/D conversion result.
Each of these steps is discussed in detail as follows.
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1. Select analog input channel and gain.
The analog input channel and gain are selected by writing to the A/D Configuration Register.
See the A/D Configuration Register bit description earlier in this chapter for gain and analog
input channel bit patterns. Set up the bits as given in the A/D Configuration Register bit
description, and write to the A/D Configuration Register.
The A/D Configuration Register needs to be written to only when the analog input channel, gain
setting, input mode (unipolar/bipolar), scanning mode, or interrupt enable bits need to be
changed.
2. Initiate an A/D conversion.
An A/D conversion can be initiated by a high-to-low transition on the counter A0 output
(OUTA0). Alternatively, a conversion can be performed by forcing a high-to-low transition on
EXTCONV*. To perform a single conversion with the onboard counters, use the following
programming sequence. All values are given in hexadecimal.
1. Write 38 to the Counter A Mode Register (8-bit write). This causes OUTA0 to be set high.
2. Write 30 to the Counter A Mode Register (8-bit write). This causes OUTA0 to be set low.
3. Write 38 to the Counter A0 Data Register (8-bit write). This causes OUTA0 to be set high.
Once an A/D conversion is initiated, the ADC stores the result in the A/D FIFO at the end of its
conversion cycle or after a rising edge on OUTA0, whichever occurs later. In case of
EXTCONV* initiating the conversion, OUTA0 and OUTA1 must both be set high.
3. Read the A/D conversion result.
A/D conversion results are obtained by reading the A/D FIFO Register. Before you read the A/D
FIFO, however, you must read the Status Register to determine whether the A/D FIFO contains
any results.
To read the A/D conversion results, complete these steps:
1. Read the A/D Status Register (8-bit read).
2. If the DAVAIL bit is set (bit 0), then read the A/D FIFO Register to obtain the result.
Reading the A/D FIFO Register removes the A/D conversion result from the A/D FIFO. The
binary modes of the A/D FIFO output are explained later.
The DAVAIL bit indicates whether one or more A/D conversion results are stored in the A/D
FIFO. If the DAVAIL bit is cleared, the A/D FIFO is empty and reading the A/D FIFO Register
returns meaningless data. Once an A/D conversion is initiated, the DAVAIL bit should be set
after 12 µsec or after a rising edge on OUTA0, whichever occurs later. If EXTCONV* is being
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used for A/D timing, the DAVAIL bit should be set after 12 msec or after a rising edge in
EXTCONV*, whichever occurs later.
An A/D FIFO overflow condition occurs if more than 16 conversions are initiated and stored in
the A/D FIFO before the A/D FIFO Register is read. If this condition occurs, the OVERFLOW
bit is set in the Status Register to indicate that one or more A/D conversion results have been lost
because of FIFO overflow. Writing to the A/D Clear Register resets this error flag. A dummy
read must be performed on the FIFO after an A/D Clear to reset the FIFO.
A/D FIFO Output Binary Modes
The A/D conversion result can be returned from the A/D FIFO as a 16-bit two's complement or
straight binary value by setting or clearing the TWOSCMP bit in the A/D Configuration
Register. If the analog input circuitry is configured for the input range 0 to +10 V, straight
binary mode should be used (clear the TWOSCMP bit). Straight binary mode returns numbers
between 0 and +4,095 (decimal) when the A/D FIFO Register is read. If the analog input
circuitry is configured for the input range -5 to +5 V, two’s complement mode is more
appropriate (set the TWOSCMP bit). Two's complement mode returns numbers between -2,048
and +2,047 (decimal) when the A/D FIFO Register is read.
Table 4-3 shows input voltage versus A/D conversion values for the 0 to +10 V input range.
Table 4-4 shows input voltage versus A/D conversion values for two's complement mode and
-5 to +5 V input range.
Table 4-3. Unipolar Input Mode A/D Conversion Values (Straight Binary Coding)
Input Voltage
(Gain = 1)
A/D Conversion Result
Range: 0 to +10 V
(Decimal)
(Hex)
0
2.5
5.0
7.5
9.9976
0 0000
1,024
2,048
3,072
4,095
0400
0800
0C00
0FFF
Table 4-4. Bipolar Input Mode A/D Conversion Values (Two’s Complement Coding)
Input Voltage
(Gain = 1)
A/D Conversion Result
Range: -5 to +5 V
(Decimal)
(Hex)
-5.0
-2.5
0
2.5
4.9976
-2,048
-1,024
0 0000
1,024
F800
FC00
0400
07FF
2,047
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Register-Level Programming
Clearing the Analog Input Circuitry
The analog input circuitry can be cleared by writing to the A/D Clear Register, which leaves the
analog input circuitry in the following state:
•
•
•
Analog input error flags OVERFLOW and OVERRUN are cleared.
Pending interrupt requests are cleared.
A/D FIFO has one garbage word of data.
Empty the A/D FIFO before starting any A/D conversions by performing a read on the A/D
FIFO Register and ignoring the data read. This operation guarantees that the A/D conversion
results read from the A/D FIFO are the results from the initiated conversions rather than leftover
results from previous conversions.
To clear the analog input circuitry and the A/D FIFO, complete these steps:
•
•
Write 0 to the A/D Clear Register (8-bit write).
Read the A/D FIFO Register and ignore the data (16-bit read).
Programming Multiple A/D Conversions on a Single Input Channel
A sequence of timed A/D conversions is referred to in this manual as a DAQ operation. Two
types of DAQ operations are available on the Lab-NB:
•
•
Controlled acquisition mode
Freerun acquisition mode
In controlled acquisition mode, two counters (counters A0 and A1) are required for a DAQ
operation. Counter A0 is used as a sample-interval counter, while counter A1 is used as a
sample counter. In this mode, a specified number of conversions is performed, after which the
hardware shuts off the conversions. Counter A0 generates the conversion pulses, and counter A1
gates off counter A0 after the programmed count has expired. The number of conversions in a
single DAQ operation in this case is limited to a 16-bit count (or 65,535).
In freerun acquisition mode, only one counter is required for a DAQ operation. Counter A0
continuously generates the conversion pulses as long as GATEA0 is held at a high logic level.
The software keeps track of the number of conversions that has occurred and turns off counter
A0 after the required number of conversions has been obtained. The number of conversions in a
single DAQ operation in this case is unlimited. Counter A0 is clocked by a 1-MHz clock on start
up.
Alternatively, a programmable timebase for counter A0 is available through the use of counter
B0. If the TBSEL bit in the ADC Configuration Register is set, then the timebase for counter A0
is counter B0. Counter B0 has a fixed, unalterable 2-MHz clock as its own timebase, so its
period is the value stored in it multiplied by 500 nsec. The minimum period that can be selected
for counter B0 is 1 µsec. The period of counter A0, or the sample period, is then equal to the
period of counter B0 multiplied by the value stored in counter A0. Regardless of the timebase
chosen, the minimum sample period of 16 µsec must be observed for data integrity.
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Programming in Controlled Acquisition Mode
The following programming steps are required for a DAQ operation in controlled acquisition
mode:
1. Select analog input channel, gain, and timebase source for counter A0.
2. Program counter B0 (if necessary).
3. Program counters A0 and A1.
4. Clear the A/D circuitry.
5. Program the sample-interval counter (counter A0).
6. Service the DAQ operation.
Each of these programming steps is explained below.
1. Select analog input channel, gain, and timebase source for counter A0.
The analog input channel and gain are selected by writing to the A/D Configuration Register.
The SCANEN bit must be cleared for DAQ operations on a single channel. See the A/D
Configuration Register bit description earlier in this chapter for gain and analog input channel bit
patterns. If counter B0 is being used as a timebase for counter A0, then the TBSEL bit in the
ADC Configuration Register should be set at this time.
The A/D Configuration Register needs to be written to only when the analog input channel, gain
setting, or other function needs to be changed.
2. Program counter B0 (if necessary).
The following sequence should be used to program counter B0 if it is being used. If counter B0
is not being used, skip to step 3. All writes are 8-bit write operations. All values given are
hexadecimal.
a. Write 36 to the Counter B Mode Register (select mode 3).
b. Write the least significant byte of the timebase count to the Counter B Data Register.
c. Write the most significant byte of the timebase count to the Counter B Data Register. For
example, programming a timebase of 10 µsec requires a timebase count of
10 µsec
= 20 µsec
0.5 µsec
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3. Program counters A0 and A1.
This step involves programming counter A0 to generate periodic conversion pulses and
programming counter A1 to interrupt on terminal count mode (mode 0).
Counter A0 of the 8253(A) Counter/Timer is used as the sample-interval counter. A high-to-low
transition on the counter A0 output initiates a conversion. Counter A0 can be programmed to
generate a pulse once every N µsec. N is referred to as the sample interval, that is, the time
between successive A/D conversions. N can be between 2 and 65,535. The sample interval is
equal to the period of the timebase clock used by counter A0 multiplied by N. Two timebases
are available: a 1-MHz clock and the output of counter B0.
Counter A1 of the 8253(A) Counter/Timer is used as a sample counter. The sample counter
tallies the number of A/D conversions initiated by counter A0 and stops counter A0 when the
desired sample count is reached. The sample count must be less than or equal to 65,535. The
minimum sample count is 2.
Write 34 (hex) to the Counter A Mode Register (select counter A0, mode 2) to force OUT0 to a
high state prior to clearing the A/D FIFO. This is an 8-bit write operation.
Use the following sequence to program the sample counter:
a. Write 70 to the Counter A Mode Register (select counter A1, mode 0).
b. Write the least significant byte of M-1, where M is the sample count, to the counter A1 Data
Register.
c. Write the most significant byte of M-1, where M is the sample count, to the counter A1 Data
Register.
After you complete this programming sequence, counter A1 is configured to count A/D
conversion pulses and counter A0 output is in a high state.
4. Clear the A/D circuitry.
Before the DAQ operation is started, the A/D FIFO must be emptied in order to clear out any old
A/D conversion results. Empty the A/D FIFO after the counters are programmed because
programming the counters can cause spurious edges. Write 0 to the A/D Clear Register to empty
the FIFO (8-bit write), followed by a read from the A/D FIFO (16-bit read). Ignore the data
obtained in the read.
5. Program the sample-interval counter (counter A0).
This step involves programming counter A0 (the sample-interval counter) in rate generator mode
(mode 2).
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Use the following programming sequence to program the sample-interval counter. All writes are
8-bit write operations. All values given are hexadecimal.
a. Write 34 to the Counter A Mode Register (select counter A0, mode 2).
b. Write the least significant byte of the sample interval to the Counter A0 Data Register.
c. Write the most significant byte of the sample interval to the Counter A0 Data Register.
6. Service the DAQ operation.
Once the DAQ operation is started by writing the most significant byte of the sample interval to
the Counter A0 Data Register, the operation must be serviced by reading the A/D FIFO Register
every time an A/D conversion result becomes available. To do this, perform the following
sequence until the desired number of conversion results has been read:
a. Read the Status Register (8-bit read).
b. If the DAVAIL bit is set (bit 0), then read the A/D FIFO Register to obtain the result.
Interrupts can also be used to service the DAQ operation. This topic is discussed later in this
chapter.
Two error conditions may occur during a DAQ operation: an overflow error or an overrun error.
These error conditions are reported through the Status Register and should be checked every time
the Status Register is read to check the DAVAIL bit.
An overflow condition occurs if more than 16 A/D conversions have been stored in the A/D
FIFO without the A/D FIFO being read; that is, the A/D FIFO is full and cannot accept any more
data. This condition occurs if the software loop reading the A/D FIFO Register is not fast
enough to keep up with the A/D conversion rate. When an overflow occurs, at least one A/D
conversion result is lost. An overflow condition has occurred if the OVERFLOW bit in the
Status Register is cleared.
An overrun condition occurs if a second A/D conversion is initiated before the previous
conversion is finished. This condition may result in one or more missing A/D conversions. This
condition occurs if the sample interval is too small (sample rate is too high). An overrun
condition has occurred if the OVERRUN bit in the Status Register is low. The minimum
recommended sampling interval on the Lab-NB is 16 µsec.
Both the OVERFLOW and OVERRUN bits in the Status Register are reset by writing to the A/D
Clear Register.
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Programming in Freerun Acquisition Mode
Freerun acquisition mode uses only counter A0 as the sample-interval counter. The number of
A/D conversions that have occurred (that is, the sample count) is maintained by software in this
case. With this arrangement, DAQ operations can acquire more than 65,535 samples.
The following programming steps are required for a DAQ operation in freerun acquisition mode:
1. Select analog input channel, gain, and timebase for counter A0.
2. Program counter B0 (if necessary).
3. Program counter A0 to force OUT0 high.
4. Clear the A/D circuitry.
5. Program counter A1 to force OUT1 low.
6. Program the sample-interval counter (counter A0).
7. Service the DAQ operation.
Each of these programming steps is explained below.
1. Select analog input channel, gain, and timebase for counter A0.
The analog input channel and gain are selected by writing to the A/D Configuration Register.
The SCANEN bit must be cleared for DAQ operations on a single channel. See the A/D
Configuration Register bit description earlier in this chapter for gain and analog input channel bit
patterns. If counter B0 is being used as a timebase for counter A0, then the TBSEL bit in the
ADC Configuration Register should be set at this time.
The A/D Configuration Register needs to be written to only when the analog input channel, gain
setting, or other function needs to be changed.
2. Program counter B0 (if necessary).
The following sequence should be used to program counter B0 if it is being used. If counter B0
is not being used, skip to step 3. All writes are 8-bit write operations. All values given are
hexadecimal.
a. Write 36 to the Counter B Mode Register (select mode 3).
b. Write the least significant byte of the timebase count to the Counter B Data Register.
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c. Write the most significant byte of the timebase count to the Counter B Data Register. For
example, programming a timebase of 10 µsec requires a timebase count of
10 µsec
= 20 µsec
0.5 µsec
3. Program counter A0 to force OUT0 high.
Counter A0 of the 8253(A) Counter/Timer is used as the sample-interval counter. A high-to-low
transition on OUT0 (counter A0 output) initiates a conversion. Counter A0 can be programmed
to generate a pulse once every N µsec. N is referred to as the sample interval, that is, the time
between successive A/D conversions. N can be between 2 and 65,535. The sample interval is
equal to the period of the timebase clock used by counter A0 multiplied by N. A 1-MHz clock is
internally connected to CLK0 (the clock used by counter A0).
Write 34 (hex) to the Counter A Mode Register (select counter A0, mode 2) to force OUT0 to a
high state prior to clearing the A/D FIFO. This is an 8-bit write operation.
4. Clear the A/D circuitry.
Before you start the DAQ operation, the A/D FIFO must be emptied in order to clear out any old
A/D conversion results. Empty the A/D FIFO after the counters are programmed because
programming the counters can cause spurious edges. Write 0 to the A/D Clear Register to empty
the FIFO (8-bit write), followed by a read from the A/D FIFO (8-bit read). Ignore the data
obtained in the read.
5. Program counter A1 to force OUT1 low.
Counter A1 must be programmed so that OUT1 is at logic low state.
a. Write 70 (hex) to the Counter A Mode Register. This forces OUT1 low.
6. Program the sample-interval counter (counter A0).
Use the following programming sequence to program counter A0, the sample-interval counter.
All writes are 8-bit write operations. All values given are hexadecimal.
a. Write 34 to the Counter A Mode Register (select counter A0, mode 2).
b. Write the least significant byte of the sample interval to the Counter A0 Data Register.
c. Write the most significant byte of the sample interval to the Counter A0 Data Register.
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7. Service the DAQ operation.
Once the DAQ operation is started by writing the most significant byte of the sample interval to
the Counter A0 Data Register, the operation must be serviced by reading the A/D FIFO Register
every time an A/D conversion result becomes available. To do this, perform the following
sequence until the desired number of conversion results has been read:
a. Read the Status Register (8-bit read).
b. If the DAVAIL bit is set (bit 0), then read the A/D FIFO Register to obtain the result.
Interrupts can also be used to service the DAQ operation. This topic is discussed later in this
chapter.
Two error conditions may occur during a DAQ operation: an overflow error or an overrun error.
These error conditions are reported through the Status Register and should be checked every time
the Status Register is read to check the DAVAIL bit.
An overflow condition occurs if more than 16 A/D conversions have been stored in the A/D
FIFO without the A/D FIFO being read; that is, the A/D FIFO is full and cannot accept any more
data. This condition occurs if the software loop reading the A/D FIFO Register is not fast
enough to keep up with the A/D conversion rate. When an overflow occurs, at least one A/D
conversion result is lost. An overflow condition has occurred if the OVERFLOW bit in the
Status Register is set.
An overrun condition occurs if a second A/D conversion is initiated before the previous
conversion is finished. This condition may result in one or more missing A/D conversions. This
condition occurs if the sample interval is too small (sample rate is too high). An overrun
condition has occurred if the OVERRUN bit in the Status Register is set. The minimum
recommended sampling interval on the Lab-NB is 16 µsec.
Both the OVERFLOW and OVERRUN bits in the Status Register are cleared by writing to the
A/D Clear Register.
External Timing Considerations for Multiple A/D Conversions
Two external timing signals, EXTTRIG and EXTCONV*, can be used for multiple A/D
conversions. EXTTRIG can be used to initiate a conversion sequence (posttrigger mode) or to
terminate an ongoing conversion sequence (pretrigger mode), and the EXTCONV* signal can be
used to time the individual A/D conversions from an external timing source. Chapter 2,
Configuration and Installation, contains the EXTTRIG and EXTCONV* signal specifications.
The posttrigger and pretrigger modes are described later in this chapter.
Using the EXTTRIG Signal to Initiate a Multiple A/D Conversion DAQ Operation
(Posttrigger Mode)
If the PRETRIG bit is cleared and the EXTTRIGEN bit is set in the ADC Command Register,
EXTTRIG functions as a start trigger for a multiple A/D conversion DAQ operation. In this
mode, referred to as posttriggering, the sample-interval counter is gated off until a low-to-high
edge is sensed on EXTTRIG. No samples are collected until EXTTRIG makes its low-to-high
transition. Transitions on the EXTCONV* line are also ignored until a low-to-high edge is
sensed on the EXTRIG followed by a low-to-high edge on EXTCONV* input.
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Using the EXTTRIG Signal to Terminate a Multiple A/D Conversion DAQ Operation
(Pretrigger Mode)
If the PRETRIG bit is set in the ADC Command Register, EXTTRIG functions as a stop trigger
for a multiple A/D conversion DAQ operation. In this mode, referred to as pretriggering, the
sample counter is gated off until a low-to-high edge is sensed on EXTTRIG. Pretriggering is
performed in a manner similar to external triggering. With pretriggering, counter A0 (the
sample-interval counter) starts as soon as the last byte is loaded. However, counter A1, the
sample counter, does not start counting until the first rising edge on EXTTRIG. In this way, data
is collected before the actual trigger rising edge. After the rising edge occurs, the number of
points specified in counter A1 are collected and the acquisition stops. You must allocate
sufficient array space for all of the data, and specify both the number of points and the
indeterminate number of points that may be collected before the pretrigger signal arrives.
Alternatively, a circular buffer can be set up by the acquisition software so that data is repeatedly
loaded into the same section of memory. Although this method does not require an
indeterminate amount of memory, you can examine only samples acquired during a limited time
period before and after the trigger occurs. Pretriggering is set up by setting PRETRIG in the
ADC Configuration Register. PRETRIG supersedes EXTTRIGEN; if both bits are set, then
pretriggering is enabled.
Using the EXTCONV* Signal to Initiate A/D Conversions
As mentioned earlier, A/D conversions can be initiated by a falling edge on either OUTA0 or
EXTCONV*. Setting the GATA0 bit low disables conversions from both OUTA0 and
EXTCONV*. Setting the GATA0 bit high enables conversions from both OUTA0 and
EXTCONV*. The GATA0 bit is set low whenever OUTA1 is high. If OUTA1 is low, GATA0
can be set high at any time by either setting the PRETRIG bit or initiating a rising edge on
EXTRIG if the EXTRIGEN bit in the ADC Command Register is set.
Programming Multiple A/D Conversions Using External Timing
A DAQ operation using the external timing signals EXTCONV* or EXTTRIG can be in either
controlled acquisition mode or freerun acquisition mode. In controlled acquisition mode, counter
A1 shuts off A/D conversions after the programmed count expires. In freerun acquisition mode,
A/D conversions are disabled under software control.
Programming in Controlled Acquisition Mode
Posttrigger Mode
The following programming steps are required for a DAQ operation in controlled acquisition
mode using EXTCONV*. In the following programming sequence, EXTTRIG is used as a
posttrigger signal; that is, data acquisition is not started until a rising edge is detected on the
EXTTRIG input.
1. Disable EXTCONV* and EXTTRIG input.
2. Select analog input channel and gain and select posttrigger mode.
3. Program counter A0.
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4. Clear the A/D circuitry.
5. Program counter A1 and enable EXTCONV* and EXTTRIG input.
6. Service the DAQ operation.
Each of these programming steps is explained as follows.
1. Disable EXTCONV* and EXTTRIG input.
The EXTCONV* bit can be disabled by setting the GATA0 bit low. The GATA0 bit is low
whenever OUTA1 is high, regardless of the settings for the PRETRIG or EXTTRIGEN bits in
the ADC Configuration Register or the EXTTRIG signal. Writing 78 (hex) to the Counter A
Mode Register sets OUTA1 high. This write disables EXTCONV* and EXTTRIG input; that is,
any transitions on these two inputs are ignored.
2. Select analog input channel and gain and select posttrigger mode.
The analog input channel and gain are selected by writing to the A/D Configuration Register.
The SCANEN bit must be cleared for DAQ operations on a single channel. See the A/D
Configuration Register bit description earlier in this chapter for gain and analog input channel bit
descriptions. The PRETRIG bit must be cleared and the EXTRIGEN bit must be set high during
this write to the A/D Configuration Register. These settings select posttrigger mode.
3. Program counter A0.
Since a high-to-low transition on the counter A0 output initiates an A/D conversion, counter A0
output must be programmed to a high state. This ensures that counter A0 does not cause any
A/D conversions.
Write 34 (hex) to the Counter A Mode Register (select counter A0, mode 2) to force OUTA0 to a
high state. This is an 8-bit operation.
4. Clear the A/D circuitry.
Before the DAQ operation is started, the A/D FIFO must be emptied in order to clear any old
A/D conversion results. Empty the A/D FIFO after the counters are programmed because
programming the counters can cause spurious edges. Write 0 to the A/D Clear Register to empty
the FIFO (8-bit write) and read from the A/D FIFO (16-bit read). Ignore the data obtained while
reading the A/D Clear Register.
5. Program counter A1 and enable EXTCONV* and EXTTRIG input.
Counter A1 of the 8253(A) Counter/Timer is used as a sample counter. The sample counter
counts the number of A/D conversions and disables conversions when the programmed count is
reached. The sample count must be less than or equal to 65,535. The minimum sample count is
2. EXTTRIG is enabled as soon as counter A1 is programmed.
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To program the counters, use the following programming sequence:
a. Write 70 (hex) to the Counter A Mode Register (select counter A1, mode 0). This step sets
the output of counter A1 (OUTA1) low, which in turn enables EXTTRIG; that is, the first
rising edge on EXTTRIG after OUTA1 goes low starts the DAQ sequence.
b. Write the least significant byte of (M-1), where M is the sample count, to the Counter A1
Data Register.
c. Write the most significant byte of (M-1), where M is the sample count, to the Counter A1
Data Register.
After completing this programming sequence, counter A1 is configured to count A/D conversion
pulses and EXTTRIG input is enabled.
6. Service the DAQ operation.
Once the DAQ operation is started by a rising edge on the EXTTRIG input, A/D conversions are
initiated by falling edges on the EXTCONV* input. The operation must be serviced by reading
the A/D FIFO Register every time an A/D conversion result becomes available. To service the
DAQ, perform the following sequence until the desired number of conversion results has been
read:
a. Read the Status Register (8-bit read).
b. If the DAVAIL bit is set (bit 0), read the A/D FIFO Register to obtain the result.
Interrupts can also be used to service the DAQ operation. Interrupts are discussed later in this
chapter.
Two error conditions may occur during a DAQ operation: an overflow error or an overrun error.
These error conditions are reported through the Status Register and should be checked every time
the Status Register is read to check the DAVAIL bit.
An overflow condition occurs if more than 16 A/D conversions have been stored in the A/D
FIFO without the A/D FIFO being read; that is, the A/D FIFO is full and cannot accept any more
data. This condition occurs if the software loop reading the A/D FIFO Register is not fast
enough to keep up with the A/D conversion rate. When an overflow occurs, at least one A/D
conversion result is lost. An overflow condition has occurred if the OVERFLOW bit in the
Status Register is cleared.
An overrun condition occurs if a second A/D conversion is initiated before the previous
conversion is finished. This condition may result in one or more missing A/D conversions. This
condition occurs if the sample interval is too small (sample rate is too high). An overrun
condition has occurred if the OVERRUN bit in the Status Register is low. The minimum
recommended sampling interval on the Lab-NB is 16 µsec.
Both the OVERFLOW and OVERRUN bits in the Status Register are reset by writing to the A/D
Clear Register.
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Pretrigger Mode
The following programming steps are required for a DAQ operation in controlled acquisition
mode using EXTCONV*. In the following programming sequence, EXTTRIG is used as a
pretrigger signal; that is, A/D conversions are enabled but the sample count is not started until a
rising edge is detected on the EXTTRIG input. Data acquisition remains enabled for the
programmed count after the rising edge on the EXTTRIG input. Thus, data can be acquired
before and after the trigger (EXTTRIG).
1. Disable EXTCONV* and EXTTRIG input.
2. Select analog input channel and gain and select pretrigger mode.
3. Program counter A0.
4. Clear the A/D circuitry.
5. Program counter A1 and enable EXTCONV* and EXTTRIG input.
6. Service the DAQ operation.
Each of these programming steps is explained as follows.
1. Disable EXTCONV* and EXTTRIG input.
The EXTCONV* input can be disabled by setting the GATA0 bit low. The GATA0 bit is low
whenever OUTA1 is high, regardless of the settings for the PRETRIG or EXTTRIGEN bits in
the ADC Configuration Register or the EXTTRIG signal. Writing 78 (hex) to the counter A
Mode Register sets OUTA1 high. This write disables EXTCONV* and EXTTRIG input; that is,
any transitions on these two inputs are ignored.
2. Select analog input channel and gain and select pretrigger mode.
The analog input channel and gain are selected by writing to the A/D Configuration Register.
The SCANEN bit must be cleared for DAQ operations on a single channel. See the A/D
Configuration Register bit description earlier in this chapter for gain and analog input channel bit
descriptions. The PRETRIG bit must be set high and the EXTRIGEN bit must be set low during
this write to the A/D Configuration Register. These settings select pretrigger mode.
3. Program counter A0.
Since a high-to-low transition on the counter A0 output initiates an A/D conversion, counter A0
output must be programmed to a high state. This ensures that counter A0 does not cause any
A/D conversions.
Write 34 (hex) to the Counter A Mode Register (select counter A0, mode 2) to force OUTA0 to a
high state. This is an 8-bit operation.
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4. Clear the A/D circuitry.
Before the DAQ operation is started, the A/D FIFO must be emptied in order to clear any old
A/D conversion results. Empty the A/D FIFO after the counters are programmed because
programming the counters can cause spurious edges. Write 0 to the A/D Clear Register to empty
the FIFO (8-bit write) and to read from the A/D FIFO (16-bit read). Ignore the data obtained
while reading the A/D Clear Register. In pretrigger mode, a write to the A/D Clear Register also
sets the GATA1 bit low. A/D conversions are not counted until GATA1 is set high by a rising
edge on the EXTTRIG input.
5. Program counter A1 and enable EXTCONV* input.
Counter A1 of the 8253(A) Counter/Timer is used as a sample counter. The sample counter
counts the number of A/D conversions and disables conversions when the programmed count is
reached. The sample count must be less than or equal to 65,535. The minimum sample count is
2. EXTCONV* is enabled as soon as counter A1 is programmed.
To program the counters, use the following programming sequence.
a. Write 70 (hex) to the Counter A Mode Register (select counter A1, mode 0). This step sets
the output of counter A1 (OUTA1) low, which in turn, enables EXTCONV*; that is, falling
edges on EXTCONV* initiate A/D conversions.
b. Write the least significant byte of (M-1), where M is the sample count after the trigger to the
Counter A1 Data Register.
c. Write the most significant byte of (M-1), where M is the sample count after the trigger to the
Counter A1 Data Register.
After you complete this programming sequence, counter A1 is configured to count A/D
conversion pulses and EXTTRIG input is enabled. A/D conversions are initiated by falling
edges on EXTCONV* input, but the sample counter (counter A1) is not gated on until a rising
edge on the EXTTRIG input. After a rising edge on the EXTTRIG input is sensed, A/D
conversions remain enabled for the programmed count after which GATA1 is set low and
EXTCONV* input is disabled.
6. Service the DAQ operation.
Once the DAQ operation is enabled in step 5, A/D conversions are initiated by the falling edges
on the EXTCONV* input. The operation must be serviced by reading the A/D FIFO Register
every time an A/D conversion result becomes available. To service the data acquisition, perform
the following sequence until the GATA0 bit in the Status Register is set low:
a. Read the Status Register (8-bit read).
b. If the DAVAIL bit is set (bit 0), read the A/D FIFO Register to obtain the result.
Interrupts can also be used to service the DAQ operation. Interrupts are discussed later in this
chapter.
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Two error conditions may occur during a DAQ operation: an overflow error or an overrun error.
These error conditions are reported through the Status Register and should be checked every time
the Status Register is read to check the DAVAIL bit.
An overflow condition occurs if more than 16 A/D conversions have been stored in the A/D
FIFO without the A/D FIFO being read; that is, the A/D FIFO is full and cannot accept any more
data. This condition occurs if the software loop reading the A/D FIFO Register is not fast
enough to keep up with the A/D conversion rate. When an overflow occurs, at least one A/D
conversion result is lost. An overflow condition has occurred if the OVERFLOW bit in the
Status Register is cleared.
An overrun condition occurs if a second A/D conversion is initiated before the previous
conversion is finished. This condition may result in one or more missing A/D conversions. This
condition occurs if the sample interval is too small (sample rate is too high). An overrun
condition has occurred if the OVERRUN bit in the Status Register is low. The minimum
recommended sampling interval on the Lab-NB is 16 µsec.
Both the OVERFLOW and OVERRUN bits in the Status Register are reset by writing to the A/D
Clear Register.
Programming in Freerun Acquisition Mode
Posttrigger Mode
A posttrigger data acquisition in freerun acquisition mode using EXTCONV* requires a
programming sequence similar to controlled acquisition mode, except that steps 5c and 5d are
not performed. The sample count is kept in software and conversions remain enabled until
GATA0 is set high. GATA0 can be set low by writing 34 (hex) to the Counter A Mode Register
after the required number of samples is obtained. This disables EXTCONV*, that is, further
transitions on EXTCONV* are ignored.
Pretrigger Mode
Pretriggering mode requires that the A/D conversions be shut off at a programmed time by the
hardware after the trigger on EXTTRIG. Therefore, pretriggered data acquisition is not possible
in freerun acquisition mode.
Programming Multiple A/D Conversions with Channel Scanning
The data acquisition programming sequences given earlier in this chapter are for programming
the Lab-NB for multiple A/D conversions on a single input channel. The Lab-NB can also be
programmed for scanning analog input channels during the DAQ operation. Analog channels N
through 0 can be scanned, where N can be 1 through 7. Programming scanned multiple A/D
conversions involves the same sequence of steps as single-channel DAQ operations except that
the SCANEN bit is set in the A/D Configuration Register. When the SCANEN bit is set in the
A/D Configuration Register, the analog channel select bits MA<2..0> specify the highest
numbered channel in the scan sequence. For example, if MA<2..0> is 011 (binary)–that is,
channel 3 is selected and the SCANEN bit is set—the following scan sequence is used:
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channel 3, channel 2, channel 1, channel 0, channel 3, channel 2, channel 1, channel 0,
channel 3, and so on.
Note: Select the analog input channel and gain in the following order:
1. Write the configuration value indicating the highest channel number in the scan
sequence, the gain, and the input polarity to the A/D Configuration Register. The
SCANEN bit must be cleared during this first write to the A/D Configuration
Register.
2. Write the same configuration value again to the A/D Configuration Register. The
SCANEN bit, however, must be set during the second write to the A/D
Configuration Register.
Scanning can be enabled in either controlled or freerun acquisition mode. Use either counter A0
or EXTCONV* to control the scanning interval.
Interrupt Programming for the Analog Input Circuitry
Use interrupts to service the A/D FIFO during a DAQ operation. To use the conversion
interrupt, set the ADCINTEN bit in the Interrupt Control Register. If this bit is set, an interrupt
is generated whenever the DAVAIL bit in the Status Register is set. This interrupt condition is
cleared when the A/D FIFO is emptied by reading its contents.
Programming the Analog Output Circuitry
The analog output circuitry on the Lab-NB uses double-buffered DACs. Thus, the voltage at the
output pins (pins DAC0OUT and DAC1OUT on the Lab-NB I/O connector) does not update
immediately with each write to the DAC Data Registers. The analog output can be updated in
synchronization with counter A2 output or the external update control signal EXTUPDATE*.
This ability is useful for waveform generation applications because the timed update pulses
eliminate the timing jitter associated with software writes to the DAC Data Registers.
The voltage at the analog output circuitry pins (pins DAC0OUT and DAC1OUT on the Lab-NB
I/O connector) is controlled by loading the DAC in the analog output channel with a 12-bit
digital code. The DACs can be loaded by writing the digital code to the DAC0 and DAC1 Data
Registers. Writing to the DAC0 Data Register loads DAC0, and writing to the DAC1 Data
Register loads DAC1. Writing to the DAC0 and DAC1 Data Registers loads both DAC0 and
DAC1 simultaneously with the same digital code. The analog output on pins DAC0OUT or
DAC1OUT can be updated in one of three ways: immediately when the DAC0 Data Register or
the DAC1 Data Register is written to, when a low level is detected on the EXTUPDATE* pin, or
when a low level is detected on counter A’s output (OUTA2). The TMRWGN bits in the DAC
Configuration Register determine which update method is used. If TMRWGN0 is set high, the
analog output from DAC0 is updated when a low level is detected on either EXTUPDATE* or
OUTA2. If TMRWGN0 is set low, the analog output from DAC0 is updated as soon as the
DAC0 Data Register is written to. TMRWGN1 controls the updating of DAC1 analog output in
a similar manner.
The output voltage generated from the digital code depends on the configuration, unipolar or
bipolar, of the associated analog output channel. Unipolar or bipolar configuration is determined
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by jumper settings described in Chapter 2, Configuration and Installation. Table 4-5 shows the
output voltage versus digital code for a unipolar analog output configuration. Table 4-6 shows
the voltage versus digital code for a bipolar analog output configuration.
The following formula calculates the voltage output versus digital code for a unipolar analog
output configuration and straight binary coding:
digital code
V
= 10.0 *
out
4,096
The digital code in the preceding formula is a decimal value ranging from 0 to +4,095. Notice
that straight binary coding is selected by clearing the TWOSDA bit in the DAC Configuration
Register.
Table 4-5. Analog Output Voltage Versus Digital Code
(Unipolar Mode, Straight Binary Coding)
Digital Code
(Decimal) (Hex)
Voltage Output
0
1
0000
0001
0800
0FFF
0 V
2.4414 mV
5.0 V
2,048
4,095
9.9976 V
The following formula calculates the voltage output versus digital code for a bipolar analog
output configuration and two's complement coding:
digital code
V
= 5.0 *
out
2,048
The digital code in the above formula is a decimal value ranging from -2,048 to +2,047. Notice
that two’s complement mode coding is selected by setting the TWOSDA bit high in the DAC
Configuration Register.
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Chapter 4
Table 4-6. Analog Output Voltage Versus Digital Code
(Bipolar Mode, Two’s Complement Coding)
Digital Code
Voltage Output
(Decimal)
(Hex)
(V = 10 V)
ref
-2,048
-1,024
0
1,024
2,047
F800
FC00
0000
0400
07FF
-5.0 V
-2.5 V
0.0 V
2.5 V
4.9976 V
Interrupt Programming for the Analog Output Circuitry
Interrupts can be used for writing successive values in a sequence to the DAC Data Registers
during a waveform generation operation. The TMRINTEN bit in the Interrupt Control Registers
enables and disables counter A2 and EXTUPDATE* driven interrupts. See Chapter 2,
Configuration and Installation, for timing requirements on the EXTUPDATE* signal.
The following programming steps are required for waveform generation using interrupts:
1. Set up the DAC Configuration Register.
2. Program counter A2.
3. Install an interrupt service routine.
4. Enable timer interrupts.
Each of these programming steps is explained below.
1. Set up the DAC Configuration Register.
The TMRWGN0 bit must be set high for enabling OUTA2 or EXTUPDATE* driven updates on
DAC0. TMRWGN1 bit must be set high for enabling OUTA2 or EXTUPDATE* driven updates
on DAC1.
2. Program counter A2.
If EXTUPDATE* is being used to update the DACs, counter A2 output (OUTA2) must be set
high by writing B8(hex) to the Counter A Mode Register. If OUTA2 is being used to update the
DACs, EXTUPDATE* must be left unconnected or driven to a TTL-high level. Counter A2
must be programmed in mode 2 with the appropriate update interval.
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3. Install an interrupt service routine.
You must install an interrupt service routine for the slot containing the Lab-NB. Consult the
Inside Macintosh manual for information regarding the installation of interrupt service routines.
The interrupt service routine can use the TIMERUP bit in the Interrupt Status Register to
determine whether the interrupt was a counter A2 (or EXTUPDATE*) generated interrupt,
which is useful when interrupts from other sources such as data acquisition and digital I/O have
been enabled on the Lab-NB. The interrupt service routine must write to either the DAC0,
DAC1, or DAC0 and DAC1 Data Registers or to TMRINTCLR to reset the TIMERUP bit and
acknowledge the current interrupt. Another interrupt is generated when a rising edge (low-to-
high) is detected on OUTA2 or EXTUPDATE*.
4. Enable timer interrupts.
Timer interrupts refer to the interrupts generated by rising edges on OUTA2 or EXTUPDATE*.
A rising edge on OUTA2 or EXTUPDATE* sets the TIMERUP bit high in the Interrupt Status
Register. A timer interrupt is generated whenever the TIMERUP bit in the Interrupt Status
Register and the TMRINTEN bit in the Interrupt Control Register are set high. Set the
TMRINTEN bit in the Interrupt Control Register high to enable timer interrupts.
Programming the Digital I/O Circuitry
The digital I/O circuitry is designed around an 82C55A integrated circuit. The 82C55A is a
general-purpose PPI containing 24 programmable I/O pins. These pins represent the three 8-bit
I/O ports (A, B, and C) of the 82C55A. These ports can be programmed as two groups of 12
signals or as three individual 8-bit ports. The following paragraphs include programming
information for the Lab-NB along with program examples written in C.
The three 8-bit ports are divided into two groups: group A and group B (two groups of 12
signals). One 8-bit configuration (or control) word specifies the mode of operation for each
group. Group A’s control bits configure port A (A0 through A7) and the upper 4 bits (nibble) of
port C (C4 through C7). Group B’s control bits configure port B (B0 through B7) and the lower
nibble of port C (C0 through C3). These configuration bits are defined later in this chapter.
82C55A Modes of Operation
The three basic modes of operation for the 82C55A are as follows:
•
•
•
Mode 0 – Basic I/O
Mode 1 – Strobed I/O
Mode 2 – Bidirectional bus
The 82C55A also has a single bit set/reset feature for port C. The 8-bit control word also
programs this function. For additional information, refer to Appendix D, OKI 82C55A Data
Sheet.
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Chapter 4
Mode 0–Basic I/O
This mode is for simple I/O operations for each of the ports. No handshaking is required; data is
simply written to or read from a specified port.
Mode 0 has the following features:
•
•
•
Two 8-bit ports (A and B) and two 4-bit ports (upper and lower nibble of port C).
Any port can be input or output.
Outputs are latched, but inputs are not latched.
Mode 1–Strobed I/O
This mode is used for transferring data with handshake signals. Ports A and B use the eight lines
of port C to generate or receive the handshake signals. This mode divides the ports into two
groups (group A and group B).
•
Each group contains one 8-bit data port (port A or port B) and one 4-bit control/data port
(upper or lower nibble of port C).
•
•
•
The 8-bit data ports can be either input or output, both of which are latched.
The 4-bit ports are used for control and status of the 8-bit data ports.
Interrupt generation and enable/disable functions are available.
Mode 2–Bidirectional Bus
This mode is for communication over a bidirectional 8-bit bus. Handshake signals can be used
in a manner similar to mode 1. Interrupt generation and enable/disable functions are also
available. Other features of this mode include the following:
•
•
•
Used in group A only (port A and upper nibble of port C).
One 8-bit bidirectional port (port A) and a 5-bit control status port (port C).
Both inputs and outputs are latched.
Single Bit Set/Reset Feature
Any of the 8 bits of port C can be set or reset with one control word. This feature is used to
generate status and control for port A and port B when operating in mode 1 or mode 2.
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Register Descriptions and Programming Examples
The following figures show the two control-word formats used to completely program the
82C55A. The control-word flag determines which control-word format is being programmed.
When the control-word flag is 1, bits 0 through 6 specify the I/O characteristics of the 82C55A’s
ports and the mode in which they are operating (that is, mode 0, mode 1, or mode 2). When the
control-word flag is 0, bits 3 through 0 specify the bit set/reset format of port C.
Group A
Group B
D1
D7
D6
D5
D4
D3
D2
D0
Control-Word
Flag
1 = mode set
Port C
(low nibble)
1 = input
0 = output
Mode Selection
00 = mode 0
01 = mode 1
1X = mode 2
Port B
1 = input
0 = output
Port A
1 = input
0 = output
Mode Selection
0 = mode 0
1 = mode 1
Port C
(high nibble)
1 = input
0 = output
Figure 4-1. Control-Word Format with Control-Word Flag Set to 1
D7
X
X
X
D3
D2
D1
D0
Control-Word
Flag
Bit Set/Reset
1 = set
0 = Bit
0 = reset
Set/Reset
Unused
Bit Select
(000)
(001)
(010)
:
:
(111)
Figure 4-2. Control-Word Format with Control-Word Flag Set to 0
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Chapter 4
This section describes the Digital Control Register, which is used to program the 82C55A ports
in any one of the three modes discussed earlier in this section. Specific control words for each
mode are described later in this section along with programming examples for each mode.
Mode 0 Control Words
Mode 0 provides simple I/O functions for each of the three ports with no handshaking. Each port
can be assigned as an input port or as an output port. The 16 possible I/O configurations are
shown in Table 4-7. Notice that bit 7 of the control word is set when programming the mode of
operation for each port.
Table 4-7. Mode 0 I/O Configurations
Control
Word
Group A
Port C1
Group B
Port C2
Bit 76543210
Port A
Port B
10000000
10000001
10000010
10000011
10001000
10001001
10001010
10001011
10010000
10010001
10010010
10010011
10011000
10011001
10011010
10011011
Output
Output
Output
Output
Output
Output
Output
Output
Input
Input
Input
Input
Input
Output
Output
Output
Output
Input
Input
Input
Output
Output
Input
Output
Input
Output
Input
Output
Input
Output
Input
Output
Input
Output
Input
Output
Input
Output
Input
Input
Output
Output
Input
Input
Input
Output
Output
Output
Output
Input
Input
Input
Output
Output
Input
Input
Output
Output
Input
Input
Input
Input
Input
Input
1
Upper nibble of port C
Lower nibble of port C
2
Mode 0 Programming Examples
Example 1. Configure all three ports (A, B, and C) as output ports in mode 0:
•
•
Write 80 (hex) to the Digital Control Register.
Write 8-bit data to the Port A, Port B, or Port C Register as appropriate.
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Example 2. Configure port A for input, port B and port C for output:
•
•
Write 90 (hex) to the Digital Control Register.
Write 8-bit data to port B or port C. Read 8-bit data from port A as appropriate.
Example 3. Configure port A and port C for output, port B for input:
Write 82 (hex) to the Digital Control Register.
Example 4. Configure port A and port B for output, port C for input:
Write 89 (hex) to the Digital Control Register.
•
•
Mode 1 Strobed Input Control Words
In mode 1, the digital I/O bits are divided into two groups: group A and group B. Each of these
groups contains one 8-bit port and one 4-bit control/data port. The 8-bit port can be either an
input port or an output port, and the 4-bit port is used for control and status information for the
8-bit port. The transfer of data is synchronized by handshaking signals in the 4-bit port.
The control word written to the Digital Control Register to configure port A for input in mode 1
is shown here. Bits PC6 and PC7 of port C can be used as extra input or output lines.
7
6
5
4
3
2
1
0
1
0
1
1
1/0
X
X
X
Port C bits PC6 and PC7
1 = input
0 = output
The control word written to the Digital Control Register to configure port B for input in mode 1
is shown here. Notice that port B is not provided with extra input or output lines from port C.
7
1
6
5
4
3
2
1
1
1
0
X
X
X
X
X
During a mode 1 data read transfer, the status of the handshaking lines and interrupt signals can
be obtained by reading port C. The port C status-word bit definitions for an input transfer are
shown next.
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Chapter 4
Port C status-word bit definitions for input (port A and port B):
7
I/O
6
I/O
5
IBFA
4
3
2
1
IBFB
0
INTEA
INTRA
INTEB
INTRB
Bit
7, 6
5
Name
Description
Extra I/O status lines when port A is in mode 1 input.
I/O
IBFA
Input Buffer Full for Port A—High indicates that data has been
loaded into the input latch for port A.
4
3
INTEA
INTRA
Interrupt Enable Bit for Port A—Enables interrupts from the
82C55A for port A. Controlled by setting or resetting of PC4.
Interrupt Request Status for Port A—When INTEA is high and
IBFA is high, this bit is high, indicating that an interrupt request is
asserted.
2
1
0
INTEB
IBFB
Interrupt Enable Bit for Port B—Enables interrupts from the
82C55A for port B. Controlled by setting or resetting PC2.
Input Buffer Full for Port B—High indicates that data has been
loaded into the input latch for port B.
INTRB
Interrupt Request Status for Port B—When INTEB is high and
IBFB is high, this bit is high, indicating that an interrupt request is
asserted.
At the digital I/O connector, port C has the following pin assignments when in mode 1 input.
Notice that the status of STBA* and STBB* is not provided in the port C status word.
PC7
PC6
PC5
PC4
PC3
I/O
I/O
Group A
Group B
IBFA
STBA*
INTRA
PC2 STBB*
PC1
PC0
IBFB
INTRB
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Mode 1 Input Programming Example
Example 1. Configure port A as an input port in mode 1:
•
•
•
Write B0 (hex) to the Digital Control Register.
Wait for bit 5 of port C (IBFA) to be set, indicating that data has been latched into port A.
Read data from port A.
Example 2. Configure port B as an input port in mode 1:
•
•
•
Write 86 (hex) to the Digital Control Register.
Wait for bit 1 of port C (IBFB) to be set, indicating that data has been latched into port A.
Read data from port B.
Mode 1 Strobed Output Control Words
The control word written to the Digital Control Register to configure port A for output in mode 1
is shown here. Bits PC4 and PC5 of port C can be used as extra input or output lines when port
A uses mode 1 output.
7
1
6
0
5
1
4
0
3
2
1
0
1/0
X
X
X
Port C bits PC4 and PC5
1 = input
0 = output
The control word written to the Digital Control Register to configure port B for output in mode 1
is shown here. Notice that port B is not provided with extra input or output lines from port C.
7
1
6
5
4
3
2
1
1
0
0
X
X
X
X
X
During a mode 1 data write transfer, the status of the handshaking lines and interrupt signals can
be obtained by reading port C. Notice that the bit definitions are different for a write and a read
transfer.
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Port C status-word bit definitions for output (port A and port B):
7
6
5
I/O
4
I/O
3
2
1
0
OBFA*
INTEA
INTRA
INTEB*
OBFB
INTRB
Bit
Name
Description
7
OBFA*
Output Buffer Full for Port A—Low indicates that the CPU has
written data out to port A.
6
INTEA
Interrupt Enable Bit for Port A—If this bit is high, interrupts are
enabled from the 82C55A for port A. Controlled by setting or
resetting PC6.
5, 4
3
I/O
Input/Output—Extra I/O status line when port A is in mode 1
output.
INTRA
Interrupt Request Status for Port A—When INTEA is high and
OBFA* is high, this bit is high, indicating that an interrupt request
is asserted.
2
INTEB
Interrupt Enable Bit for Port B—If this bit is high, interrupts are
enabled from the 82C55A for port B. Controlled by setting or
resetting PC2.
1
0
OBFB*
INTRB
Output Buffer Full for Port B—Low indicates that the CPU has
written data out to port B.
Interrupt Request Status for Port B—When INTEB is high and
OBFB* is high, this bit is high, indicating that an interrupt request
is asserted.
At the digital I/O connector, port C has the following pin assignments when in mode 1 output.
Notice that the status of ACKA* and ACKB* is not provided when port C is read.
PC7 OBFA*
PC6 ACKA*
Group A
Group B
PC5
PC4
PC3
I/O
I/O
INTRA
PC2 ACKB*
PC1 OBFB*
PC0
INTRB
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Mode 1 Output Programming Example
Example 1. Configure port A as an output port in mode 1:
•
•
Write A0 (hex) to the Digital Control Register.
Wait for bit 7 of port C (OBFA*) to be cleared, indicating that the data last written to port A
has been read.
•
Write new data to port A.
Example 2. Configure port B as an output port in mode 1:
•
•
Write 84 (hex) to the Digital Control Register.
Wait for bit 1 of port C (OBFB*) to be cleared, indicating that the data last written to port B
has been read.
•
Write new data to port A.
Mode 2 Control Words
In mode 2, an 8-bit bus can be used for both input and output transfers without changing the
configuration. The data transfers are synchronized with handshaking lines in port C. This mode
uses only port A; however, port B can be used in either mode 0 or mode 1 while port A is
configured for mode 2.
The control word written to the Digital Control Register to configure port A as a bidirectional
data bus in mode 2 is shown below. Because mode 2 is for port A only, port B can be
programmed to operate in mode 0 or mode 1. If port B is configured for mode 0, then PC2, PC1,
and PC0 of port C can be used as extra input or output lines.
7
6
5
4
3
2
1
0
1
1
X
X
X
1/0
1/0
1/0
Port C
(PC2-PC0)
1 = input
0 = output
Port B direction
1 = input
0 = output
Group B Mode
0 = mode 0
1 = mode 1
During a mode 2 data transfer, the status of the handshaking lines and interrupt signals can be
obtained by reading port C. The port C status-word bit definitions for a mode 2 transfer are
shown next.
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Port C status-word bit definitions for bidirectional data path (port A only):
7
6
5
IBFA
4
3
2
I/O
1
I/O
0
I/O
OBFA*
INTE1
INTE2
INTRA
Bit
Name
Description
7
OBFA*
Output Buffer Full—Low indicates that the CPU has written data
out to port A.
6
INTE1
Interrupt Enable Bit for Output—If this bit is set, interrupts are
enabled from the 82C55A for OBF*. Controlled by setting or
resetting PC6.
5
4
IBFA
Input Buffer Full—High indicates that data has been loaded into
the input latch of port A.
INTE2
Interrupt Enable Bit for Input—If this bit is set, interrupts are
enabled from the 82C55A for IBF. Controlled by setting or
resetting PC4.
3
INTRA
Interrupt Request Status—If INTE1 is high and IBFA is high, this
bit is high, indicating that an interrupt request is asserted for input
transfers. If INTE2 is high and OBFA* is high, this bit is high,
indicating that an interrupt request is asserted for output transfers.
2–0
I/O
Input/Output—Extra I/O status lines available if port B is not
configured for mode 1.
At the digital I/O connector, port C has the following pin assignments when in mode 2.
PC7
PC6
PC5
PC4
PC3
PC2
PC1
PC0
OBFA*
ACKA*
IBFA
STBA*
INTRA
I/O
Group A
I/O
I/O
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Mode 2 Programming Example
Example 1. Configure port A in mode 2:
•
•
Write C0 (hex) to the Digital Control Register.
Wait for bit 7 of port C (OBFA*) to be cleared, indicating that the data last written to port A
has been read.
•
•
•
Write new data to port A.
Wait for bit 5 of port C (IBFA) to be set, indicating that data is available in port A to be read.
Read data from port A.
Single Bit Set/Reset Control Words
Table 4-8 shows the control words for setting or resetting each bit in port C. Notice that bit 7 of
the control word is cleared for programming the set/reset option for the bits of port C.
Table 4-8. Port C Set/Reset Control Words
Bit Set
Control Word
Bit Reset
Control Word
The Bit Set
or Reset in Port C
0xxx0001
0xxx0011
0xxx0101
0xxx0111
0xxx1001
0xxx1011
0xxx1101
0xxx1111
0xxx0000
0xxx0010
0xxx0100
0xxx0110
0xxx1000
0xxx1010
0xxx1100
0xxx1110
xxxxxxxn
xxxxxxnx
xxxxxnxx
xxxxnxxx
xxxnxxxx
xxnxxxxx
xnxxxxxx
nxxxxxxx
Interrupt Programming for the Digital I/O Circuitry
Interrupts can be enabled on PC0, PC3, or both PC0 and PC3 via the Interrupt Control Register.
See the Interrupt Control Register description earlier in this chapter for corresponding bit
positions.
An external signal can be used to generate an interrupt when port A or B is in mode 0. Program
PC0 or PC3 for input and connect the external signal that should trigger an interrupt to PC0 or
PC3. When the external signal becomes logic high, an interrupt request occurs. To negate the
interrupt request, the external signal must become logic low.
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Chapter 5
Calibration
This chapter discusses the calibration procedures for the Lab-NB analog input and analog output
circuitry.
The Lab-NB is calibrated at the factory before shipment. To maintain the 12-bit accuracy of the
Lab-NB analog input and analog output circuitry, recalibration at six-month intervals is
recommended. Recalibration is also recommended whenever the input or output configuration is
changed.
Factory calibration is performed with the Lab-NB in its default factory configuration:
• ±5 V analog input range (bipolar)
• ±5 V analog output range (bipolar)
Calibration Equipment Requirements
For best measurement results, the Lab-NB needs to be calibrated so that its measurement
accuracy is within ±0.012% of its input range (±0.5 LSB). According to standard practice, the
equipment used to calibrate the Lab-NB should be 10 times as accurate, that is, have ±0.001%
rated accuracy. Practically speaking, calibration equipment with four times the accuracy of the
item under calibration is generally considered acceptable. Four times the accuracy of the
Lab-NB is 0.003%.
You need the following equipment to calibrate the Lab-NB board:
•
For analog input calibration, you need a precision variable DC voltage source (usually a
calibrator) with these features:
-
Accuracy
±0.001% standard
±0.003% sufficient
-
-
Range
Greater than ±10 V
1
Resolution
100 µV in ±10 V range (5 /2 digits)
•
For analog output calibration, you need a voltmeter with these features:
-
Accuracy
±0.001% standard
±0.003% sufficient
-
-
Range
Greater than ±10 V
1
Resolution
100 µV in ±10 V range (5 /2 digits)
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Calibration
Chapter 5
Calibration Trimpots
The Lab-NB has six trimpots for calibration. The location of these trimpots on the Lab-NB
board is shown in the partial diagram of the board in Figure 5-1.
1
2
3
4
5
1
3
5
R6
R8
R10
2
4
6
R7
R9
R1
Figure 5-1. Calibration Trimpot Location Diagram
The following trimpots are used to calibrate the analog input circuitry:
•
•
R1 – Offset trim, analog input
R10 – Gain trim, analog input
The following trimpots are used to calibrate the analog output circuitry:
•
•
•
•
R6 – Gain trim, analog output channel 0
R7– Offset trim, analog output channel 0
R8 – Gain trim, analog output channel 1
R9 – Offset trim, analog output channel 1
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Chapter 5
Calibration
Analog Input Calibration
To null out error sources that compromise the quality of measurements, you must calibrate the
analog input circuitry by adjusting the following potential sources of error:
•
•
Offset errors
Gain error of the analog input circuitry
The calibration must be performed if the input configuration is changed from bipolar (the factory
setting) to unipolar.
Offsets at the input to the instrumentation amplifier contribute gain-dependent offset error to the
analog input circuitry. This offset is multiplied by the gain instrumentation amplifier. Other
sources of offset error include the track-and-hold amplifier and the ADC. On the Lab-NB, one
trimpot is used to null out all of these offset sources. Because one of these error sources is gain-
dependent, the offset should be checked and recalibrated, if necessary, whenever the gain is
changed significantly. Alternatively, the input offset calibration can be performed at gain = 1
with the offset errors noted for all other gains. A software correction can then be applied to the
readings at gains higher than one by subtracting the offset errors. Using this method, the board
can be used at all available gain levels without recalibrating the input.
The maximum offset at the gain amplifier is specified at 0.5 mV. The gain amplifier's maximum
possible contribution to the total offset is therefore 0.5 mV multiplied by the gain. To find the
error in LSBs, divide this voltage by the voltage of 1 LSB. Hence, with a large gain change,
such as from 1 to 100, the number of LSBs of offset from this source changes from about 0.2 to
almost 20. Clearly, an adjustment that is acceptable for a 0.2 LSB error is probably not suitable
when the error is multiplied by 100. For small changes in the gain, the error that accompanies
changes in gain is much less. If the gain is changed from 1 to 2 or 5, the offset probably does not
need to be recalibrated. Likewise, changes between gains of 20, 50, or 100 probably do not
require recalibration.
All the stages up to and including the input to the ADC contribute to the gain error of the analog
input circuitry. With the amplifier set to a gain of 1, the gain of the analog input circuitry is
ideally 1. The gain error is the deviation of the gain from 1 and appears as a multiplication of the
input voltage being measured. To calibrate this offset, you must apply V -1.5 LSB to the
+fs
analog input circuitry and adjust a potentiometer until the ADC returns readings that flicker
between its most positive count and the most positive count minus 1. The voltages
corresponding to V and 1 LSB are given in the following table.
+fs
The voltages corresponding to V , which is the most negative voltage that the ADC can read,
-fs
V
- 1, which is the most positive voltage the ADC can read, and 1 LSB, which is the voltage
+fs
corresponding to one count of the ADC, depend on the input range selected. The value of these
voltages for each input range is given in the following table.
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Calibration
Chapter 5
Input Range
V
V
- 1
+fs
1 LSB
0.5 LSB
-fs
-5 to +5 V
0 to 10 V
-5 V
0 V
+4.99756 V
+9.99756 V
2.44 mV
2.44 mV
1.22 mV
1.22 mV
Board Configuration
The calibration procedure differs if you select either bipolar or unipolar input configuration. A
procedure for each configuration is given next.
Bipolar Input Calibration Procedure
If your board is configured for bipolar input, which provides the range -5 to +5 V, then complete
the following procedure in the order given. This procedure assumes that ADC readings are in
the range -2,048 to +2,047, that is, the TWOSCMP bit in the ADC Configuration Register is set
high.
1. Offset Calibration
To adjust the amplifier input offset:
a. Connect ACH0 (pin 1 on the I/O connector) to AGND (pin 9).
b. Take analog input readings from channel 0 at the gain at which the system will be used.
c. Adjust trimpot R1 until the average reading is ±0.5 LSB.
Alternatively, the above offset calibration procedure can be carried out with the input gain set at
1, followed by recording the average reading at all other gains. These readings can be used later
for software offset correction of the data at gains other than 1, thus eliminating the need to
perform the input offset recalibration when a different gain is used. The software correction
consists of subtracting the recorded reading at gain G from every A/D conversion value obtained
at gain G.
2. Gain Calibration
Adjust the analog input gain by applying an input voltage across ACH0 and AGND. This input
voltage is +4.99634 V or V - 1.5 LSB.
+fs
a. Connect the calibration voltage (+4.99634 V) across ACH0 (pin 1 on the I/O connector) and
AGND (pin 9).
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Chapter 5
Calibration
b. Take analog input readings from channel 0 at a gain of 1, and adjust trimpot R10 until the
ADC readings flicker evenly between 2,046 and 2,047. Alternatively, you can average a
number of readings (approximately 100) and adjust trimpot R10 until the average reading is
2,046.5.
Unipolar Input Calibration Procedure
If your board is configured for unipolar input, which has an input range of 0 to +10 V, then
complete the following steps in sequence. This procedure assumes that ADC readings are in the
range 0 to 4,095, that is, the TWOSCMP bit in the ADC Configuration Register is cleared.
1. Offset Calibration
To adjust the amplifier input offset:
a. Connect ACH0 (pin 1 on the I/O connector) to AGND (pin 9).
b. Take analog input readings from channel 0 at the gain at which the system will be used.
c. Adjust trimpot R1 until the readings flicker between 0 and 1. Care must be taken to avoid
setting the potentiometer too low in the unipolar mode. If the potentiometer is set too low,
the ADC then simply outputs 0 because its input is below the lower limit.
2. Gain Calibration
Adjust the analog input gain by applying an input voltage across ACH0 and AGND. This input
voltage is +9.99634 V or V - 1.5 LSB.
+fs
a. Connect the calibration voltage (+9.99634 V) across ACH0 (pin 1 on the I/O connector) and
AGND (pin 0).
b. Take analog input readings from channel 0 at a gain of 1, and adjust trimpot R10 until the
ADC readings flicker evenly between 4,094 and 4,095. Alternately, you can average a
number of readings (approximately 100) and adjust trimpot R10 until the average reading is
4,094.5.
Analog Output Calibration
To null out error sources that affect the accuracy of the output voltages generated, you must
calibrate the analog output circuitry by adjusting the following potential sources of error:
•
•
Analog output offset error
Analog output gain error
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Calibration
Chapter 5
Offset error in the analog output circuitry is the total of the voltage offsets contributed by each
component in the circuitry. This error appears as a voltage difference between the desired
voltage and the actual output voltage generated and is independent of the D/A setting. To correct
this offset gain error, set the D/A to negative full-scale and adjust a trimpot until the output
voltage is the negative full-scale value ±0.5 LSB.
Gain error in the analog output circuitry is the product of the gains contributed by each
component in the circuitry. This error appears as a voltage difference between the desired
voltage and the actual output voltage generated, which depends on the D/A setting. This gain
error is corrected by setting the D/A to positive full-scale and adjusting a trimpot until the output
voltage corresponds to the positive full-scale value ±0.5 LSB.
Board Configuration
The calibration procedure differs if you select either bipolar or unipolar output configuration. A
procedure for each configuration is given next.
Bipolar Output Calibration Procedure
If your board is configured for bipolar output, which provides an output range of -5 to +5 V, then
complete the following procedures in the order given.
1. Adjust the Analog Output Offset
Adjust the analog output offset by measuring the output voltage generated with the DAC set at
negative full-scale (-2048). This output voltage should be V ±0.5 LSB. For bipolar output,
-fs
V
= -5 V, and 0.5 LSB = 1.22 mV.
-fs
For analog output channel 0:
a. Connect the voltmeter between DAC0 OUT (pin 10 on the I/O connector) and AOGND
(pin 11).
b. Set the analog output channel to -5 V by writing -2048 to the DAC.
c. Adjust trimpot R7 until the output voltage read is -5 V.
For analog output channel 1:
a. Connect the voltmeter between DAC1 OUT (pin 12 on the I/O connector) and AOGND
(pin 11).
b. Set the analog output channel to -5 V by writing -2,048 to the DAC.
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Chapter 5
Calibration
c. Adjust trimpot R9 until the output voltage read is -5 V.
2. Adjust the Analog Output Gain
Adjust the analog output gain by measuring the output voltage generated with the DAC set at
positive full-scale (4,095). This output voltage should be V ±0.5 LSB. For bipolar output,
+fs
V
= +4.99756 V, and 0.5 LSB = 1.22 mV.
+fs
For analog output channel 0:
a. Connect the voltmeter between DAC0 OUT (pin 10 on the I/O connector) and AOGND
(pin 11).
b. Set the analog output channel to +4.99756 V by writing 2,047 to the DAC.
c. Adjust trimpot R6 until the output voltage read is +4.99756 V.
For analog output channel 1:
a. Connect the voltmeter between DAC1 OUT (pin 12 on the I/O connector) and AOGND
(pin 11).
b. Set the analog output channel to +4.99756 V by writing 2,047 to the DAC.
c. Adjust trimpot R8 until the output voltage read is +4.99756 V.
Unipolar Output Calibration Procedure
If your analog output channel is configured for unipolar output, which has an output range of
0 to +10 V, then calibrate your board by completing the following procedure.
1. Adjust the Analog Output Offset
Adjust the analog output offset by measuring the output voltage generated with the DAC set at 0.
This output voltage should be V ±0.5 LSB. For unipolar output,
-fs
V
= 0 V, and 0.5 LSB = 1.22 mV
-fs
For analog output channel 0:
a. Connect the voltmeter between DAC0 OUT (pin 10 on the I/O connector) and AOGND
(pin 11).
b. Set the analog output channel to 0 V by writing 0 to the DAC.
c. Adjust trimpot R7 until the output voltage read is 0 V.
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Calibration
Chapter 5
For analog output channel 1:
a. Connect the voltmeter between DAC1 OUT (pin 12 on the I/O connector) and AOGND
(pin 11).
b. Set the analog output channel to 0 V by writing 0 to the DAC.
c. Adjust trimpot R9 until the output voltage read is 0 V.
2. Adjust the Analog Output Gain
Adjust the analog output gain by measuring the output voltage generated with the DAC set at
positive full-scale (4,095). This output voltage should be V ±0.5 LSB. For unipolar output,
+fs
V
= +9.99756 V, and 0.5 LSB = 1.22 mV.
+fs
For analog output channel 0:
a. Connect the voltmeter between DAC0 OUT (pin 10 on the I/O connector) and AOGND
(pin 11).
b. Set the analog output channel to +9.99756 V by writing 4,095 to the DAC.
c. Adjust trimpot R6 until the output voltage read is +9.99756 V.
For analog output channel 1:
a. Connect the voltmeter between DAC1 OUT (pin 12 on the I/O connector) and AOGND
(pin 11).
b. Set the analog output channel to +9.99756 V by writing 4,095 to the DAC.
c. Adjust trimpot R8 until the output voltage read is +9.99756 V.
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Appendix A
Specifications
This appendix lists the specifications of the Lab-NB. These specifications are typical at 25° C unless otherwise
stated. The operating temperature range is 0° to 70° C.
Analog Input
Number of input channels........................................................8 single-ended
Analog resolution........................................................................12 bits, one part in 4,096
Relative accuracy (nonlinearity)...........................................±1.5 LSB max,
(nonlinearity + quantization error;...............................±1.0 LSB typ
see explanation of specifications)
Differential nonlinearity...........................................................±1.0 LSB max (no missing codes),
±0.5 LSB typ
Analog input range.....................................................................±5 V or 0 to +10 V; jumper-selectable
Input signal gain..........................................................................1, 2, 5, 10, 20, 50, 100; software-selectable
Measurement (gain) accuracy
gain = 1..................................................................................±0.04% max,
±0.025% typ
Offset error
(calibration performed at gain = 1)
gain ≤ 20................................................................................±4 LSB max, ±2 LSB typ
gain > 20................................................................................±20 LSB max, ±10 LSB typ
Offset adjustment range, min
(unipolar or bipolar ranges)............................................±47 LSB
Gain adjustment range, min
(unipolar or bipolar ranges)............................................±31 LSB
System noise.................................................................................0.3 LSB rms for gain = 1
0.6 LSB rms for gain = 100
Temperature coefficients
Gain error..............................................................................±10 ppm/°C
Offset error...........................................................................450 µV/°C + 10 µV/°C gain
*
Input bias current........................................................................150 pA
Input impedance..........................................................................0.1 GΩ in parallel with 45 pF
Input protection............................................................................±45 V on all inputs (not ground)
Explanation of Analog Input Specifications
Relative accuracy is a measure of the linearity of an ADC. However, relative accuracy is a tighter specification than
a nonlinearity specification. Relative accuracy indicates the maximum deviation from a straight line for the analog-
input-to-digital-output transfer curve. If an ADC has been calibrated perfectly, then this straight line is the ideal
transfer function, and the relative accuracy specification indicates the worst deviation from the ideal that the ADC
permits.
1
A relative accuracy specification of ±1 LSB is roughly equivalent to (but not the same as) a ± /2 LSB nonlinearity
or integral nonlinearity specification because relative accuracy encompasses both nonlinearity and variable
1
quantization uncertainty, a quantity often mistakenly assumed to be exactly ± /2 LSB. Although quantization
1
uncertainty is ideally ± /2 LSB, it can be different for each possible digital code and is actually the analog width of
each code. Thus, it is more specific to use relative accuracy as a measure of linearity than it is to use what is
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Specifications
Appendix A
normally called nonlinearity, because relative accuracy ensures that the sum of quantization uncertainty and A/D
conversion error does not exceed a given amount.
Integral nonlinearity in an ADC is an often ill-defined specification that is supposed to indicate a converter's overall
A/D transfer linearity. The manufacturers of the ADC chips used by National Instruments specify their integral
nonlinearity by stating that the analog center of any code will not deviate from a straight line by more than
1
± /2 LSB. This specification is misleading because although a particularly wide code's center may be found within
1
± /2 LSB of the ideal, one of its edges may be well beyond ±1 LSB. Thus, the ADC has a relative accuracy of that
amount. National Instruments tests its boards to ensure that they meet all three linearity specifications defined in
this appendix; specifications for integral nonlinearity are included primarily to maintain compatibility with a
convention of specifications used by other board manufacturers. Relative accuracy, however, is much more useful.
Differential nonlinearity is a measure of deviation of code widths from their theoretical value of
1 LSB. The width of a given code is the size of the range of analog values that can be input to produce that code,
ideally 1 LSB. A specification of ±1 LSB differential nonlinearity ensures that no code has a width of 0 LSBs (that
is, no missing codes) and that no code width exceeds 2 LSBs.
System noise is the amount of noise seen by the ADC when there is no signal present at the input of the board. The
amount of noise that is reported directly (without any analysis) by the ADC is not necessarily the amount of real
noise present in the system, unless the noise is ≥ 0.5 LSB RMS. Noise that is less than this magnitude produces
varying amounts of flicker, and the amount of flicker seen is a function of how near the real mean of the noise is to a
code transition. If the mean is near or at a transition between codes, the ADC flickers evenly between the two
codes, and the noise is seen as very nearly 0.5 LSB. If the mean is near the center of a code and the noise is
relatively small, very little or no flicker is seen, and the noise is reported by the ADC as nearly 0 LSB. From the
relationship between the mean of the noise and the measured RMS magnitude of the noise, the character of the noise
can be determined. National Instruments has determined that the character of the noise in the Lab-NB is fairly
Gaussian, and so the noise specifications given are the amounts of pure Gaussian noise required to produce our
readings.
Analog Data Acquisition
Data transfers................................................................................Programmed I/O or interrupts
Max sample rate..........................................................................62.5 kHz
Analog bandwidth (-3 dB).......................................................400 kHz (gain = 1)
40 kHz (gain = 100)
Max multichannel scan rate....................................................62.5 kHz (gain = ≤ 50)
20 kHz (gain = 100)
Analog Output
Number of output channels.....................................................2 single-ended
Analog resolution........................................................................12 bits, one part in 4,096
Relative accuracy (nonlinearity)...........................................±0.75 LSB max
Differential nonlinearity...........................................................±1 LSB max (monotonic over temperature),
±0.25 LSB typ
Offset adjustment range, min.................................................±37 mV
Gain adjustment range, min....................................................±39 mV
Output voltage ranges................................................................0 to +10 V, unipolar mode
±5 V, bipolar mode; software selectable
Current drive capability............................................................±1 mA
Output settling time...........................................................7 µsec for 10 V step to 0.012%
Output slew rate..................................................................9 V/µsec
Output Impedance.......................................................................0.1 Ω max
Temperature coefficients
Gain error..............................................................................±10 ppm/° C
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Appendix A
Specifications
Voltage offset......................................................................±60 µV/° C
Explanation of Analog Output Specifications
Relative accuracy in a D/A system is the same as nonlinearity, because no uncertainty is added due to code width.
Unlike an ADC, every digital code in a D/A system represents a specific analog value rather than a range of values.
The relative accuracy of the system is therefore limited to the worst-case deviation from the ideal correspondence (a
straight line), excepting noise. If a D/A system has been calibrated perfectly, then the relative accuracy specification
reflects its worst-case absolute error.
Differential nonlinearity in a D/A system is a measure of deviation of code width from 1 LSB. In this case, code
width is the difference between the analog values produced by consecutive digital codes. A specification of ±1 LSB
differential nonlinearity ensures that the code width is always greater than 0 LSBs (guaranteeing monotonicity) and
is always less than 2 LSBs.
Digital I/O
Compatibility................................................................................TTL-compatible
Configuration................................................................................Three 8-bit ports (uses 82C55A PPI)
Input logic low voltage.............................................................0.8 V max
Input logic high voltage............................................................2.2 V min
Output logic low voltage
at output current = 2.5 mA..............................................0.4 V max
Output logic high voltage
at output current = –2.5 µA............................................3.7 V min
Input load current
0 ≤ V ≤ 5 V......................................................................±1 µA max
IN
Output current
at V = 0.5 V.....................................................................4.0 mA min
OL
Output current
at V = 2.7 V....................................................................4.0 mA min
OH
Timing I/O
Compatibility................................................................................TTL-compatible inputs and outputs. Counter gate and clock
inputs are pulled up with 4.7 kΩ resistors onboard.
Configuration................................................................................Six 16-bit counter/timers (uses two 8253s)
Input logic low voltage.............................................................0.8 V max
Input logic high voltage............................................................2.2 V min
Output logic low voltage
at output current = 1.6 mA.............................................0.45 V max
Output logic high voltage
at output current = -150 µA............................................2.4 V min
Input load current
0 ≤ V ≤ 5 V.......................................................................(5.0 V - V ) / 10 kΩ
IN
IN
Input capacitance at 1 MHz.....................................................10 pF max
Base clock frequency.................................................................2 MHz ±0.01%
Power Requirements (from Macintosh NuBus)
Power consumption
+5 VDC...................................................................................810 mA*
+12 VDC...................................................................................70 mA
-12 VDC..................................................................................100 mA
* Additional current up to 1 A can be drawn by the user through the 50-pin I/O connector.
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Specifications
Appendix A
Physical
Board dimensions........................................................................27.62 by 10.16 cm (10.875 by 4.0 in.)
I/O connector................................................................................50-pin D male ribbon-cable connector
Environment
Operating temperature...............................................................0° to 70° C
Storage temperature...................................................................-55° to 150° C
Relative humidity........................................................................5% to 90% noncondensing
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Appendix B
I/O Connector
This appendix contains the pinout and signal names for the I/O connector on the Lab-NB.
Figure B-1 shows the Lab-NB 50-pin I/O connector.
ACH0
ACH2
ACH4
ACH6
AIGND
AOGND
DGND
PA1
ACH1
ACH3
ACH5
ACH7
DAC0 OUT
DAC1 OUT
PA0
1
3
5
7
9
2
4
6
8
10
11 12
13 14
15 16
17 18
19 20
21 22
23 24
PA2
PA3
PA4
PA5
PA6
PA7
PB0
PB1
PB2
PB3
PB4
25 26
27 28
29 30
31 32
33 34
35 36
37 38
39 40
41 42
43 44
45 46
47 48
49 50
PB5
PB6
PB7
PC0
PC1
PC2
PC3
PC4
PC5
PC6
PC7
EXTTRIG
EXTCONV*
GATB0
GATB1
OUTB2
CLKB2
DGND
EXTUPDATE*
OUTB0
OUTB1
CLKB1
GATB2
+5V
Figure B-1. Lab-NB I/O Connector
Detailed signal specifications are included in Chapter 2, Configuration and Installation, and in
Appendix A, Specifications.
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Appendix C
AMD 8253 Data Sheet*
This appendix contains the manufacturer data sheet for the AMD 8253 System Timing
Controller integrated circuit (Advanced Micro Devices, Inc.). This circuit is used on the Lab-
NB.
* Copyright © Advanced Micro Devices, Inc. 1987. Reprinted with permission of copyright owner.
All rights reserved.
Advanced Micro Devices, Inc. 1987 Data Book MOS Microprocessors and Peripherals.
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Appendix D
OKI 82C55A Data Sheet*
This appendix contains the manufacturer data sheet for the OKI 82C55A (OKI Semiconductor)
CMOS programmable peripheral interface . This interface is used on the Lab-NB.
* Copyright © OKI Semiconductor. 1993. Reprinted with permission of copyright owner.
All rights reserved.
OKI Semiconductor Data Book Microprocessor, Seventh Edition, March 1993.
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OKI 82C55A Data Sheet
Appendix D
Lab-NB User Manual
D-2
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Appendix D
OKI 82C55A Data Sheet
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OKI 82C55A Data Sheet
Appendix D
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D-4
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Appendix D
OKI 82C55A Data Sheet
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OKI 82C55A Data Sheet
Appendix D
Lab-NB User Manual
D-6
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Appendix D
OKI 82C55A Data Sheet
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OKI 82C55A Data Sheet
Appendix D
Lab-NB User Manual
D-8
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Appendix D
OKI 82C55A Data Sheet
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OKI 82C55A Data Sheet
Appendix D
Lab-NB User Manual
D-10
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Appendix D
OKI 82C55A Data Sheet
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OKI 82C55A Data Sheet
Appendix D
Lab-NB User Manual
D-12
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Appendix D
OKI 82C55A Data Sheet
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Appendix D
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D-14
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Appendix D
OKI 82C55A Data Sheet
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OKI 82C55A Data Sheet
Appendix D
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D-16
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Appendix D
OKI 82C55A Data Sheet
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Appendix E
Customer Communication
___________________________________________________
For your convenience, this appendix contains forms to help you gather the information necessary
to help us solve technical problems you might have as well as a form you can use to comment on
the product documentation. Filling out a copy of the Technical Support Form before contacting
National Instruments helps us help you better and faster.
National Instruments provides comprehensive technical assistance around the world. In the U.S.
and Canada, applications engineers are available Monday through Friday from 8:00 a.m. to
6:00 p.m. (central time). In other countries, contact the nearest branch office. You may fax
questions to us at any time.
Corporate Headquarters
(512) 795-8248
Technical support fax: (800) 328-2203
(512) 794-5678
Branch Offices
Australia
Austria
Belgium
Canada (Ontario)
Canada (Quebec)
Denmark
Finland
Phone Number
03 9 879 9422
0662 45 79 90 0
02 757 00 20
519 622 9310
514 694 8521
45 76 26 00
90 527 2321
1 48 14 24 24
089 741 31 30
2645 3186
Fax Number
03 9 879 9179
0662 45 79 90 19
02 757 03 11
519 622 9311
514 694 4399
45 76 71 11
90 502 2930
1 48 14 24 14
089 714 60 35
2686 8505
France
Germany
Hong Kong
Italy
Japan
Korea
02 48301892
03 5472 2970
02 596 7456
5 202 2544
02 48301915
03 5472 2977
02 596 7455
5 520 3282
Mexico
Netherlands
Norway
Singapore
Spain
Sweden
Switzerland
Taiwan
03480 33466
32 84 84 00
2265886
91 640 0085
08 730 49 70
056 20 51 51
02 377 1200
01635 523545
03480 30673
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91 640 0533
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Technical Support Form
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Photocopy this form and update it each time you make changes to your software or hardware, and use the completed
copy of this form as a reference for your current configuration. Completing this form accurately before contacting
National Instruments for technical support helps our applications engineers answer your questions more efficiently.
If you are using any National Instruments hardware or software products related to this problem, include the
configuration forms from their user manuals. Include additional pages if necessary.
Name
Company
Address
Fax (
Computer brand
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)
Phone (
Model
)
Processor
Speed
MHz
RAM
no
MB
Display adapter
Mouse
yes
Other adapters installed
Brand
Hard disk capacity
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MB
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Configuration
Revision
National Instruments software product
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The problem is
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Lab-NB Hardware and Software
Configuration Form
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Record the settings and revisions of your hardware and software on the line to the right of each item. Complete a
new copy of this form each time you revise your software or hardware configuration, and use this form as a
reference for your current configuration. Completing this form accurately before contacting National Instruments
for technical support helps our applications engineers answer your questions more efficiently.
National Instruments Products
•
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•
•
•
Data Acquisition Hardware
Interrupt Level of Hardware
DMA Channels of Hardware
Base I/O Address of Hardware
______________________________________________
______________________________________________
______________________________________________
______________________________________________
Analog Output Channel 0 Configuration ______________________________________________
(Factory Setting–Bipolar, W1, A-B)
•
•
•
Analog Output Channel 1 Configuration ______________________________________________
(Factory Setting–Bipolar, W2, A-B)
Analog Input Configuration
______________________________________________
(Factory Setting–Bipolar, W3, A-B)
NI-DAQ or LabVIEW Version
______________________________________________
Other Products
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Computer Make and Model
______________________________________________
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______________________________________________
______________________________________________
______________________________________________
Microprocessor
Clock Frequency
Type of Video Board Installed
Operating System
•
•
•
•
•
•
•
Operating System Version
______________________________________________
______________________________________________
______________________________________________
______________________________________________
______________________________________________
______________________________________________
______________________________________________
Programming Language
Programming Language Version
Other Boards in System
Base I/O Address of Other Boards
DMA Channels of Other Boards
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Title: Lab-NB User Manual
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Glossary
___________________________________________________
Prefix
Meaning
Value
-12
p-
n-
µ-
m-
k-
M-
G-
pico-
nano-
micro-
milli-
kilo-
10
-9
10
-6
10
-3
10
3
10
6
mega-
giga-
10
9
10
°
Ω
%
degrees
ohms
percent
amperes
A
A/D
ADC
AMD
ANSI
AWG
BCD
C
CMOS
D/A
DAC
DAQ
dB
analog-to-digital
A/D converter
Advanced Micro Devices
American National Standards Institute
American Wire Gauge
binary-coded decimal
Celsius
complementary metal-oxide semiconductor
digital-to-analog
D/A converter
data acquisition
decibels
DC
direct current
DMA
DOS
EPROM
F
direct memory access
Disk Operating System
erasable programmable read-only memory
farads
FIFO
ft
hex
Hz
first-in-first-out
feet
hexadecimal
hertz
IIH
IIL
in.
input current load, logic high input voltage
input current load, logic low input voltage
inches
IOH
IOL
I/O
output source current, logic high
output sink current, logic low
input/output
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Glossary
ksamples
LED
LS
LSB
MB
m
1,000 samples
light-emitting diode
Low-power Schottky
least significant bit
megabytes of memory
meters
MSB
PA
PB
most significant bit
port A
port B
PC
PC
port C
personal computer
programmable peripheral interface
parts per million
external resistance
root mean square
Real-Time System Integration
System Conditioning eXtensions for Instrumentation
seconds
PPI
ppm
REXT
rms
RTSI
SCXI
s
TTL
V
VEXT
VIH
VIL
VIN
VI
transistor-transistor logic
volts
external volts
input logic high voltage
input logic low voltage
volts in
virtual instrument
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Index
Counter A1 Data Register
description, 4-18
Numbers/Symbols
programming
+5 V signal (table), 2-7
82C55A Digital I/O Register group, 4-25
to 4-29
controlled acquisition mode,
4-41, 4-47 to 4-48
freerun acquisition mode,
4-44, 4-50
control words. See control words.
Digital Control Register, 4-29
digital I/O circuitry block diagram, 3-9
OKI 82C55A data sheet, D-1 to D-17
overview, 4-25
Counter A2 Data Register
description, 4-19
interrupt programming of analog
output circuitry, 4-54
Port A Register, 4-26
Counter B Mode Register, 4-24
Counter B0 Data Register
description, 4-21
Port B Register, 4-27
Port C Register
description, 4-28
pin assignments (figure)
mode 1 input, 4-60
programming
controlled acquisition mode, 4-40
freerun acquisition mode, 4-43
to 4-44
mode 1 output, 4-62
mode 2, 4-64
Counter B1 Data Register, 4-22
Counter B2 Data Register, 4-23
counter block diagram, 3-11
overview, 4-16
register map, 4-3
timing I/O circuitry, 3-10 to 3-11
pin connections, 2-11 to 2-12
resetting of ports A and C
(warning), 2-11
set/reset control words (table), 4-65
signal assignments (table), 2-12
status-word bit definitions
bidirectional data path, 4-64
input, 4-60
output, 4-62
programming. See digital I/O circuitry,
programming.
A
ACH<0..7> signal
register map, 4-3
description (table), 2-7
input ranges and maximum ratings, 2-8
ACK* signal
description (table), 2-13
mode 1 output timing, 2-15
mode 2 bidirectional timing, 2-16
A/D Clear Register
theory of operation, 3-9 to 3-10
8253 Counter/Timer Register groups, 4-16
to 4-24. See also general-purpose timing
signal connections.
AMD 8253 data sheet, C-1 to C-13
Counter A Mode Register, 4-20
Counter A0 Data Register
description, 4-17
clearing A/D circuitry, 4-41, 4-44, 4-50
clearing analog input circuitry, 4-39
description, 4-12
programming
controlled acquisition mode, 4-40
to 4-42, 4-47
A/D Configuration Register
description, 4-6 to 4-8
freerun acquisition mode, 4-43 to
4-44, 4-49
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Index
analog input circuitry
selecting analog input channel and
gain, 4-37
block diagram, 3-3
programming, 4-36 to 4-38
A/D FIFO output binary modes, 4-38
bipolar input mode (two's
complement coding)
and posttrigger mode, 4-47
and pretrigger mode, 4-49
and timebase source for counter A0,
4-40, 4-43
(table), 4-38
A/D conversion
unipolar input mode (straight
binary coding) (table), 4-38
clearing, 4-39
initiating A/D conversion, 4-37
interrupt programming, 4-52
programming sequence, 4-36 to 4-38
reading A/D conversion result, 4-37
to 4-38
initiating, 3-5, 4-37
reading result, 4-37 to 4-38
A/D FIFO Register
clearing, 4-39, 4-41, 4-44, 4-47, 4-50
description, 4-10 to 4-11
output binary modes, 4-38
bipolar input mode A/D conversion
values (two's complement coding)
(table), 4-38
selecting analog input channel and
gain, 4-37
unipolar input mode A/D conversion
values (straight binary coding)
(table), 4-38
theory of operation, 3-4
Analog Input Register group, 4-5 to 4-12
A/D Clear Register
reading results of A/D conversion, 4-37
servicing DAQ operation, 4-42, 4-45,
4-48, 4-50
clearing A/D circuitry, 4-41,
4-44, 4-50
clearing analog input circuitry, 4-39
description, 4-12
A/D Configuration Register
description, 4-6 to 4-8
selecting analog input channel and
gain, 4-37
storing results of A/D conversion, 4-37
theory of operation, 3-4
ADC (analog-to-digital converter), 3-4
ADCINTEN bit
description, 4-32
interrupt programming for analog input
circuitry, 4-52
and posttrigger mode, 4-47
and pretrigger mode, 4-49
and timebase source for counter
A0, 4-40, 4-43
*ADCINTEN bit, 4-33
AIGND signal (table), 2-7
AMD 8253 Counter/Timer. See 8253
Counter/Timer Register groups.
analog data acquisition specifications, A-2
analog input calibration, 5-3 to 5-5
bipolar input calibration procedure, 5-4
to 5-5
A/D FIFO Register
clearing, 4-39, 4-41, 4-44, 4-47, 4-50
description, 4-10 to 4-11
output binary modes, 4-38
reading results of A/D
conversion, 4-37
servicing DAQ operation, 4-42, 4-
45, 4-48, 4-50
gain calibration, 5-4 to 5-5
offset calibration, 5-4
board configuration, 5-4
storing results of A/D
conversion, 4-37
unipolar input calibration procedure
gain calibration, 5-5
overview, 4-5
offset calibration, 5-5
register map, 4-3
Status Register, 4-9
analog input settling time versus gain
(figure), 3-6
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analog output voltage versus digital code
analog input signal connections, 2-7 to 2-8
connections for signal sources
(figure), 2-8
bipolar mode, two’s complement coding
(table), 4-54
calculating
exceeding input signal range
(warning), 2-8
analog input specifications, A-1 to A-2
analog output calibration, 5-5 to 5-8
bipolar output calibration procedure, 5-6
to 5-7
for bipolar analog output, 4-53
for unipolar analog output, 4-53
unipolar mode, straight binary coding
(table), 4-53
analog-to-digital converter (ADC), 3-4
AOGND signal (table), 2-7
adjusting analog output gain, 5-6
adjusting analog output offset, 5-6
board configuration, 5-6
unipolar output calibration procedure
adjusting analog output gain, 5-8
adjusting analog output offset, 5-7
to 5-8
B
bipolar analog input
calibration procedure, 5-4 to 5-5
gain calibration, 5-4 to 5-5
offset calibration, 5-4
analog output circuitry
block diagram, 3-8
programming, 4-52 to 4-54
analog output voltage versus digital
code
signal range versus gain (figure), 3-7
bipolar analog output
analog output voltage versus digital code
calculating, 4-53
bipolar mode, two’s complement
coding (table), 4-54
unipolar mode, straight binary
coding (table), 4-53
two’s complement coding
(table), 4-54
calibration procedure, 5-6 to 5-7
adjusting analog output gain, 5-6
adjusting analog output offset, 5-6
selection, 2-3 to 2-4
interrupt programming, 4-54 to 4-55
theory of operation, 3-7 to 3-9
analog output configuration
bipolar output selection, 2-3 to 2-4
unipolar input selection, 2-4
Analog Output Register group, 4-13 to 4-15
DAC Configuration Register
description, 4-14
bits
ADCINTEN, 4-32, 4-52
*ADCINTEN, 4-33
D<7..0>
Counter A0 Data Register, 4-17
Counter A1 Data Register, 4-18
Counter A2 Data Register, 4-19
Counter B0 Data Register, 4-21
Counter B1 Data Register, 4-22
Counter B2 Data Register, 4-23
Digital Control Register, 4-29
Port A Register, 4-26
setting up for interrupt
programming, 4-54
DAC0 and DAC1 Data Registers
description, 4-15
interrupt programming of analog
output circuitry, 4-54 to 4-55
loading DAC0 and DAC1
signals, 4-52
Port B Register, 4-27
overview, 4-13
register map, 4-3
Port C Register, 4-28
D<11..0>, 4-15
analog output signal connections, 2-9
analog output specifications, A-2 to A-3
D<15..0>, 4-10, 4-11
DAVAIL, 4-9, 4-37 to 4-38
EXTTRIGEN, 2-17, 2-19, 4-6, 4-45,
4-46, 4-47, 4-49
GAIN<2..0>, 4-8
GATA0, 4-9, 4-46, 4-47, 4-49
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Index
GATA1, 4-9
IBFA, 4-60, 4-64
IBFB, 4-60
bipolar input calibration procedure,
5-4 to 5-5
gain calibration, 5-4 to 5-5
offset calibration, 5-4
INT, 4-33
INTE1, 4-64
INTE2, 4-64
INTEA, 4-60, 4-62
INTEB, 4-60, 4-62
board configuration, 5-4
unipolar input calibration procedure
gain calibration, 5-5
offset calibration, 5-5
INTRA, 4-60, 4-62, 4-64
INTRB, 4-60, 4-62
I/O, 4-60, 4-62, 4-64
MA<2..0>, 4-7 to 4-8
OBFA*, 4-62, 4-64
OBFB*, 4-62
OVERFLOW, 4-9, 4-38, 4-42, 4-45,
4-48, 4-51
OVERRUN, 4-9, 4-42, 4-45, 4-48, 4-51
PAINTEN, 4-31
analog output, 5-5 to 5-8
bipolar output calibration procedure,
5-6 to 5-7
adjusting analog output gain, 5-6
adjusting analog output
offset, 5-6
board configuration, 5-6
unipolar output calibration procedure
adjusting analog output gain, 5-8
adjusting analog output offset,
5-7 to 5-8
*PAINTEN, 4-33
PBINTEN, 4-31
*PBINTEN, 4-33
equipment requirements, 5-1
trimpots, 5-2
PRETRIG, 2-17, 2-19, 4-7, 4-45, 4-46,
4-47, 4-49
SCANEN, 4-7, 4-40, 4-47, 4-49, 4-51
to 4-52
location diagram, 5-2
circular buffer, 4-46
CLK signal
counter block diagram, 3-11
general-purpose timing, 2-21 to 2-24
specifications and ratings, 2-23
timing requirements (figure), 2-24
CLKB1 signal (table), 2-7
CLKB2 signal (table), 2-7
Configuration EPROM, 4-35
configuration of jumpers. See also signal
connections.
analog output configuration
bipolar output selection, 2-3 to 2-4
unipolar input selection, 2-4
factory default settings (table), 2-3
jumpers on Lab-NB, 2-1
parts locator diagram, 2-2
control words
TBSEL, 4-6, 4-39
TIMERUP, 4-33, 4-55
TMRINTCLR, 4-55
TMRINTEN, 2-19, 4-31 to 4-32
*TMRINTEN, 4-33
TMRINTUP, 2-20
TMRWGEN, 2-19, 3-8
TMRWGN0, 4-14, 4-52, 4-54
TMRWGN1, 4-14, 4-52, 4-54
TWOSCMP, 4-8
TWOSDA, 4-43
TWOSDA0, 4-14
TWOSDA1, 4-14
block diagram of Lab-NB, 3-1
board configuration. See configuration of
jumpers.
format
with control-word flag set to 0
(figure), 4-57
with control-word flag set to 1
(figure), 4-57
C
mode 0 I/O configurations (table), 4-58
mode 1 strobed input, 4-59
mode 1 strobed output, 4-61
mode 2, 4-63
cabling for Lab-NB, 1-4 to 1-5
calibration
analog input, 5-3 to 5-5
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Index
Counter A0 Data Register
description, 4-17
Port C single bit set/reset control
words, 4-65
programming
controlled acquisition mode
multiple A/D conversions on single
input channel, 4-40 to 4-42
clearing A/D circuitry, 4-41
programming counter B0 (if
necessary), 4-40
controlled acquisition mode, 4-40 to
4-42, 4-47
freerun acquisition mode, 4-43
to 4-44, 4-49
Counter A1 Data Register
description, 4-18
programming
programming counters A0
and A1, 4-41
programming sample-interval
counter (counter A0), 4-41 to 4-42
selecting analog input channel, gain,
and timebase source for
counter A0, 4-40
controlled acquisition mode, 4-41,
4-47 to 4-48
freerun acquisition mode, 4-44, 4-50
Counter A2 Data Register
description, 4-19
interrupt programming of analog output
circuitry, 4-54
Counter B Mode Register, 4-24
Counter B0 Data Register
description, 4-21
servicing DAQ operation, 4-42
multiple A/D conversions using external
timing, 4-46 to 4-51
posttrigger mode, 4-46 to 4-48
clearing A/D circuitry, 4-47
disabling EXTCONV* and
EXTTRIG input, 4-47
programming
controlled acquisition mode, 4-40
freerun acquisition mode, 4-43
to 4-44
programming counter A0, 4-47
programming counter A1 and
enabling EXTCONV* and
EXTTRIG input, 4-47 to 4-48
selecting analog input channel
and gain, and posttrigger
mode, 4-47
Counter B1 Data Register, 4-22
Counter B2 Data Register, 4-23
counter block diagram, 3-11
counter/timer registers. See 8253
Counter/Timer Register groups.
customer communication, xiii, E-1
servicing DAQ operation, 4-48
pretrigger mode, 4-49 to 4-51
clearing A/D circuitry, 4-50
disabling EXTCONV* and
EXTTRIG input, 4-49
D
programming counter A0, 4-49
programming counter A1 and
enabling EXTCONV*
D<7..0> bits
Counter A0 Data Register, 4-17
Counter A1 Data Register, 4-18
Counter A2 Data Register, 4-19
Counter B0 Data Register, 4-21
Counter B1 Data Register, 4-22
Counter B2 Data Register, 4-23
Digital Control Register, 4-29
Port A Register, 4-26
input, 4-50
selecting analog input channel
and gain, and pretrigger
mode, 4-49
servicing DAQ operation, 4-50
to 4-51
overview, 4-39
Counter A Mode Register, 4-20
Port B Register, 4-27
Port C Register, 4-28
D<11..0> bit, 4-15
D<15..0> bits, 4-10, 4-11
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Index
pretrigger DAQ timing (figure), 2-19
waveform generation timing with
EXTUPDATE* signal (figure), 2-20
data acquisition. See controlled acquisition
mode; DAQ entries; freerun acquisition
mode.
DAC (digital-to-analog converter)
jumper programming for unipolar or
bipolar voltage, 3-8 to 3-9
programming analog output
circuitry, 4-52
theory of operation, 3-8
updating voltages, 3-8
DATA signal
description (table), 2-13
mode 1 input timing, 2-14
mode 1 output timing, 2-15
mode 2 bidirectional timing, 2-16
DAVAIL bit
DAC Configuration Register
description, 4-14
setting up for interrupt
programming, 4-54
DAC0 and DAC1 Data Registers
description, 4-15
description, 4-9
reading A/D conversion results, 4-37
to 4-38
description, 3-4 to 3-5
DGND signal (table), 2-7
Digital Control Register, 4-29
digital I/O circuitry
interrupt programming of analog output
circuitry, 4-54 to 4-55
loading DAC0 and DAC1 signals, 4-52
DAC0 OUT signal
description (table), 2-7
programming analog output
circuitry, 4-52
block diagram, 3-9
theory of operation, 3-9 to 3-10
digital I/O circuitry, programming, 4-55
to 4-65
DAC1 OUT signal
description (table), 2-7
programming analog output
circuitry, 4-52
82C55A modes of operation, 4-55
to 4-56
mode 0 basic I/O, 4-56
mode 1 bidirectional bus, 4-56
mode 1 strobed I/O, 4-56
single bit set/reset feature, 4-56
control-word format
DAQ operations, 4-39. See also controlled
acquisition mode; freerun acquisition
mode.
DAQ rates, 3-6 to 3-7
analog input settling time versus gain
(figure), 3-6
with control-word flag set to 0
(figure), 4-57
with control-word flag set to 1
(figure), 4-57
bipolar analog input signal range versus
gain (figure), 3-7
Lab-NB maximum recommended DAQ
rates (figure), 3-6
interrupt programming, 4-65
mode 0
control words (table), 4-58
programming examples, 4-58 to 4-59
mode 1 strobed input
unipolar analog input signal range versus
gain (figure), 3-7
DAQ timing circuitry, 3-4 to 3-7
block diagram, 3-3
multichannel (scanned) data
acquisition, 3-5
control words, 4-59 to 4-60
Port C pin assignments (figure), 4-60
Port C status-word bit
single-channel data acquisition, 3-5
theory of operation, 3-4 to 3-7
DAQ timing connections, 2-17 to 2-21
EXTCONV* signal timing (figure), 2-17
NuBus interrupt generation with
EXTUPDATE* signal (figure), 2-20
posttrigger DAQ timing (figure)
EXTCONV* high, 2-18
definitions, 4-60
programming examples, 4-61
mode 1 strobed output
control words, 4-61
Port C pin assignments (figure), 4-62
Port C status-word bit
definitions, 4-62
EXTCONV* low, 2-18
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Index
programming example, 4-63
mode 2 bidirectional bus
freerun acquisition mode
posttrigger mode, 4-51
posttrigger DAQ timing (figure)
EXTCONV* high when trigger
sensed, 2-18
control words, 4-63
Port C pin assignments (figure), 4-64
Port C status-word bit
definitions, 4-64
programming example, 4-65
register descriptions and programming
examples, 4-57 to 4-65
EXTCONV* low when trigger
sensed, 2-18
specifications and ratings, 2-20 to 2-21
timing requirements for EXTCONV*
input (figure), 2-17
single bit set/reset control words, 4-65
digital I/O signal connections, 2-10 to 2-16
digital input specifications, 2-10
digital output specifications, 2-10
mode 1 input timing, 2-14
mode 1 output timing, 2-15
mode 2 bidirectional timing, 2-16
Port C pin connections, 2-11 to 2-12
signals for (table), 2-13
triggering conversions, 2-7 to 2-8
external timing for multiple A/D
conversions. See multiple A/D
conversions, programming.
EXTTRIG signal
DAQ timing connections, 2-17 to 2-19
description (table), 2-7
timing specifications, 2-12 to 2-13
typical digital I/O applications
(figure), 2-11
initiating multiple A/D conversion DAQ
operation (posttrigger mode), 4-45
multiple A/D conversions using external
timing
digital I/O specifications, A-3
digital-to-analog converter. See DAC
(digital-to-analog converter).
documentation
controlled acquisition mode
posttrigger mode, 4-46 to 4-48
pretrigger mode, 4-49 to 4-50
freerun acquisition mode
conventions used in manual, xii
National Instruments
pretrigger mode, 4-51
documentation, xii-xiii
organization of manual, xi-xii
related documentation, xiii
specifications and ratings, 2-20 to 2-21
terminating multiple A/D conversion
DAQ operation (pretrigger
mode), 4-46
EXTTRIGEN bit
controlling EXTTRIG signal, 2-17, 2-19
description, 4-6
E
initiating multiple A/D conversion DAQ
operation using EXTCONV*, 4-46
multiple A/D conversion DAQ operation
using EXTTRIG, 4-45
environment specifications, A-4
equipment, optional, 1-4 to 1-5
event counting, 2-21
application with external switch gating
(figure), 2-22
EXTCONV* signal
selecting posttrigger mode, 4-47
selecting pretrigger mode, 4-49
terminating multiple A/D conversion
DAQ operation using EXTTRIG, 4-46
EXTUPDATE* signal
DAQ timing connections, 2-17 to 2-18
description (table), 2-7
initiating multiple A/D conversions, 4-
46
multiple A/D conversions using external
timing
DAQ timing connections, 2-19 to 2-21
description (table), 2-7
interrupt programming of analog output
circuitry, 4-54 to 4-55
NuBus interrupt generation
(figure), 2-20
controlled acquisition mode
posttrigger mode, 4-46 to 4-48
pretrigger mode, 4-49 to 4-50
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Index
programming analog output
circuitry, 4-52
specifications and ratings, 2-20 to 2-21
waveform generation timing
(figure), 2-20
frequency measurement, 2-22
application (figure), 2-23
GATE, CLK, and OUT signals, 2-21
to 2-24
requirements for (figure), 2-24
pulse and square wave generation, 2-21
pulse-width measurement, 2-22
specifications and ratings for 8253 I/O
signals, 2-23
F
fax technical support, E-1
freerun acquisition mode
counter A0 required, 3-5
multiple A/D conversions on single
input channel, 4-43 to 4-45
selecting analog input channel, gain,
and timebase for Counter A0, 4-43
multiple A/D conversions using external
timing, 4-51
time-lapse measurement, 2-22
getting started with Lab-NB, 1-2
I
IBF signal
description (table), 2-13
mode 1 input timing, 2-14
mode 2 bidirectional timing, 2-16
IBFA bit, 4-60, 4-64
posttrigger mode, 4-51
pretrigger mode, 4-51
overview, 4-39
frequency measurement, 2-22
application (figure), 2-23
fuse replacement, 2-7
IBFB bit, 4-60
initializing Lab-NB board, 4-35 to 4-36
input multiplexer, analog input circuitry, 3-4
installation, 2-5
INT bit, 4-33
INTE1 bit, 4-64
INTE2 bit, 4-64
G
GAIN<2..0> bit, 4-8
GATA0 bit
INTEA bit, 4-60, 4-62
INTEB bit, 4-60, 4-62
description, 4-9
disabling EXTCONV* and EXTTRIG
input, 4-47, 4-49
Interrupt Control Register group, 4-30
to 4-34
Interrupt Control Register, 4-31 to 4-32
Interrupt Status Register, 4-33
overview, 4-30
initiating multiple A/D conversion DAQ
operation using EXTCONV*, 4-46
GATA1 bit, 4-9
register map, 4-3
GATB0 signal (table), 2-7
GATB1 signal (table), 2-7
GATB2 signal (table), 2-7
GATE signal
counter block diagram, 3-11
general-purpose timing, 2-21 to 2-24
specifications and ratings, 2-23
timing requirements (figure), 2-24
general-purpose timing signal connections,
2-21 to 2-24
Timer Interrupt Clear Register, 4-34
interrupt programming, 4-65
analog input circuitry, 4-52
analog output circuitry, 4-54 to 4-55
digital I/O circuitry, 4-65
INTR signal
description (table), 2-13
mode 1 input timing, 2-14
mode 1 output timing, 2-15
mode 2 bidirectional timing, 2-16
INTRA bit, 4-60, 4-62, 4-64
event-counting, 2-21
application with external switch
gating (figure), 2-22
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programming examples, 4-58 to 4-59
mode 0 basic I/O, 82C55A integrated
circuit, 4-56
mode 1 bidirectional bus, 82C55A
integrated circuit, 4-56
INTRB bit, 4-60, 4-62
I/O bit, 4-60, 4-62, 4-64
I/O connector pin assignments (figure), 2-5
to 2-6, B-1
mode 1 input timing, digital I/O, 2-14
mode 1 output timing, digital I/O, 2-15
mode 1 strobed input
J
control words, 4-59 to 4-60
Port C pin assignments (figure), 4-60
Port C status-word bit definitions, 4-60
programming examples, 4-61
mode 1 strobed I/O, 82C55A integrated
circuit, 4-56
jumper settings
analog output configuration
bipolar output selection, 2-3 to 2-4
unipolar input selection, 2-4
factory default settings (table), 2-3
jumpers on Lab-NB, 2-1
mode 1 strobed output
parts locator diagram, 2-2
control words, 4-61
Port C pin assignments (figure), 4-62
Port C status-word bit definitions, 4-62
programming example, 4-63
mode 2 bidirectional bus
L
Lab-NB
control words, 4-63
block diagram, 3-1
cabling, 1-4 to 1-5
driving SSR-OAC-5 output modules
(note), 1-1
features, 1-1
Port C pin assignments (figure), 4-64
Port C status-word bit definitions, 4-64
mode 2 bidirectional timing, digital I/O
signal connections, 2-16
multichannel (scanned) data acquisition, 3-5
multiple A/D conversions, programming
external timing considerations for, 4-45
to 4-46
getting started, 1-2
optional equipment, 1-4 to 1-5
parts locator diagram, 2-2
software programming choices, 1-2
to 1-4
using EXTCONV* signal to
initiate, 4-46
LabVIEW and LabWindows/CVI
application software, 1-2
NI-DAQ driver software, 1-3
register-level programming, 1-4
unpacking, 1-5
using EXTTRIG signal to initiate
(posttrigger mode), 4-45
using EXTTRIG signal to terminate
(pretrigger mode), 4-46
single input channel, 4-39 to 4-45
controlled acquisition mode, 4-40
to 4-42
LabVIEW and LabWindows/CVI
application software, 1-2
freerun acquisition mode, 4-43
to 4-45
overview, 4-39
M
using channel scanning, 4-51 to 4-52
using external timing, 4-46 to 4-51
controlled acquisition mode, 4-46
to 4-51
MA<2..0> bit
description, 4-7 to 4-8
multiple A/D conversions with channel
scanning, 4-51
freerun acquisition mode, 4-51
multiplexer, analog input circuitry, 3-4
manual. See documentation.
mode 0
control words (table), 4-58
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parts locator diagram, 2-2
PB<0..7> signal (table), 2-7
PBINTEN bit, 4-31
N
*PBINTEN bit, 4-33
NI-DAQ driver software, 1-3
NuBus interface circuitry, 3-2 to 3-3
block diagram, 3-2
PC<0..7> signal (table), 2-7
physical specifications, A-4
pin assignments
I/O connector (figure), 2-5 to 2-6, B-1
Port C
O
mode 1 input, 4-60
mode 1 output, 4-62
mode 2, 4-64
Port A Register, 4-26
Port B Register, 4-27
Port C Register
OBF* signal
description (table), 2-13
mode 1 output timing, 2-15
mode 2 bidirectional timing, 2-16
OBFA* bit, 4-62, 4-64
description, 4-28
pin assignments (figure)
mode 1 input, 4-60
mode 1 output, 4-62
mode 2, 4-64
pin connections, 2-11 to 2-12
resetting of ports A and C
(warning), 2-11
OBFB* bit, 4-62
OKI 82C55A programmable peripheral
interface. See 82C55A Digital I/O
Register group.
operation of Lab-NB. See theory of
operation.
optional equipment for Lab-NB, 1-4 to 1-5
OUT signal
set/reset control words (table), 4-65
signal assignments (table), 2-12
status-word bit definitions
bidirectional data path, 4-64
input, 4-60
counter block diagram, 3-11
general-purpose timing, 2-21 to 2-24
specifications and ratings, 2-23
timing requirements (figure), 2-24
OUTA2 signal, 4-54 to 4-55
OUTB0 signal (table), 2-7
OUTB1 signal (table), 2-7
OUTB2 signal (table), 2-7
OVERFLOW bit, 4-9
overflow conditions in programming
analog input circuitry, 4-38
multiple A/D conversions
on single input channel, 4-42, 4-45
using external timing, 4-48, 4-51
OVERRUN bit, 4-9
output, 4-62
posttrigger DAQ timing (figure)
EXTCONV* high when trigger
sensed, 2-18
EXTCONV* low when trigger
sensed, 2-18
posttrigger mode
controlled acquisition mode, 4-46
to 4-48
freerun acquisition mode, 4-51
initiating multiple A/D conversion DAQ
operation using EXTTRIG, 4-45
power requirements from Macintosh
NuBus, A-3
overrun conditions in programming
multiple A/D conversions
on single input channel, 4-42, 4-45
using external timing, 4-48, 4-51
PRETRIG bit
controlling EXTTRIG signal, 2-17, 2-19
description, 4-7
initiating multiple A/D conversion DAQ
operation
P
PA<0..7> signal (table), 2-7
PAINTEN bit, 4-31
*PAINTEN bit, 4-33
using EXTCONV*, 4-46
using EXTTRIG, 4-45
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interrupt programming, 4-54 to 4-55
digital I/O circuitry, 4-55 to 4-65
82C55A modes of operation, 4-55
to 4-56
selecting posttrigger mode, 4-47
selecting pretrigger mode, 4-49
terminating multiple A/D conversion
DAQ operation using EXTTRIG, 4-46
pretrigger DAQ timing (figure), 2-19
pretrigger mode
mode 0 basic I/O, 4-56
mode 1 bidirectional bus, 4-56
mode 1 strobed I/O, 4-56
single bit set/reset feature, 4-56
control-word format
with control-word flag set to 0
(figure), 4-57
with control-word flag set to 1
(figure), 4-57
interrupt programming, 4-65
mode 0
controlled acquisition mode, 4-49
to 4-51
freerun acquisition mode, 4-51
terminating multiple A/D conversion
DAQ operation using EXTTRIG, 4-46
programmable gain amplifier, 3-4
programming. See register-level
programming.
pulse generation, 2-21
pulse-width measurement, 2-22
control words (table), 4-58
programming examples, 4-58
to 4-59
mode 1 strobed input
control words, 4-59 to 4-60
Port C pin assignments
(figure), 4-60
Port C status-word bit
definitions, 4-60
programming examples, 4-61
mode 1 strobed output
control words, 4-61
R
RD* signal
description (table), 2-13
mode 1 input timing, 2-14
mode 2 bidirectional timing, 2-16
register-level programming. See also
registers.
Port C pin assignments
(figure), 4-62
Port C status-word bit
definitions, 4-62
analog input circuitry, 4-36 to 4-38
A/D FIFO output binary modes, 4-38
bipolar input mode (two’s
complement coding)
programming example, 4-63
mode 2 bidirectional bus
control words, 4-63
(table), 4-38
unipolar input mode (straight
binary coding) (table), 4-38
clearing, 4-39
initiating A/D conversion, 4-37
interrupt programming, 4-52
programming sequence, 4-36 to 4-38
reading A/D conversion result, 4-37
to 4-38
Port C pin assignments
(figure), 4-64
Port C status-word bit
definitions, 4-64
programming example, 4-65
register descriptions and
programming examples, 4-57
to 4-65
selecting analog input channel and
gain, 4-37
single bit set/reset control
words, 4-65
external timing considerations for
multiple A/D conversions, 4-45 to 4-
46
analog output circuitry, 4-52 to 4-54
analog output voltage versus digital
code
bipolar mode, two’s complement
coding (table), 4-54
using EXTCONV* signal to
initiate, 4-46
unipolar mode, straight binary
coding (table), 4-53
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programming. See digital I/O
circuitry, programming.
8253 Counter/Timer Register groups,
4-16 to 4-24
using EXTTRIG signal to initiate
(posttrigger mode), 4-45
using EXTTRIG signal to terminate
(pretrigger mode), 4-46
Counter A Mode Register, 4-20
Counter A0 Data Register
description, 4-17
initializing Lab-NB board, 4-35 to 4-36
multiple A/D conversions on single
input channel, 4-39 to 4-45
controlled acquisition mode, 4-40
to 4-42
programming in controlled
acquisition mode, 4-40 to
4-42, 4-47
programming in freerun
acquisition mode, 4-43 to
4-44, 4-49
freerun acquisition mode, 4-43
to 4-45
overview, 4-39
multiple A/D conversions using external
timing, 4-46 to 4-51
Counter A1 Data Register
description, 4-18
controlled acquisition mode, 4-46
to 4-51
freerun acquisition mode, 4-51
multiple A/D conversions with channel
scanning, 4-51 to 4-52
register programming
considerations, 4-35
software programming choices, 1-2
to 1-4
programming in controlled
acquisition mode, 4-41, 4-47
to 4-48
programming in freerun
acquisition mode, 4-44, 4-50
Counter A2 Data Register
description, 4-19
interrupt programming of analog
output circuitry, 4-54
Counter B Mode Register, 4-24
Counter B0 Data Register
description, 4-21
programming for controlled
acquisition mode, 4-40
programming in freerun
acquisition mode, 4-43 to 4-44
Counter B1 Data Register, 4-22
Counter B2 Data Register, 4-23
overview, 4-16
when to consider programming, 1-4
registers. See also register-level
programming.
82C55A Digital I/O Register groups,
4-25 to 4-29
control words. See control words.
Digital Control Register, 4-29
overview, 4-25
Port A Register, 4-26
Port B Register, 4-27
Port C Register
accessing with Macintosh, 4-1
Analog Input Register group, 4-5 to 4-12
A/D Clear Register
description, 4-28
pin assignments (figure), 4-60,
4-62, 4-64
pin connections, 2-11 to 2-12
resetting of ports A and C
(warning), 2-11
clearing A/D circuitry, 4-41,
4-44, 4-50
clearing analog input
circuitry, 4-39
description, 4-12
set/reset control words
(table), 4-65
A/D Configuration Register
description, 4-6 to 4-8
selecting analog input channel
and gain, 4-37
signal assignments (table), 2-12
status-word bit definitions for
bidirectional data path, 4-64
status-word bit definitions for
input, 4-60
status-word bit definitions for
output, 4-62
and posttrigger mode, 4-47
and pretrigger mode, 4-49
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and timebase source for
counter A0, 4-40, 4-43
freerun acquisition mode, 4-44
sample-interval timer, 3-5
A/D FIFO Register
SCANEN bit
clearing, 4-39, 4-41, 4-44,
4-47, 4-50
DAQ operations on single input
channel, 4-40
description, 4-10 to 4-11
output binary modes, 4-38
reading results of A/D
conversion, 4-37
servicing DAQ operation, 4-42,
4-45, 4-48, 4-50
description, 4-7
multiple A/D conversions with channel
scanning, 4-51 to 4-52
selecting posttrigger mode, 4-47
selecting pretrigger mode, 4-49
scanned (multichannel) data acquisition, 3-5
signal connections, 2-5 to 2-24
analog input signal connections, 2-7
to 2-8
storing results of A/D
conversion, 4-37
overview, 4-5
Status Register, 4-9
Analog Output Register group, 4-13
to 4-15
analog output signal connections, 2-9
descriptions (table), 2-7
digital I/O signal connections, 2-10
to 2-16
DAC Configuration Register
description, 4-14
setting up for interrupt
programming, 4-54
DAC0 and DAC1 Data Registers
description, 4-15
digital input specifications, 2-10
digital output specifications, 2-10
mode 1 input timing, 2-14
mode 1 output timing, 2-15
mode 2 bidirectional timing, 2-16
Port C pin connections, 2-11 to 2-12
timing specifications, 2-12 to 2-13
typical digital I/O applications
(figure), 2-11
interrupt programming of analog
output circuitry, 4-54 to 4-55
loading DAC0 and DAC1
signals, 4-52
overview, 4-13
I/O connector pin descriptions, 2-5
to 2-6
timing connections, 2-17 to 2-24
DAQ timing connections, 2-17
to 2-21
Configuration EPROM, 4-35
Interrupt Control Register group, 4-30
to 4-34
Interrupt Control Register, 4-31
to 4-32
Interrupt Status Register, 4-33
overview, 4-30
event-counting application with
external switch gating
(figure), 2-22
Timer Interrupt Clear Register, 4-34
map for Lab-NB (table), 4-3
programming considerations, 4-35
sizes of registers, 4-4
slot address space, 4-1
24-bit mode (table), 4-2
32-bit mode (table), 4-2
EXTCONV* signal timing
(figure), 2-17
frequency measurement application
(figure), 2-23
general-purpose timing signal
connections, 2-21 to 2-24
requirements for GATE and CLK
and OUT signals (figure), 2-24
NuBus interrupt generation with
EXTUPDATE* signal
S
(figure), 2-20
posttrigger DAQ timing (figure)
EXTCONV* high, 2-18
sample-interval counter, programming
controlled acquisition mode, 4-41
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EXTCONV* low, 2-18
block diagram, 3-8
pretrigger DAQ timing (figure), 2-19
waveform generation timing with
EXTUPDATE* signal
DAQ circuitry, 3-4 to 3-7
analog input settling time versus gain
(figure), 3-6
(figure), 2-20
bipolar analog input signal range
versus gain (figure), 3-7
block diagram, 3-3
DAQ rates, 3-6 to 3-7
description, 3-4 to 3-5
single bit set/reset feature, 4-56
control words for Port C (table), 4-65
single-channel data acquisition, 3-5
slot address space, 4-1
24-bit mode (table), 4-2
32-bit mode (table), 4-2
software programming choices, 1-2 to 1-4
LabVIEW and LabWindows/CVI
application software, 1-2
NI-DAQ driver software, 1-3
register-level programming, 1-4
specifications
Lab-NB maximum recommended
DAQ rates (figure), 3-6
multichannel (scanned) data
acquisition, 3-5
single-channel data acquisition, 3-5
unipolar analog input signal range
versus gain (figure), 3-7
digital I/O circuitry, 3-9 to 3-10
block diagram, 3-9
functional overview, 3-1 to 3-2
Lab-NB block diagram, 3-1
NuBus interface circuitry, 3-2 to 3-3
block diagram, 3-2
analog data acquisition, A-2
analog input, A-1 to A-2
analog output, A-2 to A-3
digital I/O, A-3
environment, A-4
physical, A-4
power requirements from Macintosh
NuBus, A-3
timing I/O circuitry, 3-10 to 3-11
block diagram, 3-10
counter block diagram, 3-11
timebase for counter A0, selecting, 4-39
time-lapse measurement, 2-22
Timer Interrupt Clear Register, 4-34
TIMERUP bit, 4-33
timing I/O, A-3
square wave generation, 2-21
SSR-OAC-5 output modules, driving
(note), 1-1
Status Register, 4-9
STB* signal
installing interrupt service routine, 4-55
timing connections, 2-17 to 2-24
DAQ timing connections, 2-17 to 2-21
EXTCONV* signal timing
(figure), 2-17
description (table), 2-13
mode 1 input timing, 2-14
mode 2 bidirectional timing, 2-16
NuBus interrupt generation with
EXTUPDATE* signal
(figure), 2-20
posttrigger DAQ timing (figure)
EXTCONV* high, 2-18
T
TBSEL bit
EXTCONV* low, 2-18
description, 4-6
selecting timebase for counter A0,
4-39, 4-40
pretrigger DAQ timing (figure), 2-19
waveform generation timing with
EXTUPDATE* signal
technical support, E-1
theory of operation
(figure), 2-20
analog input circuitry, 3-4
block diagram, 3-3
analog output circuitry, 3-7 to 3-9
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general-purpose timing signal
connections, 2-21 to 2-24
event-counting application with
external switch gating
U
unipolar analog input
calibration procedure
gain calibration, 5-5
offset calibration, 5-5
selection, 2-4
(figure), 2-22
frequency measurement application
(figure), 2-23
requirements for GATE and CLK
and OUT signals (figure), 2-24
timing I/O circuitry, 3-10 to 3-11
block diagram, 3-10
signal range versus gain (figure), 3-7
unipolar analog output
analog output voltage versus digital code
calculating, 4-53
counter block diagram, 3-11
timing I/O specifications, A-3
timing specifications, digital I/O signal
connections, 2-12 to 2-13
mode 1 input timing, 2-14
mode 1 output timing, 2-15
mode 2 bidirectional timing, 2-16
TIMRINTCLR bit
straight binary coding (table), 4-53
calibration procedure
adjusting analog output gain, 5-8
adjusting analog output offset, 5-7
to 5-8
unpacking the Lab-NB, 1-5
installing interrupt service routine, 4-55
TMRINTEN bit
W
controlling EXTUPDATE* signal, 2-19
description, 4-31 to 4-32
*TMRINTEN bit, 4-33
TMRINTUP bit, 2-20
WR* signal
description (table), 2-13
mode 1 output timing, 2-15
mode 2 bidirectional timing, 2-16
TMRWGEN bit
controlling EXTUPDATE* signal, 2-19
DAC voltage updating, 3-8
TMRWGN0 bit
description, 4-14
interrupt programming of analog output
circuitry, 4-54
programming analog output
circuitry, 4-52
TMRWGN1 bit
description, 4-14
interrupt programming of analog output
circuitry, 4-54
programming analog output
circuitry, 4-52
TWOSCMP bit
description, 4-8
setting for A/D conversion result, 4-38
TWOSDA0 bit, 4-14
TWOSDA1 bit, 4-14
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